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| Type of equipment | Name of equipment | Location | Contact person | Link to more information | ||
|---|---|---|---|---|---|---|
| Thermal analysis | Perkin Elmer Diffential scanning calorimeter | KII-103 | DTA/TGA Setaram Sensis | A-K032 | Sarina Bao (SINTEF)Sverre Magnus Selback | |
| Thermal analysis | High temperature oxygen flux Electrical conductivity furnace | KII-103 | Belma Talic | |||
| Thermal analysis | NETZSCH dilatometer 402E402C, themal analysis | KII-103 | Ove DarellEli Beate Larsen | |||
| Thermal analysis | NETZSCH dilatometer 402CSTA449 jupiter, thermal analysis 1 | KII-103 | Eli Beate Larsen | |||
| Thermal analysis | NETZSCH STA449 jupiter, thermal analysis 2 | KII-103 | Eli Beate Larsen | |||
| Thermal analysis | NETZSCH dilatometer 402E | KII-103 | Ove Darell (SINTEF) | |||
| Thermal analysisElectrical conductivity furnace | Perkin Elmer Diffential scanning calorimeter | KII-103 | Belma TalicSverre Magnus Selbach | |||
| Thermal analysis | Optisk dilatometer-Expert system | KII-119 | Anne Støre (SINTEF) | |||
| Thermal analysis | LFA Microflash, termisk diffusivitet | KII-119 | Anne Støre (SINTEF) | |||
| Thermal analysis | Dilatometer | KII-303 | Anne Støre (SINTEF) |
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| Type of equipment | Name of equipment | Location | Contact person | Link to more information | Surface and particle analysis | XRD Texture Analysis | A-347|
|---|---|---|---|---|---|---|---|
| Torild Krogstad | Surface and particle analysis | PSA Malvern 2000 | KII-107 | Jannicke KvelloElin Albertsen | |||
| Surface and particle analysis | TRISTAR 3000 surface area and porosity analyzer | KII-107 | Elin Albertsen | BET | |||
| Surface and particle analysis | Zetapotensial- og partikkelstørrelse-måler Beckman Coulter DelsaNano CPermeabilitet | KII-223303 | Anne Støre (SINTEF) | Magnus Følstad |
| Anchor | ||||
|---|---|---|---|---|
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XRD
| Type of equipment | Name of equipment | Location | Contact person | Link to more information |
|---|---|---|---|---|
XRD | D8 advance Bruker | KII-113 | Julian Tolchard | |
| XRD | Da Vinci 1 Bruker | KII-113 | Julian Tolchard | |
| XRD | Da Vinci 2 Bruker | KII-113 | Julian Tolchard | |
| XRD | A-unit X-ray diffractometer | KII-113 | Julian Tolchard | |
| XRD | D8 focus Siemens | KII-113 | Julian Tolchard |
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