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Diffractometter with Ge-002 monochromator and CuKα1 radiation. LynEye LynxEye and Scintillation detector. 

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  • XRR studies, phase analysis and thickness of thin layers.
  • HR-XRD studies, thin-film strain analysis 
  • GIXRD studies, grazing inside diffraction on thin films.Investigation of strain and crystallite size effects (due to tight and symmetrical line-shape characteristics of the instrument).
Instrument specifications:

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