Optical Microscope

Type of equipment	Name of equipment	Location	Contact person	Link to more information
Optical microscope	Wild Heerbrugg	A-443	Trygve L. Schanche
Optical microscope	Leica MEF4M	E-514	Trygve L. Schanche
Optical microscope	Reichert-Jung Univar	E-514	Trygve L. Schanche
Optical microscope	Makroskop Leitz M400	E-508	Trygve L. Schanche
Optical microscope	Leitz MM6	E-508	Trygve L. Schanche
Optical microscope	Zeiss Axiovert 25	E-508	Trygve L. Schanche	Zeiss Axiovert 25
Optical microscope	Leitz metalloplan	E-508	Trygve L. Schanche
Optical microscope	Leitz 1A	E-508	Trygve L. Schanche
Optical microscope	Reichert MEF1	E-508	Trygve L. Schanche
Optical microscope	Leitz Metallux 3	E-514A	Trygve L. Schanche	Leitz Metallux 3
Videokamera (2 stk)	JVC TK-S310 EG	KII-014	Trygve L. Schanche
Videokamera til mikroskop	Leica R3 elecrt.	E-514A	Trygve L. Schanche
Optical microscope	Leitz Axioskop	E-514A	Trygve L. Schanche	Leitz Axioskop
Optical Microscope	Nikon SM2800	KII-323	Eli Beate Larsen
Optical Microscope	Leica DM IRM	KII-323	Eli Beate Larsen
Optical microscope	Zeiss	KII-003A	Magnus Følstad
Optical microscope	Leica DMIL	KII-022	Trygve L. Schanche
Optical microscope	Olympus BH-2	KII-032A	Stein Rørvik (SINTEF)
Optical microscope	Reichert MeF3A med Sony kamera	KII-032A	Stein Rørvik (SINTEF)
Optical microscope	Olympus BX60	KII-032A	Stein Rørvik (SINTEF)
Optical microscope	Leica EZ4	KII-034B	Sergey Khromov
Optical microscope	Wild Heerbrugg	KII-011

Electron microscope

Type of equipment	Name of equipment	Location	Contact person
Scanning Electron Microscopy	FE-SEM with Bruker EDS/NORDIF EBSD system Hitachi SU6600	F-362	Yingda Yu
Scanning Electron Microscopy	FE-SEM with Bruker EDS/NORDIF EBSD system Zeiss Ultra 55	F-362	Yingda Yu
Scanning Electron Microscopy	SEM with Nordif EBSD system JEOL JSM 840A	F-362	Yingda Yu
Scanning Electron Microscopy	SEM with Gatan CL system JEOL JSM 840	F-369	Yingda Yu
Scanning Electron Microscopy	SEM with JEOL EDS system JEOL JSM 6010LA	F-369	Yingda Yu
Scanning Electron Microscopy	FE-SEM wirh EDAX EDS system Zeiss Supra 55VP	F-369	Yingda Yu
Scanning electron microscopy	Hitachi S-3400N	KII-036	Sergey Khromov

Type of equipment

Name of equipment

Location

Contact person

Link to more information

Electron Micro Probe Analyzer

FE-EPMA wirh JEOL WDS system

JEOL JXA 8500

F-373

Scanning probe microscope

Agilent 5500 AFM/SPM microscope

KII-003A

Type of equipment	Name of equipment	Location	Contact person	Link to more information
TEM with Gatan GIF system	JEOL TEM 2010	F-368	Yingda Yu

Type of equipment	Name of equipment	Location	Contact person
Thermal analysis	DTA/TGA Setaram Sensis	A-K032	Sarina Bao (SINTEF)
Thermal analysis	Electrical conductivity furnace	KII-103	Belma Talic
Thermal analysis	NETZSCH dilatometer 402C, themal analysis	KII-103	Eli Beate Larsen
Thermal analysis	NETZSCH STA449 jupiter, thermal analysis 1	KII-103	Eli Beate Larsen
Thermal analysis	NETZSCH STA449 jupiter, thermal analysis 2	KII-103	Eli Beate Larsen
Thermal analysis	NETZSCH dilatometer 402E	KII-103	Ove Darell (SINTEF)
Thermal analysis	Perkin Elmer Diffential scanning calorimeter	KII-103	Sverre Magnus Selbach
Thermal analysis	Optisk dilatometer-Expert system	KII-119	Anne Støre (SINTEF)
Thermal analysis	LFA Microflash, termisk diffusivitet	KII-119	Anne Støre (SINTEF)
Thermal analysis	Dilatometer	KII-303	Anne Støre (SINTEF)

Type of equipment	Name of equipment	Location	Contact person
Spectroscopy	GD-OES	KII-307	Mariia Stepanova
Spectroscopy Element Analysis	GD-MS	E-208	Chiara Modanese
Massespectrometer	Pfeiffer Vacum Prisma Plus HiCube	KII-014	Magnus Følstad
UV-vis/NIR spektrofotometer + potensiostat	Photoelectrochemical station	KII-014	Magnus Følstad

Type of equipment	Name of equipment	Location	Contact person	Link to more information
Surface and particle analysis	PSA Malvern 2000	KII-107	Elin Albertsen
Surface and particle analysis	TRISTAR 3000 surface area and porosity analyzer	KII-107	Elin Albertsen	BET
Surface and particle analysis	Permeabilitet	KII-303	Anne Støre (SINTEF)

Type of equipment	Name of equipment	Location	Contact person	Link to more information
XRD	D8 Advance Bruker	KII-113	Kristin Høydalsvik	The "D8 Advance"
XRD	Da Vinci 1 Bruker	KII-113	Kristin Høydalsvik	The "DaVinci 1"
XRD	Da Vinci 2 Bruker	KII-113	Kristin Høydalsvik	The "DaVinci 2"
XRD	A-unit X-ray diffractometer Siemens	KII-113	Kristin Høydalsvik	The "A-unit"
XRD	D8 Focus Bruker	KII-113	Kristin Høydalsvik	The "D8 Focus"
Texture Analysis	X-ray diffractometer	A-347	Torild Krogstad	XRD

Type of equipment	Name of equipment	Location	Contact person
Si - Characterisation	Nicolet 6700 FT-IR	M-104	Chiara Modanese
Si - Characterisation	µLPCD resistivty life time measurment	M-104	Gaute Stokkan (SINTEF)
Si - Characterisation	SiWaScan	M-104	Gaute Stokkan (SINTEF)
Si - Characterisation	micro cracks characterisation	M-104	Kai Erik Ekstrøm
Si - Characterisation Crystal deffect mesurment	PVSCAN 6000	M-104	Gaute Stokkan (SINTEF)
Si - Characterisation Density Imaging	CDI-Carrier	M-104	Gaute Stokkan (SINTEF)

Type of equipment	Name of equipment	Location	Contact person	Link to more information
Resistivity measurement (metals)	Sigmascope	E-508	Trygve L. Schanche