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| Thermal analysis |
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| Thermal analysis |
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Thermal analysis
Forms to filled out: Request for use of TA instruments at IMA (office.com)
Information:
| Type of equipment | Name of equipment | Location | Contact person |
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Link to more information |
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| Thermal analysis | DTA/TGA Setaram Sensis | A-K032 | Sarina Bao (SINTEF) |
| Thermal analysis | Electrical conductivity furnace | KII-103 |
Eli Beate LarsenDilatometer| Pei Na Kui |
| Thermal analysis | NETZSCH dilatometer 402C, themal analysis | KII-103 |
Eli Beate Larsen | | Pei Na Kui |
| Thermal analysis | NETZSCH STA F3 449 Jupiter (Hugin) | KII-103 |
Eli Beate LarsenSimultaneous AnalysisThermal | analysis | NETZSCH STA C 449 Jupiter, (Munin) | KII-103 |
Eli Beate LarsenSimultaneous Analysis combined with mass spectrometryThermal Simultaneous Thermal Analysis| analysis | LINSEIS STA PT 1600, (Linseis) | KII-103 |
Eli Beate Larsen | | Martin Oppegård |
| Thermal analysis | NETZSCH dilatometer 402E | KII-103 | Paul Inge Dahl (SINTEF) |
| Thermal analysis | NETZSCH DSC 214 Polyma | KII-103 |
Eli Beate Larsen | DSC 214 Polyma| Pei Na Kui |
| Thermal analysis | Optisk dilatometer-Expert system | KII-103 | Anne Støre (SINTEF) |
| Thermal analysis | LFA Microflash, termisk diffusivitet | KII-103 | Anne Støre (SINTEF) |
| Thermal analysis | Dilatometer | KII-303 | Anne Støre (SINTEF) |
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