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Created by Unknown User (leroy), last modified on 24.09.2014
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| Type of equipment | Name of equipment | Location | Contact person | Link to more information |
|---|
| Element Analysis | GD-MS | E-208 | Chiara Modanese | |
| Texture Analysis | X-ray diffractometer | A-347 | Torild Krogstad | |
| Lysmikroskop | Wild Heerbrugg | A-443 | Trygve L. Schanche | |
| Lysmikroskop | Leica MEF4M | E-514 | Trygve L. Schanche | |
| Lysmikroskop | Reichert-Jung Univar | E-514 | Trygve L. Schanche | |
| Makroskop | Leitz M400 | E-508 | Trygve L. Schanche | |
| Lysmikroskop | Leitz MM6 | E-508 | Trygve L. Schanche | |
| Lysmikroskop | Zeiss Axiovert 25 | E-508 | Trygve L. Schanche | Zeiss Axiovert 25 |
| Lysmikroskop | Leitz metalloplan | E-508 | Trygve L. Schanche | |
| Lysmikroskop | Leitz 1A | E-508 | Trygve L. Schanche | |
| Lysmikroskop | Reichert MEF1 | E-508 | Trygve L. Schanche | |
| Lysmikroskop | Leitz Metallux 3 | E-514A | Trygve L. Schanche | Leitz Metallux 3 |
| Videokamera (2 stk) | JVC TK-S310 EG | E-514A | Trygve L. Schanche | |
| Videokamera til mikroskop | Leica R3 elecrt. | E-514A | | |
| Lysmikroskop | Leitz Axioskop | E-514A | Trygve L. Schanche | Leitz Axioskop |
| FE-SEM with Bruker EDS/NORDIF EBSD system | Hitachi SU6600 | F-362 | Yingda Yu |
|
| FE-SEM with Bruker EDS/NORDIF EBSD system | Zeiss Ultra 55 | F-362 | Yingda Yu |
|
| SEM with Nordif EBSD system | JEOL JSM 840A | F-362 | Yingda Yu |
|
| TEM with Gatan GIF system | JEOL TEM 2010 | F-368 | Yingda Yu |
|
| SEM with Gatan CL system | JEOL JSM 840 | F-369 | Yingda Yu | |
| SEM with JEOL EDS system | JEOL JSM 6010LA | F-369 | Yingda Yu |
|
| FE-SEM wirh EDAX EDS system | Zeiss Supra 55VP | F-369 | Yingda Yu |
|
| FE-EPMA wirh JEOL WDS system | JEOL JXA 8500 | F-373 | Morten Raanes |
|
| Scanning probe microscope (AFM/STM) | Agilent 5500 | KII-003A | Magnus Følstad | |
| UV-vis/NIR spektrofotometer + potensiostat | Photoelectrochemical station | KII-014 | Magnus Følstad | |
| | Perkin Elmer Diffential scanning calorimeter | KII-103 | Sverre Magnus Selback | |
| ovn | High temperature oxygen flux furnace | KII-103 | Belma Talic | |
| Thermal analysis | NETZSCH dilatometer 402E | KII-103 | Ove Darell | |
| Thermal analysis | NETZSCH dilatometer 402C | KII-103 | Eli Beate Larsen | |
| Thermal analysis | NETZSCH STA449 jupiter | KII-103 | Eli Beate Larsen | |
| Thermal analysis | NETZSCH STA449 jupiter | KII-103 | Eli Beate Larsen | |
| ovn | Electrical conductivity furnace | KII-103 | Belma Talic | |
| | Nitrogentank | KII-107 | Elin Albertsen | |
| | PSA Malvern 2000 | KII-107 | Jannicke Kvello | |
| Surface and particle analysis | TRISTAR 3000 surface area and porosity analyzer | KII-107 | Elin Albertsen | BET |
| | LECO, oksygen og nitrogenanalysator | KII-107 | Anne Støre | |
| | Accupyc 1330 Pycnometer | KII-107 | Julian Tolchard | |
| | D8 advance Bruker | KII-113 | Julian Tolchard | |
| | Da Vinci 1 Bruker | KII-113 | Julian Tolchard | |
| | Da Vinci 2 Bruker | KII-113 | Julian Tolchard | |
| | A-unit X-ray diffractometer | KII-113 | Julian Tolchard | |
| | D8 focus Siemens | KII-113 | Julian Tolchard | |
| | Optisk dilatometer-Expert system | KII-119 | Anne Støre | |
| | LFA Microflash, termisk diffusivitet | KII-119 | Anne Støre | |
| Zetapotensial- og partikkelstørrelse-måler | Beckman Coulter DelsaNano C | KII-223 | Magnus Følstad | |
| GD-OES | GD-profiler | KII-307 | Maria Stepanova | |
| Mikroskop | Optical microscope Nikon SM2800 | KII-323 | | |
| Mikroskop | Optical microscope Leica DM IRM | KII-323 | | |
| Scanning probe microscope (AFM/STM) | Agilent 5500 | KII-003A | Magnus Følstad | |
| Lysmikroskop | Zeiss | | | |
| Lysmikroskop | Wild Heerbrugg | | | |
| IR instrument | Bruker IFS66V | KII-014 | | |
| UV-vis/NIR spektrofotometer + potensiostat | Photoelectrochemical station | | Magnus Følstad | |
| Massespektrometer | Pfeiffer Vacum Prisma Plus HiCube | | Morten Tjelta | |
| Viskositetsmåling | Haake Mars Modular Advanced Rheometer System | | | |
| Viskositetsmåling | Haake Viskotester 550 Thermo Scientific | | | |
| Lysmikroskop | Leica DMIL | | Trygve L Schanche | |
| Lysmikroskop | Olympus BH-2 | KII-032A | Stein Rørvik | |
| Lysmikroskop | Reichert MeF3A med Sony kamera | | Stein Rørvik | |
| Lysmikroskop | Olympus BX60 | | Stein Rørvik | |
| Peizoelektriske målinger | Aix PES Piezoelectric evaluation | | | |
| Lysmikroskop | Leica EZ4 | | | |
| Scanning electron microscope | Hitachi S-3400N | KII-036 | | Lv-sem Sem Sælandsvei (Hitachi S-3400N) |