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Type of equipmentName of equipmentLocationContact personLink to more information
Element AnalysisGD-MSE-208Chiara Modanese

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Electron microscope laboratories

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Texture AnalysisX-ray diffractometerA-347Torild Krogstad 
LysmikroskopWild HeerbruggA-443Trygve L. Schanche 
LysmikroskopLeica MEF4ME-514Trygve L. Schanche 
LysmikroskopReichert-Jung UnivarE-514Trygve L. Schanche 
MakroskopLeitz M400E-508Trygve L. Schanche 
LysmikroskopLeitz MM6E-508Trygve L. Schanche 
LysmikroskopZeiss Axiovert 25E-508Trygve L. SchancheZeiss Axiovert 25
LysmikroskopLeitz metalloplanE-508Trygve L. Schanche 
LysmikroskopLeitz 1AE-508Trygve L. Schanche 
LysmikroskopReichert MEF1E-508Trygve L. Schanche 
LysmikroskopLeitz Metallux 3E-514ATrygve L. SchancheLeitz Metallux 3
Videokamera (2 stk)JVC TK-S310 EGE-514ATrygve L. Schanche 
Videokamera til mikroskopLeica R3 elecrt.E-514A  
LysmikroskopLeitz AxioskopE-514ATrygve L. SchancheLeitz Axioskop
FE-SEM with Bruker EDS/NORDIF EBSD systemHitachi SU6600F-362Yingda Yu

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Link in New Window
linkTextHitachi SU6600 FEG SEM
hrefhttp://www.material.ntnu.no/lab/material/equipment/HitachiFEG.jpg

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FE-SEM with Bruker EDS/NORDIF EBSD systemZeiss Ultra 55F-362Yingda Yu
Link in New Window
linkText

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Fe-

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sem (

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Zeiss Ultra 55

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LE)
hrefhttp://www.material.ntnu.no/lab/material/equipment/

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ULTRA_Technical.pdf
SEM with Nordif EBSD systemJEOL JSM 840AF-362Yingda Yu
Link in New Window
linkText

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SEM A (JSM 840)
hrefhttp://www.material.ntnu.no/lab/material/equipment/

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ProdInfoSEM_

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A.pdf
TEM with Gatan GIF systemJEOL TEM 2010F-368Yingda Yu
Link in New Window
linkTextTEM (JEOL

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, JEM-2010)
href

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https://www

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.ntnu.no/

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wiki/download/

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attachments/

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67474571/

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TEMinfo.pdf?version=1&modificationDate=1409311611000&api=v2
SEM with Gatan CL systemJEOL JSM 840F-369Yingda Yu 
SEM with JEOL EDS systemJEOL JSM 6010LAF-369Yingda Yu
Link in New Window
linkTextEDS, EDAX Gernesis
hrefhttp://edax.com/
FE-SEM wirh EDAX EDS systemZeiss Supra 55VPF-369Yingda Yu
Link in New Window
linkText

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LV-Fe-SEM (ZeissSupra 55 VP)
hrefhttp://www.material.ntnu.no/lab/material/equipment/ProdInfoFE-SEM.pdf
FE-EPMA wirh JEOL WDS systemJEOL JXA 8500F-373Morten Raanes
Link in New Window
linkTextJEOL JXA-8500F Electron Probe Micro analyzer (EPMA)
href

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http://www.material.ntnu.no/

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lab/

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material/

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equipment/

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ProdInfoEPMA.pdf
Scanning probe microscope (AFM/STM)Agilent 5500KII-003AMagnus Følstad

 

 

UV-vis/NIR spektrofotometer + potensiostatPhotoelectrochemical stationKII-014Magnus Følstad

 

 

 Perkin Elmer Diffential scanning calorimeterKII-103Sverre Magnus Selback 
ovnHigh temperature oxygen flux furnaceKII-103Belma Talic 
Thermal analysisNETZSCH dilatometer 402EKII-103Ove Darell 
Thermal analysisNETZSCH dilatometer 402CKII-103Eli Beate Larsen 
Thermal analysisNETZSCH STA449 jupiterKII-103Eli Beate Larsen 
Thermal analysisNETZSCH STA449 jupiterKII-103Eli Beate Larsen 
ovnElectrical conductivity furnaceKII-103Belma Talic 
 NitrogentankKII-107Elin Albertsen 
 PSA Malvern 2000KII-107Jannicke Kvello 
Surface and particle analysisTRISTAR 3000 surface area and porosity analyzer KII-107Elin AlbertsenBET
 LECO, oksygen og nitrogenanalysatorKII-107Anne Støre 
 Accupyc 1330 PycnometerKII-107Julian Tolchard 
 D8 advance BrukerKII-113Julian Tolchard 
 Da Vinci 1 BrukerKII-113Julian Tolchard 
 Da Vinci 2 BrukerKII-113Julian Tolchard 
 A-unit X-ray diffractometerKII-113Julian Tolchard 
 D8 focus SiemensKII-113Julian Tolchard 
 Optisk dilatometer-Expert systemKII-119Anne Støre 
 LFA Microflash, termisk diffusivitetKII-119Anne Støre 
Zetapotensial- og partikkelstørrelse-målerBeckman Coulter DelsaNano CKII-223Magnus Følstad 
GD-OESGD-profilerKII-307Maria Stepanova 
MikroskopOptical microscope Nikon SM2800KII-323  
MikroskopOptical microscope Leica DM IRMKII-323  
Scanning probe microscope (AFM/STM)Agilent 5500KII-003AMagnus Følstad 
LysmikroskopZeiss   
LysmikroskopWild Heerbrugg  

 

 

IR instrumentBruker IFS66VKII-014  
UV-vis/NIR spektrofotometer + potensiostatPhotoelectrochemical station Magnus Følstad 
MassespektrometerPfeiffer Vacum Prisma Plus HiCube Morten Tjelta 
ViskositetsmålingHaake Mars Modular Advanced Rheometer System   
ViskositetsmålingHaake Viskotester 550 Thermo Scientific   
LysmikroskopLeica DMIL Trygve L Schanche 
LysmikroskopOlympus BH-2KII-032AStein Rørvik 
LysmikroskopReichert MeF3A med Sony kamera Stein Rørvik 
LysmikroskopOlympus BX60 Stein Rørvik 
Peizoelektriske målingerAix PES Piezoelectric evaluation   
LysmikroskopLeica EZ4   
Scanning electron microscopeHitachi S-3400NKII-036 

Lv-sem Sem Sælandsvei (Hitachi S-3400N)

 

 

 

 

 

Section

Electron microscope laboratories

  • Link in New Window
    linkTextFishione Plasma Cleaner, EM sample cleaning
    hrefhttp://www.fischione.com/products/model_1020.asp
  • Link in New Window
    linkTextAgar Turbo Carbon Coater, SEM sample coating
    hrefhttp://www.agarscientific.com/
  • Link in New Window
    linkTextFischione Ion Mill, TEM sample preparation
    hrefhttp://www.fischione.com/products/model_1010.asp

     

Contact : 

Link in New Window
linkTextYingda Yu
hrefhttp://folk.ntnu.no/yingday/
 and 
Link in New Window
linkTextMorten Raanes
hrefhttp://www.ntnu.no/ansatte/morten.raanes

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Optical microscope

Type of equipmentNameLab 
MicroscopeLeitz AxioskopE-514ALeitz Axioskop
MicroscopeLeitz Metallux 3E-514ALeitz Metallux 3
Microscope (inverted)Zeiss Axiovert 25E-508Zeiss Axiovert 25

Scanning probe microscope

Thermal analysis

Spectroscopy

Type of equipmentEquipment NameLabContact personLink to more information
GD-MSElement GDE-208

Chiara Modanese /41520593 

 

XRD

Type of equipmentEquipment NameLabContact personLink to more information
X-ray diffractometerSiemens D5000A 441

Torild Krogstad / 918 97 623 

 

Surface and particle analysis

Type of equipmentEquipment NameLabContact personLink to more information
Suface and particle analysisTristar 3000K2-107

Elin H. Albertsen

BET