Optical Microscope
Type of equipment | Name of equipment | Location | Contact person | Link to more information |
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Optical microscope | Wild Heerbrugg | A-443 |
Trygve L. Schanche | Trygve L. Schanche | Trygve L. Schanche | Trygve L. Schanche | Trygve L. Schanche | Trygve L. Schanche Trygve L. Schanche | Trygve L. Schanche | Trygve L. Schanche | Trygve L. Schanche |
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Videokamera til mikroskop | Leica R3 elecrt. | E-514A |
Trygve L. Schanche | Trygve L. Schanche |
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Optical Microscope | Leica DM IRM | KII-323 |
Eli Beate Larsen | Johannes Ofstad |
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Optical microscope | Zeiss | KII- |
003A Magnus B. Følstad | |
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Optical microscope | Leica DMIL | KII-022 |
Trygve L. Schanche | |
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Optical microscope | Reichert MeF3A med Sony kamera | KII-032A | Stein Rørvik (SINTEF) |
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Optical microscope | Olympus BX60 | KII-032A | Stein Rørvik (SINTEF) |
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Optical microscope | Wild Heerbrugg | KII-011 |
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| Electron microscope |
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| Electron microscope |
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Type of equipment | Name of equipment | Location | Contact person | Link to more information |
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Scanning Electron Microscopy | FE-SEM with Bruker EDS/NORDIF EBSD system Hitachi SU6600 | F-362 | Yingda Yu | Link in New Window |
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linkText | Hitachi SU6600 FEG SEM |
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href | http://www.material.ntnu.no/lab/material/equipment/HitachiFEG.jpg |
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Scanning Electron Microscopy | FE-SEM with Bruker EDS/NORDIF EBSD system Zeiss Ultra 55 | F-362 | Yingda Yu | Link in New Window |
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linkText | Fe-sem (Zeiss Ultra 55 LE) |
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href | http://www.material.ntnu.no/lab/material/equipment/ULTRA_Technical.pdf |
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Scanning Electron Microscopy | SEM with Nordif EBSD system JEOL JSM 840A | F-362 | Yingda Yu | Link in New Window |
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linkText | SEM A (JSM 840) |
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href | http://www.material.ntnu.no/lab/material/equipment/ProdInfoSEM_A.pdf |
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Scanning Electron Microscopy | SEM with Gatan CL system JEOL JSM 840 | F-369 | Yingda Yu |
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Scanning Electron Microscopy | SEM with JEOL EDS system JEOL JSM 6010LA | F-369 | Yingda Yu | Link in New Window |
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linkText | EDS, EDAX Gernesis |
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href | http://edax.com/ |
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Scanning Electron Microscopy | FE-SEM wirh EDAX EDS system Zeiss Supra 55VP | F-369 | Yingda Yu | Link in New Window |
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linkText | LV-Fe-SEM (ZeissSupra 55 VP) |
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href | http://www.material.ntnu.no/lab/material/equipment/ProdInfoFE-SEM.pdf |
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Scanning electron microscopy | Hitachi S-3400N | KII-036 | Sergey Khromov |
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| Scanning probe microscope |
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| Scanning probe microscope |
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Scanning probe microscope
Type of equipment | Name of equipment | Location | Contact person | Link to more information |
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Electron Micro Probe Analyzer | FE-EPMA wirh JEOL WDS system JEOL JXA 8500 | F-373 | Morten Raanes | Link in New Window |
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linkText | JEOL JXA-8500F Electron Probe Micro analyzer (EPMA) |
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href | http://www.material.ntnu.no/lab/material/equipment/ProdInfoEPMA.pdf |
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Scanning probe microscope | Agilent 5500 AFM/SPM microscope | KII- |
003AMagnus B. FølstadTransmission electron microscopy
Type of equipment | Name of equipment | Location | Contact person | Link to more information |
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TEM with Gatan GIF system | JEOL TEM 2010 | F-368 | Yingda Yu |
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| Thermal analysis |
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| Thermal analysis |
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Thermal analysis
Forms to filled out: Request for use of TA instruments at IMA (office.com
TA-form: TA-analysis_form.pdf
General information:
Using steam as sample gas: Water vapor pressure Generator.pdf
Type of equipment | Name of equipment | Location | Contact person | Link to more information |
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Thermal analysis | DTA/TGA Setaram Sensis | A-K032 | Sarina Bao (SINTEF) |
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Thermal analysis | Electrical conductivity furnace |
KII-103 | Belma Talic | |
| Pei Na Kui |
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Thermal analysis | NETZSCH dilatometer 402C, themal analysis | KII-103 |
Eli Beate Larsen | STA449 jupiter, thermal analysis 1STA F3 449 Jupiter (Hugin) | KII-103 |
Eli Beate Larsen | STA449 jupiter, thermal analysis 2STA C 449 Jupiter, (Munin) | KII-103 | Martin Oppegård |
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Thermal analysis | LINSEIS STA PT 1600, (Linseis) | KII-103 |
Eli Beate Larsen | Ove Darell |
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Thermal analysis | NETZSCH DSC 214 Polyma | KII-103 | Pei Na Kui |
DSC 214 PolymaPerkin Elmer Diffential scanning calorimeter | KII-103 | Sverre Magnus Selbach | Thermal analysis | Optisk dilatometer-Expert system | KII- |
119 |
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Thermal analysis | LFA Microflash, termisk diffusivitet | KII- |
119 |
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Thermal analysis | Dilatometer | KII-303 | Anne Støre (SINTEF) |
Spectroscopy
Type of equipment | Name of equipment | Location | Contact person | Link to more information |
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Spectroscopy | Glow discharge optical emission spectroscopy (GD-OES) | Horiba GD profiler 2 | KII-307 |
Mariia StepanovaSpectroscopy Element Analysis | GD-MS | E-208 | Chiara Modanese | Magnus B. Følstad | | |
Mass spectrometer + potensiostat | Differential Electrochemical Mass Spectrometry (DEMS) station | KII- |
014UV-vis/NIR spectrophotometer + potensiostat | Photoelectrochemical station | KII- |
001Magnus B. Følstad | |
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FTIR spectrometer | Bruker Vertex 80v | KII- |
014Magnus B. Følstad | Anchor |
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| Surface and particle analysis |
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| Surface and particle analysis |
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Surface and particle analysis
Type of equipment | Name of equipment | Location | Contact person | Link to more information |
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Surface and particle analysis |
PSA Malvern 2000 BET |
Surface and particle analysis | TRISTAR 3000 surface area and porosity analyzer | KII-107 | Elin Albertsen | BET |
Surface and particle analysis | Permeabilitet | KII-303 | Anne Støre (SINTEF) |
| Zetapotential and |
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Surface analyzer | Drop Shape Analyzer - DSA100 | KII-321 | Johannes Ofstad | Description |
Laser scattering particle size analyzer |
Beckman Coulter DelsaNano CHoriba LA-960 Partica | KII- |
223Magnus B. Følstad | Description, terms of use & user manual | Surface analyzer | Drop Shape Analyzer - DSA100 | KII-321 | Anita Storsve | DescriptionXRD
Type of equipment | Name of equipment | Location | Contact person | Link to more information |
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XRD |
D8 Advance BrukerThe "D8 Advance"Da Vinci 1 BrukerThe "DaVinci 1"Da Vinci 2 BrukerThe "DaVinci 2"A-unit Multipurpose Powder X-ray diffractometer |
SiemensThe "A-unit"D8 Focus BrukerThe "D8 Focus" | Texture Analysis | X-ray diffractometer | A-347 | Torild Krogstad |
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| Solar cell silicon characterisation |
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| Solar cell silicon characterisation |
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Solar cell silicon characterisation
Type of equipment | Name of equipment | Location | Contact person | Link to more information |
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Si - Characterisation | Nicolet 6700 FT-IR | M-104 | Chiara Modanese |
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Si - Characterisation | µLPCD resistivty life time measurment | M-104 | Gaute Stokkan (SINTEF) |
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Si - Characterisation | SiWaScan | M-104 | Gaute Stokkan (SINTEF) |
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Si - Characterisation Crystal deffect mesurment | PVSCAN 6000 | M-104 | Gaute Stokkan (SINTEF) |
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Si - Characterisation Density Imaging | CDI-Carrier | M-104 | Gaute Stokkan (SINTEF) |
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| Inductively couple plasma mass spectrometry (ICP-MS) |
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| Inductively couple plasma mass spectrometry (ICP-MS) |
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Inductively coupled plasma mass spectrometry (ICP-MS)
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Type of equipment | Name of equipment | Location | Contact person | Link to more information |
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ICP-MS | Perkin Elmer NexION 5000 | KII-321 | Shannen Thora Lea Sait Henrik Ness |
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Electrical resistivity measurement
Type of equipment | Name of equipment | Location | Contact person | Link to more information |
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Resistivity measurement (metals) | Sigmascope | E-508 |
Trygve L. Schanche | |
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