Optical Microscope
| Type of equipment | Name of equipment | Location | Contact person | Link to more information |
|---|---|---|---|---|
| Optical microscope | Wild Heerbrugg | A-443 | Trygve L. Schanche | |
| Optical microscope | Leica MEF4M | E-514 | Trygve L. Schanche | |
| Optical microscope | Reichert-Jung Univar | E-514 | Trygve L. Schanche | |
| Optical microscope | Makroskop Leitz M400 | E-508 | Trygve L. Schanche | |
| Optical microscope | Leitz MM6 | E-508 | Trygve L. Schanche | |
| Optical microscope | Zeiss Axiovert 25 | E-508 | Trygve L. Schanche | Zeiss Axiovert 25 |
| Optical microscope | Leitz metalloplan | E-508 | Trygve L. Schanche | |
| Optical microscope | Leitz 1A | E-508 | Trygve L. Schanche | |
| Optical microscope | Reichert MEF1 | E-508 | Trygve L. Schanche | |
| Optical microscope | Leitz Metallux 3 | E-514A | Trygve L. Schanche | Leitz Metallux 3 |
| Videokamera (2 stk) | JVC TK-S310 EG | KII-014 | Trygve L. Schanche | |
| Videokamera til mikroskop | Leica R3 elecrt. | E-514A | Trygve L. Schanche | |
| Optical microscope | Leitz Axioskop | E-514A | Trygve L. Schanche | Leitz Axioskop |
| Optical Microscope | Nikon SM2800 | KII-323 | Eli Beate Larsen | |
| Optical Microscope | Leica DM IRM | KII-323 | Eli Beate Larsen | |
| Optical microscope | Zeiss | KII-003A | Magnus B. Følstad | |
| Optical microscope | Leica DMIL | KII-022 | Trygve L. Schanche | |
| Optical microscope | Olympus BH-2 | KII-032A | Stein Rørvik (SINTEF) | |
| Optical microscope | Reichert MeF3A med Sony kamera | KII-032A | Stein Rørvik (SINTEF) | |
| Optical microscope | Olympus BX60 | KII-032A | Stein Rørvik (SINTEF) | |
| Optical microscope | Leica EZ4 | KII-034B | Sergey Khromov | |
| Optical microscope | Wild Heerbrugg | KII-011 |
...
| Type of equipment | Name of equipment | Location | Contact person | Link to more information |
|---|---|---|---|---|
| Surface and particle analysis | PSA Malvern 2000 | KII-107 | Elin Albertsen | |
| Surface and particle analysis | TRISTAR 3000 surface area and porosity analyzer | KII-107 | Elin Albertsen | BET |
| Surface and particle analysis | Permeabilitet | KII-303 | Anne Støre (SINTEF) |
|
| Zetapotential and particle size analyzer | Beckman Coulter DelsaNano C | KII-223 | Magnus B. Følstad | Description, terms of use & user manual |
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XRD
| Info | ||
|---|---|---|
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| Type of equipment | Name of equipment | Location | Contact person | Link to more information |
|---|---|---|---|---|
XRD | D8 Advance Bruker | KII-113 | Kristin Høydalsvik | The "D8 Advance" |
| XRD | Da Vinci 1 Bruker | KII-113 | Kristin Høydalsvik | The "DaVinci 1" |
| XRD | Da Vinci 2 Bruker | KII-113 | Kristin Høydalsvik | The "DaVinci 2" |
| XRD | A-unit X-ray diffractometer Siemens | KII-113 | Kristin Høydalsvik | The "A-unit" |
| XRD | D8 Focus Bruker | KII-113 | Kristin Høydalsvik | The "D8 Focus" |
| Texture Analysis | X-ray diffractometer | A-347 | Torild Krogstad | XRD |
...