Description:
Diffractometter with Ge-002 monochromator and CuKα1 radiation for thin film studies.
- XRR studies, phase analysis and thickness of thin layers.
- HR-XRD studies, thin-film strain analysis
- GIXRD studies, grazing inside diffraction on thin films.
Instrument specifications:
- Cu source
- Gobel mirror and 2 bounce (220) monocromator.
- θ–2θ operating mode.
- Sample stage: 5-axis Eulerian cradle.
- Data collection from 0° to 120° 2θ.
- Detectors: LynxEye detector for 0D and 1D scan. Scintillation counter detector connected to analyzer for better resolution.
Before you begin:
Equipment can not be used without training. See XRD-lab info.
Booking the instrument
Use the booking system.