Versions Compared

Old Version 71

changes.mady.by.user Unknown User (folstad)

Saved on

compared with

New Version 72

changes.mady.by.user Unknown User (folstad)

Saved on

Key

  • This line was added.
  • This line was removed.
  • Formatting was changed.

...

Type of equipmentName of equipmentLocationContact personLink to more information
Optical microscopeWild HeerbruggA-443Trygve L. Schanche 
Optical microscopeLeica MEF4ME-514Trygve L. Schanche   
Optical microscopeReichert-Jung UnivarE-514Trygve L. Schanche   
Optical microscopeMakroskop Leitz M400E-508Trygve L. Schanche   
Optical microscopeLeitz MM6E-508Trygve L. Schanche   
Optical microscopeZeiss Axiovert 25E-508Trygve L. Schanche  Zeiss Axiovert 25
Optical microscopeLeitz metalloplanE-508Trygve L. Schanche   
Optical microscopeLeitz 1AE-508Trygve L. Schanche   
Optical microscopeReichert MEF1E-508Trygve L. Schanche   
Optical microscopeLeitz Metallux 3E-514ATrygve L. Schanche  Leitz Metallux 3
Videokamera (2 stk)JVC TK-S310 EGKII-014Trygve L. Schanche   
Videokamera til mikroskopLeica R3 elecrt.E-514ATrygve L. Schanche   
Optical microscopeLeitz AxioskopE-514ATrygve L. Schanche  Leitz Axioskop
Optical MicroscopeNikon SM2800KII-323Eli Beate Larsen 
Optical MicroscopeLeica DM IRMKII-323Eli Beate Larsen 
Optical microscopeZeissKII-003A Magnus B. Følstad 
Optical microscopeLeica DMILKII-022Trygve L. Schanche   
Optical microscopeOlympus BH-2KII-032AStein Rørvik (SINTEF) 
Optical microscopeReichert MeF3A med Sony kameraKII-032AStein Rørvik (SINTEF) 
Optical microscopeOlympus BX60KII-032AStein Rørvik (SINTEF) 
Optical microscopeLeica EZ4KII-034BSergey Khromov 
Optical microscopeWild HeerbruggKII-011  

...

Type of equipmentName of equipmentLocationContact personLink to more information
Electron Micro Probe Analyzer

FE-EPMA wirh JEOL WDS system

JEOL JXA 8500

F-373Morten Raanes
Link in New Window
linkTextJEOL JXA-8500F Electron Probe Micro analyzer (EPMA)
hrefhttp://www.material.ntnu.no/lab/material/equipment/ProdInfoEPMA.pdf
Scanning probe microscopeAgilent 5500 AFM/SPM microscopeKII-003AMagnus B. FølstadAbout the instrument

Anchor
TEM
TEM

...

Type of equipmentName of equipmentLocationContact personLink to more information
SpectroscopyGD-OESKII-307Mariia Stepanova 
Spectroscopy Element AnalysisGD-MSE-208Chiara Modanese 
Mass spectrometer + potensiostatDifferential Electrochemical Mass Spectrometry (DEMS) stationMassespectrometerPfeiffer Vacum Prisma Plus HiCubeKII-014Magnus B. Følstad 
UV-vis/NIR spektrofotometer spectrophotometer + potensiostatPhotoelectrochemical stationKII-001Magnus B. Følstad 
FTIR spectrometerBruker Vertex 80vKII-014Magnus B. Følstad 

Anchor
Surface and particle analysis
Surface and particle analysis

...