Type of equipment | Name of equipment | Location | Contact person | Link to more information |
---|---|---|---|---|
Optical microscope | Wild Heerbrugg | A-443 | Trygve L. Schanche | |
Optical microscope | Leica MEF4M | E-514 | Trygve L. Schanche | |
Optical microscope | Reichert-Jung Univar | E-514 | Trygve L. Schanche | |
Optical microscope | Makroskop Leitz M400 | E-508 | Trygve L. Schanche | |
Optical microscope | Leitz MM6 | E-508 | Trygve L. Schanche | |
Optical microscope | Zeiss Axiovert 25 | E-508 | Trygve L. Schanche | Zeiss Axiovert 25 |
Optical microscope | Leitz metalloplan | E-508 | Trygve L. Schanche | |
Optical microscope | Leitz 1A | E-508 | Trygve L. Schanche | |
Optical microscope | Reichert MEF1 | E-508 | Trygve L. Schanche | |
Optical microscope | Leitz Metallux 3 | E-514A | Trygve L. Schanche | Leitz Metallux 3 |
Videokamera (2 stk) | JVC TK-S310 EG | KII-014 | Trygve L. Schanche | |
Videokamera til mikroskop | Leica R3 elecrt. | E-514A | Trygve L. Schanche | |
Optical microscope | Leitz Axioskop | E-514A | Trygve L. Schanche | Leitz Axioskop |
Optical Microscope | Nikon SM2800 | KII-323 | Eli Beate Larsen | |
Optical Microscope | Leica DM IRM | KII-323 | Eli Beate Larsen | |
Optical microscope | Zeiss | KII-003A | Magnus B. Følstad | |
Optical microscope | Leica DMIL | KII-022 | Trygve L. Schanche | |
Optical microscope | Olympus BH-2 | KII-032A | Stein Rørvik (SINTEF) | |
Optical microscope | Reichert MeF3A med Sony kamera | KII-032A | Stein Rørvik (SINTEF) | |
Optical microscope | Olympus BX60 | KII-032A | Stein Rørvik (SINTEF) | |
Optical microscope | Leica EZ4 | KII-034B | Sergey Khromov | |
Optical microscope | Wild Heerbrugg | KII-011 |
Type of equipment | Name of equipment | Location | Contact person | Link to more information |
---|---|---|---|---|
Scanning Electron Microscopy | FE-SEM with Bruker EDS/NORDIF EBSD system Hitachi SU6600 | F-362 | Yingda Yu |
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Scanning Electron Microscopy | FE-SEM with Bruker EDS/NORDIF EBSD system Zeiss Ultra 55 | F-362 | Yingda Yu | |
Scanning Electron Microscopy | SEM with Nordif EBSD system JEOL JSM 840A | F-362 | Yingda Yu | |
Scanning Electron Microscopy | SEM with Gatan CL system JEOL JSM 840 | F-369 | Yingda Yu | |
Scanning Electron Microscopy | SEM with JEOL EDS system JEOL JSM 6010LA | F-369 | Yingda Yu | |
Scanning Electron Microscopy | FE-SEM wirh EDAX EDS system Zeiss Supra 55VP | F-369 | Yingda Yu | |
Scanning electron microscopy | Hitachi S-3400N | KII-036 | Sergey Khromov |
Type of equipment | Name of equipment | Location | Contact person | Link to more information |
---|---|---|---|---|
Electron Micro Probe Analyzer | FE-EPMA wirh JEOL WDS system JEOL JXA 8500 | F-373 | Morten Raanes | |
Scanning probe microscope | Agilent 5500 AFM/SPM microscope | KII-003A | Magnus B. Følstad | About the instrument |
Type of equipment | Name of equipment | Location | Contact person | Link to more information |
---|---|---|---|---|
TEM with Gatan GIF system | JEOL TEM 2010 | F-368 | Yingda Yu |
Type of equipment | Name of equipment | Location | Contact person | Link to more information |
---|---|---|---|---|
Thermal analysis | DTA/TGA Setaram Sensis | A-K032 | Sarina Bao (SINTEF) | |
Thermal analysis | Electrical conductivity furnace | KII-103 | Belma Talic | |
Thermal analysis | NETZSCH dilatometer 402C, themal analysis | KII-103 | Eli Beate Larsen | |
Thermal analysis | NETZSCH STA449 jupiter, thermal analysis 1 | KII-103 | Eli Beate Larsen | |
Thermal analysis | NETZSCH STA449 jupiter, thermal analysis 2 | KII-103 | Eli Beate Larsen | |
Thermal analysis | NETZSCH dilatometer 402E | KII-103 | Ove Darell (SINTEF) | |
Thermal analysis | NETZSCH DSC 214 Polyma | KII -103 | Pei Na Kui | DSC 214 Polyma |
Thermal analysis | Perkin Elmer Diffential scanning calorimeter | KII-103 | Sverre Magnus Selbach | |
Thermal analysis | Optisk dilatometer-Expert system | KII-119 | Anne Støre (SINTEF) | |
Thermal analysis | LFA Microflash, termisk diffusivitet | KII-119 | Anne Støre (SINTEF) | |
Thermal analysis | Dilatometer | KII-303 | Anne Støre (SINTEF) |
Type of equipment | Name of equipment | Location | Contact person | Link to more information |
---|---|---|---|---|
Spectroscopy | GD-OES | KII-307 | Mariia Stepanova | |
Spectroscopy Element Analysis | GD-MS | E-208 | Chiara Modanese | |
Mass spectrometer + potensiostat | Differential Electrochemical Mass Spectrometry (DEMS) station | KII-014 | Magnus B. Følstad | |
UV-vis/NIR spectrophotometer + potensiostat | Photoelectrochemical station | KII-001 | Magnus B. Følstad | |
FTIR spectrometer | Bruker Vertex 80v | KII-014 | Magnus B. Følstad |
Type of equipment | Name of equipment | Location | Contact person | Link to more information |
---|---|---|---|---|
Surface and particle analysis | PSA Malvern 2000 | KII-107 | Elin Albertsen | |
Surface and particle analysis | TRISTAR 3000 surface area and porosity analyzer | KII-107 | Elin Albertsen | BET |
Surface and particle analysis | Permeabilitet | KII-303 | Anne Støre (SINTEF) |
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Zetapotential and particle size analyzer | Beckman Coulter DelsaNano C | KII-223 | Magnus B. Følstad | Description, terms of use & user manual |
Surface analyzer | Drop Shape Analyzer - DSA100 | KII-321 | Anita Storsve | Description |
Type of equipment | Name of equipment | Location | Contact person | Link to more information |
---|---|---|---|---|
XRD | D8 Advance Bruker | KII-113 | Contact person | The "D8 Advance" |
XRD | Da Vinci 1 Bruker | KII-113 | Contact person | The "DaVinci 1" |
XRD | Da Vinci 2 Bruker | KII-113 | Contact person | The "DaVinci 2" |
XRD | A-unit X-ray diffractometer Siemens | KII-113 | Contact person | The "A-unit" |
XRD | D8 Focus Bruker | KII-113 | Contact person | The "D8 Focus" |
Texture Analysis | X-ray diffractometer | A-347 | Torild Krogstad | XRD |
Type of equipment | Name of equipment | Location | Contact person | Link to more information |
---|---|---|---|---|
Si - Characterisation | Nicolet 6700 FT-IR | M-104 | Chiara Modanese | |
Si - Characterisation | µLPCD resistivty life time measurment | M-104 | Gaute Stokkan (SINTEF) | |
Si - Characterisation | SiWaScan | M-104 | Gaute Stokkan (SINTEF) | |
Si - Characterisation | micro cracks characterisation | M-104 | Kai Erik Ekstrøm | |
Si - Characterisation Crystal deffect mesurment | PVSCAN 6000 | M-104 | Gaute Stokkan (SINTEF) | |
Si - Characterisation Density Imaging | CDI-Carrier | M-104 | Gaute Stokkan (SINTEF) |
Type of equipment | Name of equipment | Location | Contact person | Link to more information |
---|---|---|---|---|
Resistivity measurement (metals) | Sigmascope | E-508 | Trygve L. Schanche |