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  • Link in New Window
    linkTextSEM A (JSM 840)
    hrefhttp://www.material.ntnu.no/lab/material/equipment/ProdInfoSEM_A.pdf
  • Link in New Window
    linkTextHitachi SU6600 FEG SEM
    hrefhttp://www.material.ntnu.no/lab/material/equipment/HitachiFEG.jpg
  • Lv-sem Sem Sælandsvei (Hitachi S-3400N)
  • Link in New Window
    linkTextLV-Fe-SEM (ZeissSupra 55 VP)
    hrefhttp://www.material.ntnu.no/lab/material/equipment/ProdInfoFE-SEM.pdf
  • Link in New Window
    linkTextFe-sem (Zeiss Ultra 55 LE)
    hrefhttp://www.material.ntnu.no/lab/material/equipment/ULTRA_Technical.pdf
  • Link in New Window
    linkTextJEOL JXA-8500F Electron Probe Micro analyzer (EPMA)
    hrefhttp://www.material.ntnu.no/lab/material/equipment/ProdInfoEPMA.pdf
  • Link in New Window
    linkTextEDS, EDAX Gernesis
    hrefhttp://edax.com/
  • Link in New Window
    linkTextTEM (JEOL, JEM-2010)
    hrefhttps://www.ntnu.no/wiki/download/attachments/67474571/TEMinfo.pdf?version=1&modificationDate=1409311611000&api=v2
  • Link in New Window
    linkTextFishione Plasma Cleaner, EM sample cleaning
    hrefhttp://www.fischione.com/products/model_1020.asp
  • Link in New Window
    linkTextAgar Turbo Carbon Coater, SEM sample coating
    hrefhttp://www.agarscientific.com/
  • Link in New Window
    linkTextFischione Ion Mill, TEM sample preparation
    hrefhttp://www.fischione.com/products/model_1010.asp

     

Contact : 

Link in New Window
linkTextYingda Yu
hrefhttp://folk.ntnu.no/yingday/
 and 
Link in New Window
linkTextMorten Raanes
hrefhttp://www.ntnu.no/ansatte/morten.raanes

Electron microscope

Optical microscope

Type of equipmentNameLab 
MicroscopeLeitz AxioskopE-514ALeitz Axioskop
MicroscopeLeitz Metallux 3E-514ALeitz Metallux 3
Microscope (inverted)Zeiss Axiovert 25E-508Zeiss Axiovert 25

Scanning probe microscope

Thermal analysis

Spectroscopy

Type of equipmentEquipment NameLabContact personLink to more information
GD-MSElement GDE-208

Chiara Modanese /41520593 

 

XRD

Type of equipmentEquipment NameLabContact personLink to more information
X-ray diffractometerSiemens D5000A 441

Torild Krogstad / 918 97 623 

 

Surface and particle analysis

Type of equipmentEquipment NameLabContact personLink to more information
Suface and particle analysisTristar 3000K2-107

Elin H. Albertsen

BET


 

 

 

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