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Optical Microscope

Type of equipmentName of equipmentLocationContact personLink to more information
Optical microscopeWild HeerbruggA-443Trygve L. Schanche Berit Vinje Kramer
Optical microscopeLeica MEF4ME-514Trygve L. SchancheBerit Vinje Kramer   
Optical microscopeReichert-Jung UnivarE-514Trygve L. SchancheBerit Vinje Kramer   
Optical microscopeMakroskop Leitz M400E-508Trygve L. SchancheBerit Vinje Kramer   
Optical microscopeLeitz MM6E-508Trygve L. SchancheBerit Vinje Kramer   
Optical microscopeZeiss Axiovert 25E-508Trygve L. SchancheBerit Vinje Kramer  Zeiss Axiovert 25
Optical microscopeLeitz metalloplanE-508Trygve L. SchancheBerit Vinje Kramer   
Optical microscopeLeitz 1AE-508Trygve L. SchancheBerit Vinje Kramer   
Optical microscopeReichert MEF1E-508Trygve L. Schanche   Berit Vinje Kramer  
Optical microscopeLeitz Metallux 3E-514ATrygve L. SchancheBerit Vinje Kramer  Leitz Metallux 3
Videokamera (2 stk)JVC TK-S310 EGKII-014Trygve L. Schanche   
Videokamera til mikroskopLeica R3 elecrt.E-514ATrygve L. SchancheBerit Vinje Kramer   
Optical microscopeLeitz AxioskopE-514ATrygve L. SchancheBerit Vinje Kramer  Leitz Axioskop
Optical MicroscopeNikon SM2800KII-323Eli Beate Larsen 
Optical MicroscopeLeica DM IRMKII-323Eli Beate Larsen Johannes Ofstad
Optical microscopeZeissKII-003A Magnus B. Følstad 008Marthe Folstad
Optical microscopeLeica DMILKII-022Kara PoonAndrey Kosinskiy 
Optical microscopeOlympus BH-2KII-032AStein Rørvik (SINTEF) 
Optical microscopeReichert MeF3A med Sony kameraKII-032AStein Rørvik (SINTEF) 
Optical microscopeOlympus BX60KII-032AStein Rørvik (SINTEF) 
Optical microscopeLeica EZ4KII-034BSergey Khromov 
Optical microscopeWild HeerbruggKII-011  

Optical microscope 3DAlicona Infinite FocusKII-032AKara Poon Andrey Kosinskiy

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Electron microscope
Electron microscope

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Info

More information on SEM - TEM

EMlab


Type of equipmentName of equipmentLocationContact personLink to more information
Scanning Electron Microscopy

FE-SEM with Bruker EDS/NORDIF EBSD system

Hitachi SU6600

F-362Yingda Yu

Link in New Window
linkTextHitachi SU6600 FEG SEM
hrefhttp://www.material.ntnu.no/lab/material/equipment/HitachiFEG.jpg

 


Scanning Electron Microscopy

FE-SEM with Bruker EDS/NORDIF EBSD system

Zeiss Ultra 55

F-362Yingda Yu
Link in New Window
linkTextFe-sem (Zeiss Ultra 55 LE)
hrefhttp://www.material.ntnu.no/lab/material/equipment/ULTRA_Technical.pdf
Scanning Electron Microscopy

SEM with Nordif EBSD system

JEOL JSM 840A

F-362Yingda Yu
Link in New Window
linkTextSEM A (JSM 840)
hrefhttp://www.material.ntnu.no/lab/material/equipment/ProdInfoSEM_A.pdf
Scanning Electron Microscopy

SEM with Gatan CL system

JEOL JSM 840

F-369Yingda Yu 
Scanning Electron Microscopy

SEM with JEOL EDS system

JEOL JSM 6010LA

F-369Yingda Yu
Link in New Window
linkTextEDS, EDAX Gernesis
hrefhttp://edax.com/
Scanning Electron Microscopy

FE-SEM wirh EDAX EDS system

Zeiss Supra 55VP

F-369Yingda Yu
Link in New Window
linkTextLV-Fe-SEM (ZeissSupra 55 VP)
hrefhttp://www.material.ntnu.no/lab/material/equipment/ProdInfoFE-SEM.pdf
Scanning electron microscopyHitachi S-3400NKII-036Sergey Khromov 

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Scanning probe microscope
Scanning probe microscope

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Type of equipmentName of equipmentLocationContact personLink to more information
Electron Micro Probe Analyzer

FE-EPMA wirh JEOL WDS system

JEOL JXA 8500

F-373Morten Raanes
Link in New Window
linkTextJEOL JXA-8500F Electron Probe Micro analyzer (EPMA)
hrefhttp://www.material.ntnu.no/lab/material/equipment/ProdInfoEPMA.pdf
Scanning probe microscopeAgilent 5500 AFM/SPM microscopeKII-003A008Marthe FolstadMagnus B. FølstadAbout the instrument

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TEM
TEM

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Info

More information on SEM - TEM

EMlab


Type of equipmentName of equipmentLocationContact personLink to more information
TEM with Gatan GIF systemJEOL TEM 2010F-368Yingda Yu 

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Thermal analysis
Thermal analysis

Thermal analysis

Forms to filled out: Request for use of TA instruments at IMA (office.com

TA-form:  TA-analysis_form.pdf

General information:

Using steam as sample gas: Water vapor pressure Generator.pdf

Type of equipmentName of equipmentLocationContact personLink to more information
Thermal analysisDTA/TGA Setaram SensisA-K032Sarina Bao (SINTEF)
 

Thermal analysisElectrical conductivity furnace
KII-103

Pei Na Kui
 
 Dilatometer

Thermal analysisNETZSCH dilatometer 402C, themal analysisKII-103
Babak Khalaghi
Pei Na Kui
Thermal analysisNETZSCH STA F3 449 Jupiter (Hugin)KII-103
Babak KhalaghiSimultaneous Thermal Analysis
Martin OppegårdInstrument information
Thermal analysisNETZSCH STA C 449 Jupiter, (Munin)KII-103
Babak Khalaghi
Martin Oppegård
Simultaneous

Thermal
Analysis combined with mass spectrometryThermal
analysisLINSEIS STA PT 1600, (Linseis)KII-103
Babak Khalaghi
Martin OppegårdInstrument info
Simultaneous Thermal Analysis
Thermal analysisNETZSCH dilatometer 402EKII-103
Ove Darell
Paul Inge Dahl (SINTEF)
 

Thermal analysisNETZSCH DSC 214 Polyma KII-103
Babak KhalaghiDSC 214 Polyma
Pei Na Kui
Thermal analysisOptisk dilatometer-Expert systemKII-103Anne Støre (SINTEF)
 

Thermal analysisLFA Microflash, termisk diffusivitetKII-103Anne Støre (SINTEF)
 

Thermal analysisDilatometerKII-303Anne Støre (SINTEF)
 

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Spectroscopy
Spectroscopy

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Type of equipmentName of equipmentLocationContact personLink to more information
SpectroscopyGlow discharge optical emission spectroscopy (GD-OES)Horiba GD profiler 2KII-307Mariia StepanovaSergey Khromov Spectroscopy Element AnalysisGD-MSE-208Chiara ModaneseGlow discharge optical emission spectroscopy (GD-OES) Horiba GD Profiler 2
Glow discharge mass spectrometry (GDMS)Astrum GDMS (Nu Instruments, Ametek)KII-307Sergey Khromov Glow discharge mass spectrometry Astrum GDMS (Nu instruments, Ametek) 
Mass spectrometer + potensiostatDifferential Electrochemical Mass Spectrometry (DEMS) stationKII-323Magnus B. Følstad Svein Sunde
UV-vis/NIR spectrophotometer + potensiostatPhotoelectrochemical stationKII-001Magnus B. Følstad008Svein Sunde 
FTIR spectrometerBruker Vertex 80vKII-323

Johannes Ofstad

 Bruker Vertex 80v

Raman microscopeWITec alpha300 RKII-323

Johannes Ofstad

 WITec alpha300r

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Surface and particle analysis
Surface and particle analysis

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KII-223
Type of equipmentName of equipmentLocationContact personLink to more information
Surface and particle analysis

3Flex 3500

KII-107Elin AlbertsenBET
Surface and particle analysisTRISTAR 3000 surface area and porosity analyzer KII-107Elin AlbertsenBET
Surface and particle analysisPermeabilitetKII-303Anne Støre (SINTEF)

 

Zetapotential and particle size analyzerBeckman Coulter DelsaNano CMagnus B. FølstadDescription, terms of use & user manual


Surface analyzerDrop Shape Analyzer - DSA100KII-321Johannes OfstadDescription
Laser scattering particle size analyzerHoriba LA-960 ParticaKII-107Eva RiseAnita Britt OlsenDescription
Micro Scratch TesterST Instruments B AKII-321Johannes Ofstad 
Density and volume analysisPycnometerKII-107Elin AlbertsenAccuPyc II 1340

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XRD
XRD

XRD

Info

More information about the XRD lab


Type of equipmentName of equipmentLocationContact personLink to more information
XRDRoutine Powder Diffractometer (DaVinci1)KII-113Contact personRoutine powder XRD
XRDPowder diffractometer (D8 Focus)KII-113Contact person9-pos Powder XRD
XRDSiemens D5005 with monochromator (A-unitThin-film Diffractometer (D8 Discover)KII-113Contact personSiemens D5005D8 Discover
XRDMultipurpose Powder X-ray diffractometer (DaVinci2)KII-113Contact personMultipurpose XRD
XRDNon-ambient X-ray diffractometer (D8 Advance)KII-113Contact personNon-ambient XRD
Texture AnalysisX-ray diffractometerA-347Håkon Wiik ÅnesXRD


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Solar cell silicon characterisation
Solar cell silicon characterisation

Solar cell silicon characterisation

Type of equipmentName of equipmentLocationContact personLink to more information
Si - CharacterisationNicolet 6700 FT-IRM-104Chiara Modanese 
Si - CharacterisationµLPCD resistivty life time measurmentM-104Gaute Stokkan (SINTEF) 
Si - CharacterisationSiWaScanM-104Gaute Stokkan (SINTEF) 
Si - Characterisationmicro cracks characterisationM-104Kai Erik Ekstrøm 
Si - Characterisation Crystal deffect mesurmentPVSCAN 6000M-104Gaute Stokkan (SINTEF) 
Si - Characterisation Density ImagingCDI-CarrierM-104Gaute Stokkan (SINTEF) 

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Inductively couple plasma mass spectrometry (ICP-MS)
Inductively couple plasma mass spectrometry (ICP-MS)

Inductively coupled plasma mass spectrometry (ICP-MS)

Type of equipmentName of equipmentLocationContact personLink to more information
ICP-MSPerkin Elmer NexION 5000KII-321

Shannen Thora Lea Sait

Henrik Ness


Electrical resistivity measurement

Type of equipmentName of equipmentLocationContact personLink to more information
Resistivity measurement (metals)SigmascopeE-508Trygve L. Schanche 

 

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Berit Vinje Kramer