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Optical Microscope

Type of equipmentName of equipmentLocationContact personLink to more information
Optical microscopeWild HeerbruggA-443
Trygve L. Schanche 
Berit Vinje Kramer
Optical microscopeLeica MEF4ME-514
Trygve L. Schanche
Berit Vinje Kramer  
  

Optical microscopeReichert-Jung UnivarE-514
Trygve L. Schanche   
Berit Vinje Kramer  
Optical microscopeMakroskop Leitz M400E-508
Trygve L. Schanche  
Berit Vinje Kramer  
Optical microscopeLeitz MM6E-508
Trygve L. Schanche
Berit Vinje Kramer  
 

Optical microscopeZeiss Axiovert 25E-508
Trygve L. Schanche
Berit Vinje Kramer  Zeiss Axiovert 25
Optical microscopeLeitz metalloplanE-508
Trygve L. Schanche
Berit Vinje Kramer  
 

Optical microscopeLeitz 1AE-508
Trygve L. Schanche
Berit Vinje Kramer  
  

Optical microscopeReichert MEF1E-508
Trygve L. Schanche  
Berit Vinje Kramer  
Optical microscopeLeitz Metallux 3E-514A
Trygve L. Schanche
Berit Vinje Kramer  Leitz Metallux 3
Videokamera (2 stk)JVC TK-S310 EGKII-014Trygve L. Schanche  
 

Videokamera til mikroskopLeica R3 elecrt.E-514A
Trygve L. Schanche
Berit Vinje Kramer  
 

Optical microscopeLeitz AxioskopE-514A
Trygve L. Schanche
Berit Vinje Kramer  Leitz Axioskop
Optical MicroscopeNikon SM2800KII-323Eli Beate Larsen
 

Optical MicroscopeLeica DM IRMKII-323
Eli Beate Larsen  Magnus B. Følstad 
Johannes Ofstad
Optical microscopeZeissKII-
003A
008Marthe Folstad
Optical microscopeLeica DMILKII-022
Kara Poon
Andrey Kosinskiy
 

Optical microscopeOlympus BH-2KII-032AStein Rørvik (SINTEF)
 

Optical microscopeReichert MeF3A med Sony kameraKII-032AStein Rørvik (SINTEF)
 

Optical microscopeOlympus BX60KII-032AStein Rørvik (SINTEF)
 

Optical microscopeLeica EZ4KII-034BSergey Khromov
 

Optical microscopeWild HeerbruggKII-011
   


Optical microscope 3DAlicona Infinite FocusKII-032A
Kara Poon
Andrey Kosinskiy

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Electron microscope
Electron microscope

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Info

More information on SEM - TEM

EMlab


Type of equipmentName of equipmentLocationContact personLink to more information
Scanning Electron Microscopy

FE-SEM with Bruker EDS/NORDIF EBSD system

Hitachi SU6600

F-362Yingda Yu

Link in New Window
linkTextHitachi SU6600 FEG SEM
hrefhttp://www.material.ntnu.no/lab/material/equipment/HitachiFEG.jpg

 


Scanning Electron Microscopy

FE-SEM with Bruker EDS/NORDIF EBSD system

Zeiss Ultra 55

F-362Yingda Yu
Link in New Window
linkTextFe-sem (Zeiss Ultra 55 LE)
hrefhttp://www.material.ntnu.no/lab/material/equipment/ULTRA_Technical.pdf
Scanning Electron Microscopy

SEM with Nordif EBSD system

JEOL JSM 840A

F-362Yingda Yu
Link in New Window
linkTextSEM A (JSM 840)
hrefhttp://www.material.ntnu.no/lab/material/equipment/ProdInfoSEM_A.pdf
Scanning Electron Microscopy

SEM with Gatan CL system

JEOL JSM 840

F-369Yingda Yu
 

Scanning Electron Microscopy

SEM with JEOL EDS system

JEOL JSM 6010LA

F-369Yingda Yu
Link in New Window
linkTextEDS, EDAX Gernesis
hrefhttp://edax.com/
Scanning Electron Microscopy

FE-SEM wirh EDAX EDS system

Zeiss Supra 55VP

F-369Yingda Yu
Link in New Window
linkTextLV-Fe-SEM (ZeissSupra 55 VP)
hrefhttp://www.material.ntnu.no/lab/material/equipment/ProdInfoFE-SEM.pdf
Scanning electron microscopyHitachi S-3400NKII-036Sergey Khromov
 

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Scanning probe microscope
Scanning probe microscope

Scanning probe microscope

Type of equipmentName of equipmentLocationContact personLink to more information
Electron Micro Probe Analyzer

FE-EPMA wirh JEOL WDS system

JEOL JXA 8500

F-373Morten Raanes
Link in New Window
linkTextJEOL JXA-8500F Electron Probe Micro analyzer (EPMA)
hrefhttp://www.material.ntnu.no/lab/material/equipment/ProdInfoEPMA.pdf
Scanning probe microscopeAgilent 5500 AFM/SPM microscopeKII-
003AMagnus B. Følstad
008Marthe FolstadAbout the instrument

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TEM
TEM

Transmission electron microscopy

Info

More information on SEM - TEM

EMlab


Type of equipmentName of equipmentLocationContact personLink to more information
TEM with Gatan GIF systemJEOL TEM 2010F-368Yingda Yu
 

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Thermal analysis
Thermal analysis

Thermal analysis

Forms to filled out: Request for use of TA instruments at IMA (office.com

TA-form:  TA-analysis_form.pdf

General information:

Using steam as sample gas: Water vapor pressure Generator.pdf

Type of equipmentName of equipmentLocationContact personLink to more information
Thermal analysisDTA/TGA Setaram SensisA-K032Sarina Bao (SINTEF)
 

Thermal analysisElectrical conductivity furnace
KII-103

Pei Na Kui
  

Thermal analysisNETZSCH dilatometer 402C, themal analysisKII-103
Babak KhalaghiDilatometer
Pei Na Kui
Thermal analysisNETZSCH STA F3 449 Jupiter (Hugin)KII-103
Babak KhalaghiSimultaneous Thermal Analysis
Martin OppegårdInstrument information
Thermal analysisNETZSCH STA C 449 Jupiter, (Munin)KII-103
Babak KhalaghiSimultaneous Thermal Analysis combined with mass spectrometry
Martin Oppegård
Thermal analysisLINSEIS STA PT 1600, (Linseis)KII-103
Babak Khalaghi
Martin OppegårdInstrument info
Simultaneous Thermal Analysis
Thermal analysisNETZSCH dilatometer 402EKII-103
Ove Darell
Paul Inge Dahl (SINTEF)
 

Thermal analysisNETZSCH DSC 214 Polyma KII-103
Babak KhalaghiDSC 214 Polyma
Pei Na Kui
Thermal analysisOptisk dilatometer-Expert systemKII-103Anne Støre (SINTEF)
 

Thermal analysisLFA Microflash, termisk diffusivitetKII-103Anne Støre (SINTEF)
 

Thermal analysisDilatometerKII-303Anne Støre (SINTEF)
 

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Spectroscopy
Spectroscopy

Spectroscopy

Type of equipmentName of equipmentLocationContact personLink to more information
Spectroscopy
Glow discharge optical emission spectroscopy (GD-OES)Horiba GD profiler 2KII-307
Mariia Stepanova
Sergey Khromov 
Spectroscopy Element AnalysisGD-MSE-208Chiara Modanese
Glow discharge optical emission spectroscopy (GD-OES) Horiba GD Profiler 2
Glow discharge mass spectrometry (GDMS)Astrum GDMS (Nu Instruments, Ametek)KII-307Sergey Khromov Glow discharge mass spectrometry Astrum GDMS (Nu instruments, Ametek)
 
Mass spectrometer + potensiostatDifferential Electrochemical Mass Spectrometry (DEMS) stationKII-323
Magnus B. Følstad Magnus B. Følstad 
Svein Sunde
UV-vis/NIR spectrophotometer + potensiostatPhotoelectrochemical stationKII-
001
008Svein Sunde
FTIR spectrometerBruker Vertex 80vKII-323
Johannes

Johannes Ofstad

 

Bruker Vertex 80v

Raman microscopeWITec alpha300 RKII-323
Johannes

Johannes Ofstad

 WITec alpha300r

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Surface and particle analysis
Surface and particle analysis

Surface and particle analysis

Type of equipmentName of equipmentLocationContact personLink to more information
Surface and particle analysis
PSA Malvern 2000

3Flex 3500

KII-107Elin Albertsen
 
BET
Surface and particle analysisTRISTAR 3000 surface area and porosity analyzer KII-107Elin AlbertsenBET
Surface and particle analysisPermeabilitetKII-303Anne Støre (SINTEF)

 

Zetapotential and particle size analyzerBeckman Coulter DelsaNano CKII-223
Magnus B. FølstadDescription, terms of use & user manual


Surface analyzerDrop Shape Analyzer - DSA100KII-321
Anita Storsve
Johannes OfstadDescription
Laser scattering particle size analyzerHoriba LA-960 ParticaKII-107
Eva Rise
Anita Britt OlsenDescription
Micro Scratch TesterST Instruments B AKII-321
Anita Storsve
Johannes Ofstad
Density and volume analysisPycnometerKII-107Elin AlbertsenAccuPyc II 1340
 

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XRD
XRD

XRD

Info

More information about the XRD lab


Type of equipmentName of equipmentLocationContact personLink to more information
XRDRoutine Powder Diffractometer (DaVinci1)KII-113Contact personRoutine powder XRD
XRDPowder diffractometer (D8 Focus)KII-113Contact person9-pos Powder XRD
XRD
Siemens D5005 with monochromator (A-unit
Thin-film Diffractometer (D8 Discover)KII-113Contact person
Siemens D5005
D8 Discover
XRDMultipurpose Powder X-ray diffractometer (DaVinci2)KII-113Contact personMultipurpose XRD
XRDNon-ambient X-ray diffractometer (D8 Advance)KII-113Contact personNon-ambient
XRDTexture AnalysisX-ray diffractometerA-347Håkon Wiik Ånes
XRD


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Solar cell silicon characterisation
Solar cell silicon characterisation

Solar cell silicon characterisation

Type of equipmentName of equipmentLocationContact personLink to more information
Si - CharacterisationNicolet 6700 FT-IRM-104Chiara Modanese
 

Si - CharacterisationµLPCD resistivty life time measurmentM-104Gaute Stokkan (SINTEF)
 

Si - CharacterisationSiWaScanM-104Gaute Stokkan (SINTEF)
 

Si - Characterisationmicro cracks characterisationM-104Kai Erik Ekstrøm
 

Si - Characterisation Crystal deffect mesurmentPVSCAN 6000M-104Gaute Stokkan (SINTEF)
 

Si - Characterisation Density ImagingCDI-CarrierM-104Gaute Stokkan (SINTEF
) 

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Inductively couple plasma mass spectrometry (ICP-MS)
Inductively couple plasma mass spectrometry (ICP-MS)

Inductively coupled plasma mass spectrometry (ICP-MS)

Type of equipmentName of equipmentLocationContact personLink to more information
ICP-MSPerkin Elmer NexION 5000KII-321

Shannen Thora Lea Sait

Henrik Ness


Electrical resistivity measurement

Type of equipmentName of equipmentLocationContact personLink to more information
Resistivity measurement (metals)SigmascopeE-508
Trygve L. Schanche 

 

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Berit Vinje Kramer