Optical Microscopes
| Type of equipment | Name of equipment | Location | Contact person | Link to more information |
|---|---|---|---|---|
| Element Analysis | GD-MS | E-208 | Chiara Modanese | GD-MS |
| Surface and particle analysis | XRD Texture Analysis | A-347 | Torild Krogstad | XRD Texture analysis |
| Optical microscope | Wild Heerbrugg | A-443 | Trygve L. Schanche | Wild Heerbrugg |
| Optical microscope | Leica MEF4M | E-514 | Trygve L. Schanche | Leica MEF4M |
| Optical microscope | Reichert-Jung Univar | E-514 | Trygve L. Schanche | Reitchert-Jung Univar |
| Optical microscope | Makroskop Leitz M400 | E-508 | Trygve L. Schanche | Makroskop Leitz M400 |
| Optical microscope | Leitz MM6 | E-508 | Trygve L. Schanche | Leitz MM6 |
| Optical microscope | Zeiss Axiovert 25 | E-508 | Trygve L. Schanche | Zeiss Axiovert 25 |
| Optical microscope | Leitz metalloplan | E-508 | Trygve L. Schanche | Leitz metalloplan |
| Optical microscope | Leitz 1A | E-508 | Trygve L. Schanche | Leitz 1A |
| Optical microscope | Reichert MEF1 | E-508 | Trygve L. Schanche | Reitchert MEF1 |
| Optical microscope | Leitz Metallux 3 | E-514A | Trygve L. Schanche | Leitz Metallux 3 |
| Videokamera (2 stk) | JVC TK-S310 EG | E-514A | Trygve L. Schanche | Video camera |
| Videokamera til mikroskop | Leica R3 elecrt. | E-514A | Trygve L. Schanche | Video camera for microscope |
| Optical microscope | Leitz Axioskop | E-514A | Trygve L. Schanche | Leitz Axioskop |
| Scanning Electron Microscopy | FE-SEM with Bruker EDS/NORDIF EBSD system Hitachi SU6600 | F-362 | Yingda Yu | |
| Scanning Electron Microscopy | FE-SEM with Bruker EDS/NORDIF EBSD system Zeiss Ultra 55 | F-362 | Yingda Yu | |
| Scanning Electron Microscopy | SEM with Nordif EBSD system JEOL JSM 840A | F-362 | Yingda Yu | |
| Transmission Electron Microscopy | TEM with Gatan GIF system JEOL TEM 2010 | F-368 | Yingda Yu | |
| Scanning Electron Microscopy | SEM with Gatan CL system JEOL JSM 840 | F-369 | Yingda Yu | |
| Scanning Electron Microscopy | SEM with JEOL EDS system JEOL JSM 6010LA | F-369 | Yingda Yu | |
| Scanning Electron Microscopy | FE-SEM wirh EDAX EDS system Zeiss Supra 55VP | F-369 | Yingda Yu | |
| Electron Micro Probe Analyzer | FE-EPMA wirh JEOL WDS system JEOL JXA 8500 | F-373 | Morten Raanes | |
| Scanning probe microscope | AFM/STM Agilent 5500 | KII-003A | Magnus Følstad |
|
| UV-vis/NIR spektrofotometer + potensiostat | Photoelectrochemical station | KII-014 | Magnus Følstad | |
| Thermal analysis | Perkin Elmer Diffential scanning calorimeter | KII-103 | Sverre Magnus Selback | Perkin Elmer Diffential scanning calorimeter |
| Thermal analysis | High temperature oxygen flux furnace | KII-103 | Belma Talic | High temperature oxygen flux furnace |
| Thermal analysis | NETZSCH dilatometer 402E | KII-103 | Ove Darell | NETZSCH Dilatometer 402E |
| Thermal analysis | NETZSCH dilatometer 402C | KII-103 | Eli Beate Larsen | NETZSCH Dilatometer 402C |
| Thermal analysis | NETZSCH STA449 jupiter | KII-103 | Eli Beate Larsen | NETZSCH STA449 Jupiter |
| Thermal analysis | Electrical conductivity furnace | KII-103 | Belma Talic | Electrical conductivity furnace |
| Surface and particle analysis | PSA Malvern 2000 | KII-107 | Jannicke Kvello | PSA Malvern 2000 |
| Surface and particle analysis | TRISTAR 3000 surface area and porosity analyzer | KII-107 | Elin Albertsen | BET |
| LECO | Oxygen and nitrogen analysis | KII-107 | Anne Støre | LECO |
| Pycnometer | Accupyc 1330 | KII-107 | Julian Tolchard | Accupyc 1330 |
XRD | D8 advance Bruker | KII-113 | Julian Tolchard | D8 Advance Bruker |
| XRD | Da Vinci 1 Bruker | KII-113 | Julian Tolchard | Da Vinci 1 Bruker |
| XRD | Da Vinci 2 Bruker | KII-113 | Julian Tolchard | Da Vinci 2 Bruker |
| XRD | A-unit X-ray diffractometer | KII-113 | Julian Tolchard | A-unit X-ray diffractometer |
| XRD | D8 focus Siemens | KII-113 | Julian Tolchard | D8 focus Siemens |
| Thermal analysis | Optisk dilatometer-Expert system | KII-119 | Anne Støre | Optisk dilatometer-Expert system |
| Thermal analysis | LFA Microflash, termisk diffusivitet | KII-119 | Anne Støre | LFA Microflash, thermal diffusivity |
| Surface and particle analysis | Zetapotensial- og partikkelstørrelse-måler Beckman Coulter DelsaNano C | KII-223 | Magnus Følstad | Beckman Coulter DelsaNano C |
Glow Discharge Optical Emission Spectroscopy | GD-OES GD-profiler | KII-307 | Maria Stepanova | GD-OES |
| Optical Microscope | Nikon SM2800 | KII-323 | Nikon SM2800 | |
| Optical Microscope | Leica DM IRM | KII-323 | ||
| Optical microscope | Zeiss | |||
| Optical microscope | Wild Heerbrugg |
| ||
| IR Spectroscropy | Bruker IFS66V | KII-014 | ||
| UV-vis/NIR spektrofotometer + potensiostat | Photoelectrochemical station | Magnus Følstad | ||
| Massespektrometer | Pfeiffer Vacum Prisma Plus HiCube | Morten Tjelta | ||
| Viskositetsmåling | Haake Mars Modular Advanced Rheometer System | |||
| Viskositetsmåling | Haake Viskotester 550 Thermo Scientific | |||
| Optical microscope | Leica DMIL | Trygve L Schanche | Leica DMIL | |
| Optical microscope | Olympus BH-2 | KII-032A | Stein Rørvik | |
| Optical microscope | Reichert MeF3A med Sony kamera | Stein Rørvik | ||
| Optical microscope | Olympus BX60 | Stein Rørvik | ||
| Peizoelektriske målinger | Aix PES Piezoelectric evaluation | |||
| Optical microscope | Leica EZ4 | |||
| Scanning electron microscope | Hitachi S-3400N | KII-036 |