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changes.mady.by.user Elvia Anabela Chavez Panduro

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changes.mady.by.user Shannen Thora Lea Sait

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Type of equipmentName of equipmentLocationContact personLink to more information
XRDRoutine Powder Diffractometer (DaVinci1)KII-113Contact personRoutine powder XRD
XRDPowder diffractometer (D8 Focus)KII-113Contact person9-pos Powder XRD
XRDThin-film Diffractometer (D8 Discover)KII-113Contact personD8 Discover
XRDMultipurpose Powder X-ray diffractometer (DaVinci2)KII-113Contact personMultipurpose XRD
XRDNon-ambient X-ray diffractometer (D8 Advance)KII-113Contact personNon-ambient XRD


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Solar cell silicon characterisation
Solar cell silicon characterisation

Solar cell silicon characterisation

Type of equipmentName of equipmentLocationContact personLink to more information
Si - CharacterisationNicolet 6700 FT-IRM-104Chiara Modanese
Si - CharacterisationµLPCD resistivty life time measurmentM-104Gaute Stokkan (SINTEF)
Si - CharacterisationSiWaScanM-104Gaute Stokkan (SINTEF)
Si - Characterisationmicro cracks characterisationM-104Kai Erik Ekstrøm
Si - Characterisation Crystal deffect mesurmentPVSCAN 6000M-104Gaute Stokkan (SINTEF)
Si - Characterisation Density ImagingCDI-CarrierM-104Gaute Stokkan (SINTEF)

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Inductively couple plasma mass spectrometry (ICP-MS)
Inductively couple plasma mass spectrometry (ICP-MS)

Inductively coupled plasma mass spectrometry (ICP-MS)

Type of equipmentName of equipmentLocationContact personLink to more information
ICP-MSPerkin Elmer NexION 5000KII-321

Shannen Thora Lea Sait

Henrik Ness


Electrical resistivity measurement

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