...
| Info |
|---|
| Type of equipment | Name of equipment | Location | Contact person | Link to more information | ||||||
|---|---|---|---|---|---|---|---|---|---|---|
| Scanning Electron Microscopy | FE-SEM with Bruker EDS/NORDIF EBSD system Hitachi SU6600 | F-362 | Yingda Yu |
| ||||||
| Scanning Electron Microscopy | FE-SEM with Bruker EDS/NORDIF EBSD system Zeiss Ultra 55 | F-362 | Yingda Yu |
| ||||||
| Scanning Electron Microscopy | SEM with Nordif EBSD system JEOL JSM 840A | F-362 | Yingda Yu |
| ||||||
| Scanning Electron Microscopy | SEM with Gatan CL system JEOL JSM 840 | F-369 | Yingda Yu | |||||||
| Scanning Electron Microscopy | SEM with JEOL EDS system JEOL JSM 6010LA | F-369 | Yingda Yu |
| ||||||
| Scanning Electron Microscopy | FE-SEM wirh EDAX EDS system Zeiss Supra 55VP | F-369 | Yingda Yu |
| ||||||
| Scanning electron microscopy | Hitachi S-3400N | KII-036 | Sergey Khromov |
...
| Type of equipment | Name of equipment | Location | Contact person | Link to more information |
|---|---|---|---|---|
| XRD | Routine Powder Diffractometer (DaVinci1) | KII-113 | Contact person | Routine powder XRD |
| XRD | Powder diffractometer (D8 Focus) | KII-113 | Contact person | 9-pos Powder XRD |
| XRD | Siemens D5005 with monochromator (A-unit) | KII-113 | Contact person | Siemens D5005 |
| XRD | Multipurpose Powder X-ray diffractometer (DaVinci2) | KII-113 | Contact person | Multipurpose XRD |
| XRD | Non-ambient X-ray diffractometer (D8 Advance) | KII-113 | Contact person | Non-ambient XRD |
| Texture Analysis | X-ray diffractometer | A-347 | Håkon Wiik Ånes | Macrotexture XRD |
| Anchor | ||||
|---|---|---|---|---|
|
...