Optical Microscope
| Type of equipment | Name of equipment | Location | Contact person | Link to more information |
|---|---|---|---|---|
| Optical microscope | Wild Heerbrugg | A-443 | Trygve L. Schanche | |
| Optical microscope | Leica MEF4M | E-514 | Trygve L. Schanche | |
| Optical microscope | Reichert-Jung Univar | E-514 | Trygve L. Schanche | |
| Optical microscope | Makroskop Leitz M400 | E-508 | Trygve L. Schanche | |
| Optical microscope | Leitz MM6 | E-508 | Trygve L. Schanche | |
| Optical microscope | Zeiss Axiovert 25 | E-508 | Trygve L. Schanche | Zeiss Axiovert 25 |
| Optical microscope | Leitz metalloplan | E-508 | Trygve L. Schanche | |
| Optical microscope | Leitz 1A | E-508 | Trygve L. Schanche | |
| Optical microscope | Reichert MEF1 | E-508 | Trygve L. Schanche | |
| Optical microscope | Leitz Metallux 3 | E-514A | Trygve L. Schanche | Leitz Metallux 3 |
| Videokamera (2 stk) | JVC TK-S310 EG | KII-014 | Trygve L. Schanche | |
| Videokamera til mikroskop | Leica R3 elecrt. | E-514A | Trygve L. Schanche | |
| Optical microscope | Leitz Axioskop | E-514A | Trygve L. Schanche | Leitz Axioskop |
| Optical Microscope | Nikon SM2800 | KII-323 | Eli Beate Larsen | |
| Optical Microscope | Leica DM IRM | KII-323 | Eli Beate Larsen | |
| Optical microscope | Zeiss | KII-003A | Magnus Følstad | |
| Optical microscope | Leica DMIL | KII-022 | Trygve L. Schanche | |
| Optical microscope | Olympus BH-2 | KII-032A | Stein Rørvik (SINTEF) | |
| Optical microscope | Reichert MeF3A med Sony kamera | KII-032A | Stein Rørvik (SINTEF) | |
| Optical microscope | Olympus BX60 | KII-032A | Stein Rørvik (SINTEF) | |
| Optical microscope | Leica EZ4 | KII-034B | Kristin Høydalsvik | |
| Optical microscope | Wild Heerbrugg | KII-011 |
Electron microscope
| Type of equipment | Name of equipment | Location | Contact person | Link to more information |
|---|---|---|---|---|
| Scanning Electron Microscopy | FE-SEM with Bruker EDS/NORDIF EBSD system Hitachi SU6600 | F-362 | Yingda Yu | |
| Scanning Electron Microscopy | FE-SEM with Bruker EDS/NORDIF EBSD system Zeiss Ultra 55 | F-362 | Yingda Yu | |
| Scanning Electron Microscopy | SEM with Nordif EBSD system JEOL JSM 840A | F-362 | Yingda Yu | |
| Scanning Electron Microscopy | SEM with Gatan CL system JEOL JSM 840 | F-369 | Yingda Yu | |
| Scanning Electron Microscopy | SEM with JEOL EDS system JEOL JSM 6010LA | F-369 | Yingda Yu | |
| Scanning Electron Microscopy | FE-SEM wirh EDAX EDS system Zeiss Supra 55VP | F-369 | Yingda Yu |
Scanning probe microscope
| Type of equipment | Name of equipment | Location | Contact person | Link to more information |
|---|---|---|---|---|
| Electron Micro Probe Analyzer | FE-EPMA wirh JEOL WDS system JEOL JXA 8500 | F-373 | Morten Raanes | |
| Scanning probe microscope | AFM/STM Agilent 5500 | KII-003A | Magnus Følstad |
Thermal analysis
| Type of equipment | Name of equipment | Location | Contact person | Link to more information |
|---|---|---|---|---|
| Thermal analysis | DTA/TGA Setaram Sensis | A-K032 | Sarina Bao (SINTEF) | |
| Thermal analysis | Electrical conductivity furnace | KII-103 | Belma Talic | |
| Thermal analysis | NETZSCH dilatometer 402C, themal analysis | KII-103 | Eli Beate Larsen | |
| Thermal analysis | NETZSCH STA449 jupiter, thermal analysis 1 | KII-103 | Eli Beate Larsen | |
| Thermal analysis | NETZSCH STA449 jupiter, thermal analysis 2 | KII-103 | Eli Beate Larsen | |
| Thermal analysis | NETZSCH dilatometer 402E | KII-103 | Ove Darell (SINTEF) | |
| Thermal analysis | Perkin Elmer Diffential scanning calorimeter | KII-103 | Sverre Magnus Selbach | |
| Thermal analysis | Optisk dilatometer-Expert system | KII-119 | Anne Støre (SINTEF) | |
| Thermal analysis | LFA Microflash, termisk diffusivitet | KII-119 | Anne Støre (SINTEF) | |
| Thermal analysis | Dilatometer | KII-303 | Anne Støre (SINTEF) |
Spectroscopy
Surface and particle analysis
| Type of equipment | Name of equipment | Location | Contact person | Link to more information |
|---|---|---|---|---|
| Surface and particle analysis | PSA Malvern 2000 | KII-107 | Elin Albertsen | |
| Surface and particle analysis | TRISTAR 3000 surface area and porosity analyzer | KII-107 | Elin Albertsen | BET |
| Surface and particle analysis | Permeabilitet | KII-303 | Anne Støre (SINTEF) |
XRD
| Type of equipment | Name of equipment | Location | Contact person | Link to more information |
|---|---|---|---|---|
XRD | D8 advance Bruker | KII-113 | Julian Tolchard | |
| XRD | Da Vinci 1 Bruker | KII-113 | Julian Tolchard | |
| XRD | Da Vinci 2 Bruker | KII-113 | Julian Tolchard | |
| XRD | A-unit X-ray diffractometer | KII-113 | Julian Tolchard | |
| XRD | D8 focus Siemens | KII-113 | Julian Tolchard |
Solar cell silicon characterisation