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Diffractometter with Ge-002 monochromator and CuKα1 radiation. LynEye LynxEye and Scintillation detector.
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- XRR studies, phase analysis and thickness of thin layers.
- HR-XRD studies, thin-film strain analysis
- GIXRD studies, grazing inside diffraction on thin films.Investigation of strain and crystallite size effects (due to tight and symmetrical line-shape characteristics of the instrument).
Instrument specifications:
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