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- Sem A (Jsm 840)
- Lv-sem Sem Sælandsvei (Hitachi S-3400N)
- LV-Fe-sem (Zeiss Supra 55 VP)
- Fe-sem (Zeiss Ultra 55 LE)
- EPMA (Jxa-8500F)
- EDS, EDAX Gernesis
- Tem (JEOL, JEM-2010)
- Fishione Plasma Cleaner, EM sample cleaning
- Agar Turbo Carbon Coater, SEM sample coating
- Fischione Ion Mill, TEM sample preparation
Electron microscope
Optical microscope
| Type of equipment | Name | Lab | |
|---|---|---|---|
| Microscope | Leitz Axioskop | E-514A | Leitz Axioskop |
| Microscope | Leitz Metallux 3 | E-514A | Leitz Metallux 3 |
| Microscope (inverted) | Zeiss Axiovert 25 | E-508 | Zeiss Axiovert 25 |
Scanning probe microscope
Thermal analysis
Spectroscopy
| Type of equipment | Equipment Name | Lab | Contact person | Link to more information |
|---|---|---|---|---|
| GD-MS | Element GD | E-208 | Chiara Modanese /41520593 |
XRD
| Type of equipment | Equipment Name | Lab | Contact person | Link to more information |
|---|---|---|---|---|
| X-ray diffractometer | Siemens D5000 | A 441 | Torild Krogstad / 918 97 623 |
Surface and particle analysis
| Type of equipment | Equipment Name | Lab | Contact person | Link to more information |
|---|---|---|---|---|
| Suface and particle analysis | Tristar 3000 | K2-107 | Elin H. Albertsen |
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