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Diffractometter with Ge-002 monochromator and CuKα₁ radiation for thin film studies.

• XRR studies, phase analysis and thickness :  thickness, surface roughness and electron density measurement of thin layers.
• HR-XRD studies, thin-film strain analysis : crystalline quality of the sample, strain analysis, 
• GIXRD studies, : grazing inside diffraction on thin films.

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Instrument specifications:

• Cu source
• Gobel mirror and 2 bounce Ge(220) monocromator.
• θ–2θ operating mode.
• Sample stage: 5-axis Eulerian cradle.
• Data collection from 0° to 120° 2θ.
• Detectors:  LynxEye detector for 0D and 1D scan. Scintillation counter detector connected to analyzer for better resolution.

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