Description:
Diffractometter Diffractometer with Ge-002 monochromator and CuKα1 radiation for thin film studies.
- XRR studies: thickness, surface roughness and electron density measurement of thin layers.
- HR-XRD, RSM studies: crystalline quality of the sample, strain analysis,
- GIXRD studies: grazing inside diffraction on thin films.
D8 Discover instrument at IMA-NTNU
Instrument specifications:
- Cu source
- Gobel mirror and 2 bounce Ge(220) monocromatormonochromator.
- θ–2θ operating mode.
- Sample stage: 5-axis Eulerian cradle.
- Data collection from 0° to 120° 2θ.
- Detectors: LynxEye detector for 0D and 1D scan. Scintillation counter detector connected to analyzer for better resolution.
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