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Electron microscope
Type of equipment | Name of equipment | Location | Contact person | Link to more information | ||||||
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Scanning Electron Microscopy | FE-SEM with Bruker EDS/NORDIF EBSD system Hitachi SU6600 | F-362 | Yingda Yu |
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Scanning Electron Microscopy | FE-SEM with Bruker EDS/NORDIF EBSD system Zeiss Ultra 55 | F-362 | Yingda Yu |
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Scanning Electron Microscopy | SEM with Nordif EBSD system JEOL JSM 840A | F-362 | Yingda Yu |
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Scanning Electron Microscopy | SEM with Gatan CL system JEOL JSM 840 | F-369 | Yingda Yu | |||||||
Scanning Electron Microscopy | SEM with JEOL EDS system JEOL JSM 6010LA | F-369 | Yingda Yu |
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Scanning Electron Microscopy | FE-SEM wirh EDAX EDS system Zeiss Supra 55VP | F-369 | Yingda Yu |
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Scanning electron microscopy | Hitachi S-3400N | KII-036 | Kristin Høydalsvik |
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Type of equipment | Name of equipment | Location | Contact person | Link to more information |
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TEM with Gatan GIF system | JEOL TEM 2010 | F-368 | Yingda Yu | More information on SEM - TEM |
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