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Type of equipmentName of equipmentLocationContact personLink to more information
Optical microscopeWild HeerbruggA-443Trygve L. SchancheWild Heerbrugg 
Optical microscopeLeica MEF4ME-514Trygve L. Schanche  Leica MEF4M 
Optical microscopeReichert-Jung UnivarE-514Trygve L. Schanche  Reitchert-Jung Univar 
Optical microscopeMakroskop Leitz M400E-508Trygve L. Schanche  Makroskop Leitz M400 
Optical microscopeLeitz MM6E-508Trygve L. Schanche  Leitz MM6 
Optical microscopeZeiss Axiovert 25E-508Trygve L. Schanche  Zeiss Axiovert 25
Optical microscopeLeitz metalloplanE-508Trygve L. Schanche  Leitz metalloplan 
Optical microscopeLeitz 1AE-508Trygve L. Schanche  Leitz 1A 
Optical microscopeReichert MEF1E-508Trygve L. Schanche  Reitchert MEF1 
Optical microscopeLeitz Metallux 3E-514ATrygve L. Schanche  Leitz Metallux 3
Videokamera (2 stk)JVC TK-S310 EGE-514ATrygve L. Schanche  Video camera 
Videokamera til mikroskopLeica R3 elecrt.E-514ATrygve L. Schanche  Video camera for microscope 
Optical microscopeLeitz AxioskopE-514ATrygve L. Schanche  Leitz Axioskop
Optical MicroscopeNikon SM2800KII-323 Nikon SM2800 
Optical MicroscopeLeica DM IRMKII-323  
Optical microscopeZeiss   
Optical microscopeWild Heerbrugg  

 

 

Optical microscopeLeica DMIL Trygve L SchancheLeica DMIL 
Optical microscopeOlympus BH-2KII-032AStein Rørvik 
Optical microscopeReichert MeF3A med Sony kamera Stein Rørvik 
Optical microscopeOlympus BX60 Stein Rørvik 
Optical microscopeLeica EZ4   

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Type of equipmentName of equipmentLocationContact personLink to more information
Electron Micro Probe Analyzer

FE-EPMA wirh JEOL WDS system

JEOL JXA 8500

F-373Morten Raanes
Link in New Window
linkTextJEOL JXA-8500F Electron Probe Micro analyzer (EPMA)
hrefhttp://www.material.ntnu.no/lab/material/equipment/ProdInfoEPMA.pdf
Scanning probe microscope

AFM/STM

Agilent 5500

KII-003AMagnus FølstadSPM Agilent 5500 

 


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Thermal analysis
Thermal analysis

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Type of equipmentName of equipmentLocationContact personLink to more information
Thermal analysisPerkin Elmer Diffential scanning calorimeterKII-103Sverre Magnus SelbackPerkin Elmer Diffential scanning calorimeter 
Thermal analysisHigh temperature oxygen flux furnaceKII-103Belma TalicHigh temperature oxygen flux furnace 
Thermal analysisNETZSCH dilatometer 402EKII-103Ove DarellNETZSCH Dilatometer 402E 
Thermal analysisNETZSCH dilatometer 402CKII-103Eli Beate LarsenNETZSCH Dilatometer 402C 
Thermal analysisNETZSCH STA449 jupiterKII-103Eli Beate LarsenNETZSCH STA449 Jupiter 
Thermal analysisElectrical conductivity furnaceKII-103Belma TalicElectrical conductivity furnace 
Thermal analysisOptisk dilatometer-Expert systemKII-119Anne StøreOptisk dilatometer-Expert system 
Thermal analysisLFA Microflash, termisk diffusivitetKII-119Anne StøreLFA Microflash, thermal diffusivity 

 

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Spectroscopy
Spectroscopy

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Type of equipmentName of equipmentLocationContact personLink to more information
Surface and particle analysisXRD Texture AnalysisA-347Torild KrogstadXRD Texture analysis 
Surface and particle analysisPSA Malvern 2000KII-107Jannicke KvelloPSA Malvern 2000 
Surface and particle analysisTRISTAR 3000 surface area and porosity analyzer KII-107Elin AlbertsenBET
Surface and particle analysis

Zetapotensial- og partikkelstørrelse-måler

Beckman Coulter DelsaNano C

KII-223Magnus FølstadBeckman Coulter DelsaNano C 

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XRD
XRD

XRD

Type of equipmentName of equipmentLocationContact personLink to more information

XRD

D8 advance BrukerKII-113Julian TolchardD8 Advance Bruker 
XRDDa Vinci 1 BrukerKII-113Julian TolchardDa Vinci 1 Bruker 
XRDDa Vinci 2 BrukerKII-113Julian TolchardDa Vinci 2 Bruker 
XRDA-unit X-ray diffractometerKII-113Julian TolchardA-unit X-ray diffractometer 
XRDD8 focus SiemensKII-113Julian TolchardD8 focus Siemens 

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Solar cell silicon characterisation
Solar cell silicon characterisation

Solar cell silicon characterisation

 

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FE-SEM with Bruker EDS/NORDIF EBSD system

Hitachi SU6600

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Link in New Window
linkTextHitachi SU6600 FEG SEM
hrefhttp://www.material.ntnu.no/lab/material/equipment/HitachiFEG.jpg

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FE-SEM with Bruker EDS/NORDIF EBSD system

Zeiss Ultra 55

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Link in New Window
linkTextFe-sem (Zeiss Ultra 55 LE)
hrefhttp://www.material.ntnu.no/lab/material/equipment/ULTRA_Technical.pdf

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SEM with Nordif EBSD system

JEOL JSM 840A

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Link in New Window
linkTextSEM A (JSM 840)
hrefhttp://www.material.ntnu.no/lab/material/equipment/ProdInfoSEM_A.pdf

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TEM with Gatan GIF system

JEOL TEM 2010

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Link in New Window
linkTextTEM (JEOL, JEM-2010)
hrefhttps://www.ntnu.no/wiki/download/attachments/67474571/TEMinfo.pdf?version=1&modificationDate=1409311611000&api=v2

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SEM with Gatan CL system

JEOL JSM 840

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SEM with JEOL EDS system

JEOL JSM 6010LA

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Link in New Window
linkTextEDS, EDAX Gernesis
hrefhttp://edax.com/

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FE-SEM wirh EDAX EDS system

Zeiss Supra 55VP

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Link in New Window
linkTextLV-Fe-SEM (ZeissSupra 55 VP)
hrefhttp://www.material.ntnu.no/lab/material/equipment/ProdInfoFE-SEM.pdf

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FE-EPMA wirh JEOL WDS system

JEOL JXA 8500

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Link in New Window
linkTextJEOL JXA-8500F Electron Probe Micro analyzer (EPMA)
hrefhttp://www.material.ntnu.no/lab/material/equipment/ProdInfoEPMA.pdf

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AFM/STM

Agilent 5500

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SPM Agilent 5500

 

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Photoelectrochemical station

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XRD

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Zetapotensial- og partikkelstørrelse-måler

Beckman Coulter DelsaNano C

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Glow Discharge Optical Emission Spectroscopy

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Bruker IFS66V

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