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Link in New Window linkText SEM A (JSM 840) href http://www.material.ntnu.no/lab/material/equipment/ProdInfoSEM_A.pdf Link in New Window linkText Hitachi SU6600 FEG SEM href http://www.material.ntnu.no/lab/material/equipment/HitachiFEG.jpg Link in New Window linkText LV-Fe-SEM (ZeissSupra 55 VP) href http://www.material.ntnu.no/lab/material/equipment/ProdInfoFE-SEM.pdf Link in New Window linkText dv?Fe-sem (Zeiss Ultra 55 LE) href http://www.material.ntnu.no/lab/material/equipment/ULTRA_TechnicalProdInfoFE-SEM.pdf Link in New Window linkText JEOL JXA-8500F Electron Probe Micro analyzer (EPMA) href http://www.material.ntnu.no/lab/material/equipment/ProdInfoEPMA.pdf Link in New Window linkText EDS, EDAX Gernesis href http://edax.com/ Link in New Window linkText TEM href https://www.ntnu.no/wiki/download/attachments/67474571/TEMinfo.pdf?version=1&modificationDate=1409311611000&api=v2 Link in New Window linkText Fishione Plasma Cleaner, EM sample cleaning href http://www.fischione.com/products/model_1020.asp Link in New Window linkText Agar Turbo Carbon Coater, SEM sample coating href http://www.agarscientific.com/ Link in New Window linkText Fischione Ion Mill, TEM sample preparation href http://www.fischione.com/products/model_1010.asp
Electron microscope
Optical microscope
Type of equipment | Name | Lab | |
---|---|---|---|
Microscope | Leitz Axioskop | E-514A | Leitz Axioskop |
Microscope | Leitz Metallux 3 | E-514A | Leitz Metallux 3 |
Microscope (inverted) | Zeiss Axiovert 25 | E-508 | Zeiss Axiovert 25 |
Scanning probe microscope
Thermal analysis
Spectroscopy
Type of equipment | Equipment Name | Lab | Contact person | Link to more information |
---|---|---|---|---|
GD-MS | Element GD | E-208 | Chiara Modanese /41520593 |
XRD
Type of equipment | Equipment Name | Lab | Contact person | Link to more information |
---|---|---|---|---|
X-ray diffractometer | Siemens D5000 | A 441 | Torild Krogstad / 918 97 623 |
Surface and particle analysis
Type of equipment | Equipment Name | Lab | Contact person | Link to more information |
---|---|---|---|---|
Suface and particle analysis | Tristar 3000 | K2-107 | Elin H. Albertsen | BET |
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