Description:
Siemens D5005, with quartz primary Diffractometer with Ge-002 monochromator and CuKα1 radiation . Scintillation detector. Optimised for high quality powder data collection.
Well suited for:
- Collection of data for structure solution and/or Rietveld refinement
- Investigation of strain and crystallite size effects (due to tight and symmetrical line-shape characteristics of the instrument).
Not so good for:
- Samples containing fluorescing elements (Fe, Co, Mn), depending on the concentration.
Photo: Julian Tolchard
Instrument specifications:
for thin film studies.
- XRR studies: thickness, surface roughness and electron density measurement of thin layers.
- HR-XRD, RSM studies: crystalline quality of the sample, strain analysis,
- GIXRD studies: grazing inside diffraction on thin films.
- Texture measurement.
D8 Discover instrument at IMA-NTNU
Instrument specifications:
- Cu source
- Gobel mirror and 2 bounce Ge(220) monochromator.
- θ–2θ operating mode.
- Sample stage: 5-axis Eulerian cradle.
- Data collection from 0° to 120° 2θ.
- Detectors: LynxEye detector for 0D and 1D scan. Scintillation counter detector connected to analyzer for better resolution.
- Bragg-Brentano geometry
- θ–2θ operating mode
- Data collection from 0.5° (but 15°-20° in normal mode) to 140° 2θ
- 2.5° primary and secondary Soller slits
- Rotating single sample holder with user selectable rotation speeds
Before you begin:
Equipment may can not be used without training. See XRD-lab info.
Booking the instrument
Use the booking system.
Relevant links: