...
| Type of equipment | Name of equipment | Location | Contact person | Link to more information | ||||||
|---|---|---|---|---|---|---|---|---|---|---|
| Element Analysis | GD-MS | E-208 | Chiara Modanese | GD-MS | ||||||
| Surface and particle analysis | XRD Texture Analysis | A-347 | Torild Krogstad | XRD Texture analysis | ||||||
| Optical microscope | Wild Heerbrugg | A-443 | Trygve L. Schanche | Wild Heerbrugg | ||||||
| Optical microscope | Leica MEF4M | E-514 | Trygve L. Schanche | Leica MEF4M | ||||||
| Optical microscope | Reichert-Jung Univar | E-514 | Trygve L. Schanche | Reitchert-Jung Univar | ||||||
| Optical microscope | Makroskop Leitz M400 | E-508 | Trygve L. Schanche | Makroskop Leitz M400 | ||||||
| Optical microscope | Leitz MM6 | E-508 | Trygve L. Schanche | Leitz MM6 | ||||||
| Optical microscope | Zeiss Axiovert 25 | E-508 | Trygve L. Schanche | Zeiss Axiovert 25 | ||||||
| Optical microscope | Leitz metalloplan | E-508 | Trygve L. Schanche | Leitz metalloplan | ||||||
| Optical microscope | Leitz 1A | E-508 | Trygve L. Schanche | Leitz 1A | ||||||
| Optical microscope | Reichert MEF1 | E-508 | Trygve L. Schanche | Reitchert MEF1 | ||||||
| Optical microscope | Leitz Metallux 3 | E-514A | Trygve L. Schanche | Leitz Metallux 3 | ||||||
| Videokamera (2 stk) | JVC TK-S310 EG | E-514A | Trygve L. Schanche | Video camera | ||||||
| Videokamera til mikroskop | Leica R3 elecrt. | E-514A | Trygve L. Schanche | Video camera for microscope | ||||||
| Optical microscope | Leitz Axioskop | E-514A | Trygve L. Schanche | Leitz Axioskop | ||||||
| Scanning Electron Microscopy | FE-SEM with Bruker EDS/NORDIF EBSD system Hitachi SU6600 | F-362 | Yingda Yu |
| ||||||
| Scanning Electron Microscopy | FE-SEM with Bruker EDS/NORDIF EBSD system Zeiss Ultra 55 | F-362 | Yingda Yu |
| ||||||
| Scanning Electron Microscopy | SEM with Nordif EBSD system JEOL JSM 840A | F-362 | Yingda Yu |
| ||||||
| Transmission Electron Microscopy | TEM with Gatan GIF system JEOL TEM 2010 | F-368 | Yingda Yu |
| ||||||
| Scanning Electron Microscopy | SEM with Gatan CL system JEOL JSM 840 | F-369 | Yingda Yu | |||||||
| Scanning Electron Microscopy | SEM with JEOL EDS system JEOL JSM 6010LA | F-369 | Yingda Yu |
| ||||||
| Scanning Electron Microscopy | FE-SEM wirh EDAX EDS system Zeiss Supra 55VP | F-369 | Yingda Yu |
| ||||||
| Electron Micro Probe Analyzer | FE-EPMA wirh JEOL WDS system JEOL JXA 8500 | F-373 | Morten Raanes |
| ||||||
| Scanning probe microscope | AFM/STM Agilent 5500 | KII-003A | Magnus Følstad |
| ||||||
| UV-vis/NIR spektrofotometer + potensiostat | Photoelectrochemical station | KII-014 | Magnus Følstad | |||||||
| Thermal analysis | Perkin Elmer Diffential scanning calorimeter | KII-103 | Sverre Magnus Selback | Perkin Elmer Diffential scanning calorimeter | ||||||
| Thermal analysis | High temperature oxygen flux furnace | KII-103 | Belma Talic | High temperature oxygen flux furnace | ||||||
| Thermal analysis | NETZSCH dilatometer 402E | KII-103 | Ove Darell | NETZSCH Dilatometer 402E | ||||||
| Thermal analysis | NETZSCH dilatometer 402C | KII-103 | Eli Beate Larsen | NETZSCH Dilatometer 402C | ||||||
| Thermal analysis | NETZSCH STA449 jupiter | KII-103 | Eli Beate Larsen | NETZSCH STA449 Jupiter | ||||||
| Thermal analysis | Electrical conductivity furnace | KII-103 | Belma Talic | Electrical conductivity furnace | ||||||
| Surface and particle analysis | PSA Malvern 2000 | KII-107 | Jannicke Kvello | PSA Malvern 2000 | ||||||
| Surface and particle analysis | TRISTAR 3000 surface area and porosity analyzer | KII-107 | Elin Albertsen | BET | ||||||
| LECO | Oxygen and nitrogen analysis | KII-107 | Anne Støre | LECO | ||||||
| Pycnometer | Accupyc 1330 | KII-107 | Julian Tolchard | Accupyc 1330 | ||||||
XRD | D8 advance Bruker | KII-113 | Julian Tolchard | D8 Advance Bruker | ||||||
| XRD | Da Vinci 1 Bruker | KII-113 | Julian Tolchard | Da Vinci 1 Bruker | ||||||
| XRD | Da Vinci 2 Bruker | KII-113 | Julian Tolchard | Da Vinci 2 Bruker | ||||||
| XRD | A-unit X-ray diffractometer | KII-113 | Julian Tolchard | A-unit X-ray diffractometer | ||||||
| XRD | D8 focus Siemens | KII-113 | Julian Tolchard | D8 focus Siemens | ||||||
| Thermal analysis | Optisk dilatometer-Expert system | KII-119 | Anne Støre | Optisk dilatometer-Expert system | ||||||
| Thermal analysis | LFA Microflash, termisk diffusivitet | KII-119 | Anne Støre | LFA Microflash, thermal diffusivity | ||||||
| Surface and particle analysis | Zetapotensial- og partikkelstørrelse-måler Beckman Coulter DelsaNano C | KII-223 | Magnus Følstad | Beckman Coulter DelsaNano C | ||||||
Glow Discharge Optical Emission Spectroscopy | GD-OES GD-profiler | KII-307 | Maria Stepanova | GD-OES | ||||||
| Optical Microscope | Nikon SM2800 | KII-323 | Nikon SM2800 | |||||||
| Optical Microscope | Leica DM IRM | KII-323 | ||||||||
| Optical microscope | Zeiss | |||||||||
| Optical microscope | Wild Heerbrugg |
| ||||||||
| IR Spectroscropy | Bruker IFS66V | KII-014 | ||||||||
| UV-vis/NIR spektrofotometer + potensiostat | Photoelectrochemical station | Magnus Følstad | ||||||||
| Massespektrometer | Pfeiffer Vacum Prisma Plus HiCube | Morten Tjelta | ||||||||
| Viskositetsmåling | Haake Mars Modular Advanced Rheometer System | |||||||||
| Viskositetsmåling | Haake Viskotester 550 Thermo Scientific | |||||||||
| Optical microscope | Leica DMIL | Trygve L Schanche | Leica DMIL | |||||||
| Optical microscope | Olympus BH-2 | KII-032A | Stein Rørvik | |||||||
| Optical microscope | Reichert MeF3A med Sony kamera | Stein Rørvik | ||||||||
| Optical microscope | Olympus BX60 | Stein Rørvik | ||||||||
| Peizoelektriske målinger | Aix PES Piezoelectric evaluation | |||||||||
| Optical microscope | Leica EZ4 | Scanning electron microscope | Hitachi S-3400N | KII-036 |
...
| Optical Microscope | Nikon SM2800 | KII-323 | Nikon SM2800 | |
| Optical Microscope | Leica DM IRM | KII-323 | ||
| Optical microscope | Zeiss | |||
| Optical microscope | Wild Heerbrugg |
| ||
| Optical microscope | Leica DMIL | Trygve L Schanche | Leica DMIL | |
| Optical microscope | Olympus BH-2 | KII-032A | Stein Rørvik | |
| Optical microscope | Reichert MeF3A med Sony kamera | Stein Rørvik | ||
| Optical microscope | Olympus BX60 | Stein Rørvik | ||
| Optical microscope | Leica EZ4 |
| Anchor | ||||
|---|---|---|---|---|
|
Electron microscope
| Type of equipment | Name of equipment | Location | Contact person | Link to more information |
|---|---|---|---|---|
| Scanning Electron Microscopy | FE-SEM with Bruker EDS/NORDIF EBSD system Hitachi SU6600 | F-362 |
...
Electron microscope
...
FE-SEM with Bruker EDS/NORDIF EBSD system
Hitachi SU6600
...
| Link in New Window | ||||
|---|---|---|---|---|
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FE-SEM with Bruker EDS/NORDIF EBSD system
Zeiss Ultra 55
...
| Link in New Window | ||||
|---|---|---|---|---|
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SEM with Nordif EBSD system
JEOL JSM 840A
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| Link in New Window | ||||
|---|---|---|---|---|
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TEM with Gatan GIF system
JEOL TEM 2010
...
| Link in New Window | ||||
|---|---|---|---|---|
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SEM with Gatan CL system
JEOL JSM 840
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SEM with JEOL EDS system
JEOL JSM 6010LA
...
| Link in New Window | ||||
|---|---|---|---|---|
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FE-SEM wirh EDAX EDS system
Zeiss Supra 55VP
...
| Link in New Window | ||||
|---|---|---|---|---|
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FE-EPMA wirh JEOL WDS system
JEOL JXA 8500
...
| Link in New Window | ||||
|---|---|---|---|---|
|
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AFM/STM
Agilent 5500
...
...
...
XRD
...
Zetapotensial- og partikkelstørrelse-måler
Beckman Coulter DelsaNano C
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Glow Discharge Optical Emission Spectroscopy
...
...
Bruker IFS66V
...
Lv-sem Sem Sælandsvei (Hitachi S-3400N)
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Scanning probe microscope
...
FE-SEM with Bruker EDS/NORDIF EBSD system
Hitachi SU6600
...
| Link in New Window | ||||
|---|---|---|---|---|
|
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FE-SEM with Bruker EDS/NORDIF EBSD system
Zeiss Ultra 55
...
| Link in New Window | ||||
|---|---|---|---|---|
|
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SEM with Nordif EBSD system
JEOL JSM 840A
...
| Link in New Window | ||||
|---|---|---|---|---|
|
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TEM with Gatan GIF system
JEOL TEM 2010
...
| Link in New Window | ||||
|---|---|---|---|---|
|
...
SEM with Gatan CL system
JEOL JSM 840
...
SEM with JEOL EDS system
JEOL JSM 6010LA
...
| Link in New Window | ||||
|---|---|---|---|---|
|
...
FE-SEM wirh EDAX EDS system
Zeiss Supra 55VP
...
| Link in New Window | ||||
|---|---|---|---|---|
|
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FE-EPMA wirh JEOL WDS system
JEOL JXA 8500
...
| Link in New Window | ||||
|---|---|---|---|---|
|
...
AFM/STM
Agilent 5500
...
...
...
XRD
...
Zetapotensial- og partikkelstørrelse-måler
Beckman Coulter DelsaNano C
...
Glow Discharge Optical Emission Spectroscopy
...
...
Bruker IFS66V
...
Lv-sem Sem Sælandsvei (Hitachi S-3400N)
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Thermal analysis
...
FE-SEM with Bruker EDS/NORDIF EBSD system
Hitachi SU6600
...
| Link in New Window | ||||
|---|---|---|---|---|
|
...
FE-SEM with Bruker EDS/NORDIF EBSD system
Zeiss Ultra 55
...
| Link in New Window | ||||
|---|---|---|---|---|
|
...
SEM with Nordif EBSD system
JEOL JSM 840A
...
| Link in New Window | ||||
|---|---|---|---|---|
|
...
TEM with Gatan GIF system
JEOL TEM 2010
...
| Link in New Window | ||||
|---|---|---|---|---|
|
...
SEM with Gatan CL system
JEOL JSM 840
...
SEM with JEOL EDS system
JEOL JSM 6010LA
...
| Link in New Window | ||||
|---|---|---|---|---|
|
...
FE-SEM wirh EDAX EDS system
Zeiss Supra 55VP
...
| Link in New Window | ||||
|---|---|---|---|---|
|
...
FE-EPMA wirh JEOL WDS system
JEOL JXA 8500
...
| Link in New Window | ||||
|---|---|---|---|---|
|
...
AFM/STM
Agilent 5500
...
...
...
XRD
...
Zetapotensial- og partikkelstørrelse-måler
Beckman Coulter DelsaNano C
...
Glow Discharge Optical Emission Spectroscopy
...
...
Bruker IFS66V
...
Lv-sem Sem Sælandsvei (Hitachi S-3400N)
...
Spectroscopy
...
FE-SEM with Bruker EDS/NORDIF EBSD system
Hitachi SU6600
...
| Link in New Window | ||||
|---|---|---|---|---|
|
...
FE-SEM with Bruker EDS/NORDIF EBSD system
Zeiss Ultra 55
...
| Link in New Window | ||||
|---|---|---|---|---|
|
...
SEM with Nordif EBSD system
JEOL JSM 840A
...
| Link in New Window | ||||
|---|---|---|---|---|
|
...
TEM with Gatan GIF system
JEOL TEM 2010
...
| Link in New Window | ||||
|---|---|---|---|---|
|
...
SEM with Gatan CL system
JEOL JSM 840
...
SEM with JEOL EDS system
JEOL JSM 6010LA
...
| Link in New Window | ||||
|---|---|---|---|---|
|
...
FE-SEM wirh EDAX EDS system
Zeiss Supra 55VP
...
| Link in New Window | ||||
|---|---|---|---|---|
|
...
FE-EPMA wirh JEOL WDS system
JEOL JXA 8500
...
| Link in New Window | ||||
|---|---|---|---|---|
|
...
AFM/STM
Agilent 5500
...
...
...
XRD
...
Zetapotensial- og partikkelstørrelse-måler
Beckman Coulter DelsaNano C
...
Glow Discharge Optical Emission Spectroscopy
...
...
Bruker IFS66V
...
Lv-sem Sem Sælandsvei (Hitachi S-3400N)
...
Surface and particle analysis
| Type of equipment | Name of equipment | Location | Contact person | Link to more information | ||||||
|---|---|---|---|---|---|---|---|---|---|---|
| Element Analysis | GD-MS | E-208 | Chiara Modanese | GD-MS | ||||||
| Surface and particle analysis | XRD Texture Analysis | A-347 | Torild Krogstad | XRD Texture analysis | ||||||
| Optical microscope | Wild Heerbrugg | A-443 | Trygve L. Schanche | Wild Heerbrugg | ||||||
| Optical microscope | Leica MEF4M | E-514 | Trygve L. Schanche | Leica MEF4M | ||||||
| Optical microscope | Reichert-Jung Univar | E-514 | Trygve L. Schanche | Reitchert-Jung Univar | ||||||
| Optical microscope | Makroskop Leitz M400 | E-508 | Trygve L. Schanche | Makroskop Leitz M400 | ||||||
| Optical microscope | Leitz MM6 | E-508 | Trygve L. Schanche | Leitz MM6 | ||||||
| Optical microscope | Zeiss Axiovert 25 | E-508 | Trygve L. Schanche | Zeiss Axiovert 25 | ||||||
| Optical microscope | Leitz metalloplan | E-508 | Trygve L. Schanche | Leitz metalloplan | ||||||
| Optical microscope | Leitz 1A | E-508 | Trygve L. Schanche | Leitz 1A | ||||||
| Optical microscope | Reichert MEF1 | E-508 | Trygve L. Schanche | Reitchert MEF1 | ||||||
| Optical microscope | Leitz Metallux 3 | E-514A | Trygve L. Schanche | Leitz Metallux 3 | ||||||
| Videokamera (2 stk) | JVC TK-S310 EG | E-514A | Trygve L. Schanche | Video camera | ||||||
| Videokamera til mikroskop | Leica R3 elecrt. | E-514A | Trygve L. Schanche | Video camera for microscope | ||||||
| Optical microscope | Leitz Axioskop | E-514A | Trygve L. Schanche | Leitz Axioskop | ||||||
| Scanning Electron Microscopy | FE-SEM with Bruker EDS/NORDIF EBSD system Hitachi SU6600 | F-362 | Yingda Yu |
| ||||||
| Scanning Electron Microscopy | FE-SEM with Bruker EDS/NORDIF EBSD system Zeiss Ultra 55 | F-362 | Yingda Yu |
| ||||||
| Scanning Electron Microscopy | SEM with Nordif EBSD system JEOL JSM 840A | F-362 | Yingda Yu |
| ||||||
| Transmission Electron Microscopy | TEM with Gatan GIF system JEOL TEM 2010 | F-368 | Yingda Yu |
| ||||||
| Scanning Electron Microscopy | SEM with Gatan CL system JEOL JSM 840 | F-369 | Yingda Yu | |||||||
| Scanning Electron Microscopy | SEM with JEOL EDS system JEOL JSM 6010LA | F-369 | Yingda Yu |
| ||||||
| Scanning Electron Microscopy | FE-SEM wirh EDAX EDS with Bruker EDS/NORDIF EBSD system Zeiss Supra 55VPUltra 55 | F-369362 | Yingda Yu |
| ||||||
| Scanning Electron Micro Probe AnalyzerMicroscopy | SEM with Nordif EBSD FE-EPMA wirh JEOL WDS system JEOL JXA 8500JSM 840A | F-373362 | Morten RaanesYingda Yu |
| ||||||
| Scanning probe microscope | AFM/STM Agilent 5500 | KII-003A | Magnus Følstad |
| ||||||
| UV-vis/NIR spektrofotometer + potensiostat | Photoelectrochemical station | KII-014 | Magnus Følstad | |||||||
| Thermal analysis | Perkin Elmer Diffential scanning calorimeter | KII-103 | Sverre Magnus Selback | Perkin Elmer Diffential scanning calorimeter | ||||||
| Thermal analysis | High temperature oxygen flux furnace | KII-103 | Belma Talic | High temperature oxygen flux furnace | ||||||
| Thermal analysis | NETZSCH dilatometer 402E | KII-103 | Ove Darell | NETZSCH Dilatometer 402E | ||||||
| Thermal analysis | NETZSCH dilatometer 402C | KII-103 | Eli Beate Larsen | NETZSCH Dilatometer 402C | ||||||
| Thermal analysis | NETZSCH STA449 jupiter | KII-103 | Eli Beate Larsen | NETZSCH STA449 Jupiter | ||||||
| Thermal analysis | Electrical conductivity furnace | KII-103 | Belma Talic | Electrical conductivity furnace | ||||||
| Surface and particle analysis | PSA Malvern 2000 | KII-107 | Jannicke Kvello | PSA Malvern 2000 | ||||||
| Surface and particle analysis | TRISTAR 3000 surface area and porosity analyzer | KII-107 | Elin Albertsen | BET | ||||||
| LECO | Oxygen and nitrogen analysis | KII-107 | Anne Støre | LECO | ||||||
| Pycnometer | Accupyc 1330 | KII-107 | Julian Tolchard | Accupyc 1330 | ||||||
XRD | D8 advance Bruker | KII-113 | Julian Tolchard | D8 Advance Bruker | ||||||
| XRD | Da Vinci 1 Bruker | KII-113 | Julian Tolchard | Da Vinci 1 Bruker | ||||||
| XRD | Da Vinci 2 Bruker | KII-113 | Julian Tolchard | Da Vinci 2 Bruker | ||||||
| XRD | A-unit X-ray diffractometer | KII-113 | Julian Tolchard | A-unit X-ray diffractometer | ||||||
| XRD | D8 focus Siemens | KII-113 | Julian Tolchard | D8 focus Siemens | ||||||
| Thermal analysis | Optisk dilatometer-Expert system | KII-119 | Anne Støre | Optisk dilatometer-Expert system | ||||||
| Thermal analysis | LFA Microflash, termisk diffusivitet | KII-119 | Anne Støre | LFA Microflash, thermal diffusivity | ||||||
| Surface and particle analysis | Zetapotensial- og partikkelstørrelse-måler Beckman Coulter DelsaNano C | KII-223 | Magnus Følstad | Beckman Coulter DelsaNano C | ||||||
Glow Discharge Optical Emission Spectroscopy | GD-OES GD-profiler | KII-307 | Maria Stepanova | GD-OES | ||||||
| Optical Microscope | Nikon SM2800 | KII-323 | Nikon SM2800 | |||||||
| Optical Microscope | Leica DM IRM | KII-323 | ||||||||
| Optical microscope | Zeiss | |||||||||
| Optical microscope | Wild Heerbrugg |
| ||||||||
| IR Spectroscropy | Bruker IFS66V | KII-014 | ||||||||
| UV-vis/NIR spektrofotometer + potensiostat | Photoelectrochemical station | Magnus Følstad | ||||||||
| Massespektrometer | Pfeiffer Vacum Prisma Plus HiCube | Morten Tjelta | ||||||||
| Viskositetsmåling | Haake Mars Modular Advanced Rheometer System | |||||||||
| Viskositetsmåling | Haake Viskotester 550 Thermo Scientific | |||||||||
| Optical microscope | Leica DMIL | Trygve L Schanche | Leica DMIL | |||||||
| Optical microscope | Olympus BH-2 | KII-032A | Stein Rørvik | |||||||
| Optical microscope | Reichert MeF3A med Sony kamera | Stein Rørvik | ||||||||
| Optical microscope | Olympus BX60 | Stein Rørvik | ||||||||
| Peizoelektriske målinger | Aix PES Piezoelectric evaluation | |||||||||
| Optical microscope | Leica EZ4 | Scanning electron microscope | Hitachi S-3400N | KII-036 |
...
| Electron Microscopy | SEM with Gatan CL system JEOL JSM 840 | F-369 | Yingda Yu | |||||||
| Scanning Electron Microscopy | SEM with JEOL EDS system JEOL JSM 6010LA | F-369 | Yingda Yu |
| ||||||
| Scanning Electron Microscopy | FE-SEM wirh EDAX EDS system Zeiss Supra 55VP | F-369 | Yingda Yu |
|
| Anchor | ||||
|---|---|---|---|---|
|
Scanning probe microscope
| Type of equipment | Name of equipment | Location | Contact person | Link to more information | ||||||
|---|---|---|---|---|---|---|---|---|---|---|
| Electron Micro Probe Analyzer | FE-EPMA wirh JEOL WDS system JEOL JXA 8500 | F-373 | Morten Raanes |
| ||||||
| Scanning probe microscope | AFM/STM Agilent 5500 | KII-003A | Magnus Følstad |
|
| Anchor | ||||
|---|---|---|---|---|
|
Thermal analysis
| Type of equipment | Name of equipment | Location | Contact person | Link to more information |
|---|---|---|---|---|
| Thermal analysis | Perkin Elmer Diffential scanning calorimeter | KII-103 | Sverre Magnus Selback | Perkin Elmer Diffential scanning calorimeter |
| Thermal analysis | High temperature oxygen flux furnace | KII-103 | Belma Talic | High temperature oxygen flux furnace |
| Thermal analysis | NETZSCH dilatometer 402E | KII-103 | Ove Darell | NETZSCH Dilatometer 402E |
| Thermal analysis | NETZSCH dilatometer 402C | KII-103 | Eli Beate Larsen | NETZSCH Dilatometer 402C |
| Thermal analysis | NETZSCH STA449 jupiter | KII-103 | Eli Beate Larsen | NETZSCH STA449 Jupiter |
| Thermal analysis | Electrical conductivity furnace | KII-103 | Belma Talic | Electrical conductivity furnace |
| Thermal analysis | Optisk dilatometer-Expert system | KII-119 | Anne Støre | Optisk dilatometer-Expert system |
| Thermal analysis | LFA Microflash, termisk diffusivitet | KII-119 | Anne Støre | LFA Microflash, thermal diffusivity |
| Anchor | ||||
|---|---|---|---|---|
|
Spectroscopy
| Anchor | ||||
|---|---|---|---|---|
|
Surface and particle analysis
| Type of equipment | Name of equipment | Location | Contact person | Link to more information |
|---|---|---|---|---|
| Surface and particle analysis | XRD Texture Analysis | A-347 | Torild Krogstad | XRD Texture analysis |
| Surface and particle analysis | PSA Malvern 2000 | KII-107 | Jannicke Kvello | PSA Malvern 2000 |
| Surface and particle analysis | TRISTAR 3000 surface area and porosity analyzer | KII-107 | Elin Albertsen | BET |
| Surface and particle analysis | Zetapotensial- og partikkelstørrelse-måler Beckman Coulter DelsaNano C | KII-223 | Magnus Følstad | Beckman Coulter DelsaNano C |
| Anchor | ||||
|---|---|---|---|---|
|
XRD
| Type of equipment | Name of equipment | Location | Contact person | Link to more information |
|---|---|---|---|---|
XRD | D8 advance Bruker | KII-113 | Julian Tolchard | D8 Advance Bruker |
| XRD | Da Vinci 1 Bruker | KII-113 | Julian Tolchard | Da Vinci 1 Bruker |
| XRD | Da Vinci 2 Bruker | KII-113 | Julian Tolchard | Da Vinci 2 Bruker |
| XRD | A-unit X-ray diffractometer | KII-113 | Julian Tolchard | A-unit X-ray diffractometer |
| XRD | D8 focus Siemens | KII-113 | Julian Tolchard | D8 focus Siemens |
| Anchor | ||||
|---|---|---|---|---|
|
Solar cell silicon characterisation
---------------------
...
| Type of equipment | Name of equipment | Location | Contact person | Link to more information | ||||||
|---|---|---|---|---|---|---|---|---|---|---|
| Element Analysis | GD-MS | E-208 | Chiara Modanese | GD-MS | ||||||
| Surface and particle analysis | XRD Texture Analysis | A-347 | Torild Krogstad | XRD Texture analysis | ||||||
| Optical microscope | Wild Heerbrugg | A-443 | Trygve L. Schanche | Wild Heerbrugg | ||||||
| Optical microscope | Leica MEF4M | E-514 | Trygve L. Schanche | Leica MEF4M | ||||||
| Optical microscope | Reichert-Jung Univar | E-514 | Trygve L. Schanche | Reitchert-Jung Univar | ||||||
| Optical microscope | Makroskop Leitz M400 | E-508 | Trygve L. Schanche | Makroskop Leitz M400 | ||||||
| Optical microscope | Leitz MM6 | E-508 | Trygve L. Schanche | Leitz MM6 | ||||||
| Optical microscope | Zeiss Axiovert 25 | E-508 | Trygve L. Schanche | Zeiss Axiovert 25 | ||||||
| Optical microscope | Leitz metalloplan | E-508 | Trygve L. Schanche | Leitz metalloplan | ||||||
| Optical microscope | Leitz 1A | E-508 | Trygve L. Schanche | Leitz 1A | ||||||
| Optical microscope | Reichert MEF1 | E-508 | Trygve L. Schanche | Reitchert MEF1 | ||||||
| Optical microscope | Leitz Metallux 3 | E-514A | Trygve L. Schanche | Leitz Metallux 3 | ||||||
| Videokamera (2 stk) | JVC TK-S310 EG | E-514A | Trygve L. Schanche | Video camera | ||||||
| Videokamera til mikroskop | Leica R3 elecrt. | E-514A | Trygve L. Schanche | Video camera for microscope | ||||||
| Optical microscope | Leitz Axioskop | E-514A | Trygve L. Schanche | Leitz Axioskop | ||||||
| Scanning Electron Microscopy | FE-SEM with Bruker EDS/NORDIF EBSD system Hitachi SU6600 | F-362 | Yingda Yu |
| ||||||
| Scanning Electron Microscopy | FE-SEM with Bruker EDS/NORDIF EBSD system Zeiss Ultra 55 | F-362 | Yingda Yu |
| ||||||
| Scanning Electron Microscopy | SEM with Nordif EBSD system JEOL JSM 840A | F-362 | Yingda Yu |
| ||||||
| Transmission Electron Microscopy | TEM with Gatan GIF system JEOL TEM 2010 | F-368 | Yingda Yu |
| ||||||
| Scanning Electron Microscopy | SEM with Gatan CL system JEOL JSM 840 | F-369 | Yingda Yu | |||||||
| Scanning Electron Microscopy | SEM with JEOL EDS system JEOL JSM 6010LA | F-369 | Yingda Yu |
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| Scanning Electron Microscopy | FE-SEM wirh EDAX EDS system Zeiss Supra 55VP | F-369 | Yingda Yu |
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| Electron Micro Probe Analyzer | FE-EPMA wirh JEOL WDS system JEOL JXA 8500 | F-373 | Morten Raanes |
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| Scanning probe microscope | AFM/STM Agilent 5500 | KII-003A | Magnus Følstad |
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| UV-vis/NIR spektrofotometer + potensiostat | Photoelectrochemical station | KII-014 | Magnus Følstad | |||||||
| Thermal analysis | Perkin Elmer Diffential scanning calorimeter | KII-103 | Sverre Magnus Selback | Perkin Elmer Diffential scanning calorimeter | ||||||
| Thermal analysis | High temperature oxygen flux furnace | KII-103 | Belma Talic | High temperature oxygen flux furnace | ||||||
| Thermal analysis | NETZSCH dilatometer 402E | KII-103 | Ove Darell | NETZSCH Dilatometer 402E | ||||||
| Thermal analysis | NETZSCH dilatometer 402C | KII-103 | Eli Beate Larsen | NETZSCH Dilatometer 402C | ||||||
| Thermal analysis | NETZSCH STA449 jupiter | KII-103 | Eli Beate Larsen | NETZSCH STA449 Jupiter | ||||||
| Thermal analysis | Electrical conductivity furnace | KII-103 | Belma Talic | Electrical conductivity furnace | ||||||
| Surface and particle analysis | PSA Malvern 2000 | KII-107 | Jannicke Kvello | PSA Malvern 2000 | ||||||
| Surface and particle analysis | TRISTAR 3000 surface area and porosity analyzer | KII-107 | Elin Albertsen | BET | ||||||
| LECO | Oxygen and nitrogen analysis | KII-107 | Anne Støre | LECO | ||||||
| Pycnometer | Accupyc 1330 | KII-107 | Julian Tolchard | Accupyc 1330 | ||||||
XRD | D8 advance Bruker | KII-113 | Julian Tolchard | D8 Advance Bruker | ||||||
| XRD | Da Vinci 1 Bruker | KII-113 | Julian Tolchard | Da Vinci 1 Bruker | ||||||
| XRD | Da Vinci 2 Bruker | KII-113 | Julian Tolchard | Da Vinci 2 Bruker | ||||||
| XRD | A-unit X-ray diffractometer | KII-113 | Julian Tolchard | A-unit X-ray diffractometer | ||||||
| XRD | D8 focus Siemens | KII-113 | Julian Tolchard | D8 focus Siemens | ||||||
| Thermal analysis | Optisk dilatometer-Expert system | KII-119 | Anne Støre | Optisk dilatometer-Expert system | ||||||
| Thermal analysis | LFA Microflash, termisk diffusivitet | KII-119 | Anne Støre | LFA Microflash, thermal diffusivity | ||||||
| Surface and particle analysis | Zetapotensial- og partikkelstørrelse-måler Beckman Coulter DelsaNano C | KII-223 | Magnus Følstad | Beckman Coulter DelsaNano C | ||||||
Glow Discharge Optical Emission Spectroscopy | GD-OES GD-profiler | KII-307 | Maria Stepanova | GD-OES | ||||||
| Optical Microscope | Nikon SM2800 | KII-323 | Nikon SM2800 | |||||||
| Optical Microscope | Leica DM IRM | KII-323 | ||||||||
| Optical microscope | Zeiss | |||||||||
| Optical microscope | Wild Heerbrugg |
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| IR Spectroscropy | Bruker IFS66V | KII-014 | ||||||||
| UV-vis/NIR spektrofotometer + potensiostat | Photoelectrochemical station | Magnus Følstad | ||||||||
| Massespektrometer | Pfeiffer Vacum Prisma Plus HiCube | Morten Tjelta | ||||||||
| Viskositetsmåling | Haake Mars Modular Advanced Rheometer System | |||||||||
| Viskositetsmåling | Haake Viskotester 550 Thermo Scientific | |||||||||
| Optical microscope | Leica DMIL | Trygve L Schanche | Leica DMIL | |||||||
| Optical microscope | Olympus BH-2 | KII-032A | Stein Rørvik | |||||||
| Optical microscope | Reichert MeF3A med Sony kamera | Stein Rørvik | ||||||||
| Optical microscope | Olympus BX60 | Stein Rørvik | ||||||||
| Peizoelektriske målinger | Aix PES Piezoelectric evaluation | |||||||||
| Optical microscope | Leica EZ4 | |||||||||
| Scanning electron microscope | Hitachi S-3400N | KII-036 |
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Solar cell silicon characterisation
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