The "A-unit"anchor
Optical
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Optical Microscope
Type of equipment | Name of equipment | Location | Contact person | Link to more information |
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Optical microscope | Wild Heerbrugg | A-443 | Trygve L. Schanche | |
Optical microscope | Leica MEF4M | E-514 | Trygve L. Schanche | |
Optical microscope | Reichert-Jung Univar | E-514 | Trygve L. Schanche | |
Optical microscope | Makroskop Leitz M400 | E-508 | Trygve L. Schanche | |
Optical microscope | Leitz MM6 | E-508 | Trygve L. Schanche | |
Optical microscope | Zeiss Axiovert 25 | E-508 | Trygve L. Schanche | Zeiss Axiovert 25 |
Optical microscope | Leitz metalloplan | E-508 | Trygve L. Schanche | |
Optical microscope | Leitz 1A | E-508 | Trygve L. Schanche | |
Optical microscope | Reichert MEF1 | E-508 | Trygve L. Schanche | |
Optical microscope | Leitz Metallux 3 | E-514A | Trygve L. Schanche | Leitz Metallux 3 |
Videokamera (2 stk) | JVC TK-S310 EG | KII-014 | Trygve L. Schanche | |
Videokamera til mikroskop | Leica R3 elecrt. | E-514A | Trygve L. Schanche | |
Optical microscope | Leitz Axioskop | E-514A | Trygve L. Schanche | Leitz Axioskop |
Optical Microscope | Nikon SM2800 | KII-323 | Eli Beate Larsen | |
Optical Microscope | Leica DM IRM | KII-323 | Eli Beate Larsen | |
Optical microscope | Zeiss | KII-003A | Magnus B. Følstad | |
Optical microscope | Leica DMIL | KII-022 | Trygve L. Schanche Kara Poon | |
Optical microscope | Olympus BH-2 | KII-032A | Stein Rørvik (SINTEF) | |
Optical microscope | Reichert MeF3A med Sony kamera | KII-032A | Stein Rørvik (SINTEF) | |
Optical microscope | Olympus BX60 | KII-032A | Stein Rørvik (SINTEF) | |
Optical microscope | Leica EZ4 | KII-034B | Sergey Khromov | |
Optical microscope | Wild Heerbrugg | KII-011 | ||
Optical microscope 3D | Alicona Infinite Focus | KII-032A | Kara Poon |
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Type of equipment | Name of equipment | Location | Contact person | Link to more information | ||||||
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Electron Micro Probe Analyzer | FE-EPMA wirh JEOL WDS system JEOL JXA 8500 | F-373 | Morten Raanes |
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Scanning probe microscope | Agilent 5500 AFM/STMSPM microscope Agilent 5500 | KII-003A | Magnus B. Følstad | About the instrument |
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Transmission electron microscopy
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Type of equipment | Name of equipment | Location | Contact person | Link to more information | |
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Thermal analysis | DTA/TGA Setaram Sensis | A-K032 | Sarina Bao (SINTEF) | ||
Thermal analysis | Electrical conductivity furnace | KII-103Belma Talic | Pei Na Kui | ||
Thermal analysis | NETZSCH dilatometer 402C, themal analysis | KII-103 | Eli Beate Larsen | Babak Khalaghi | Dilatometer |
Thermal analysis | NETZSCH STA449 jupiter, thermal analysis 1STA F3 449 Jupiter (Hugin) | KII-103 | Eli Beate Larsen | Babak Khalaghi | Simultaneous Thermal Analysis |
Thermal analysis | NETZSCH STA449 jupiter, thermal analysis 2STA C 449 Jupiter, (Munin) | KII-103 | Babak Khalaghi | Simultaneous Thermal Analysis combined with mass spectrometry | |
Thermal analysis | LINSEIS STA PT 1600, (Linseis) | KII-103 | Eli Beate Larsen | Babak Khalaghi | Simultaneous Thermal Analysis |
Thermal analysis | NETZSCH dilatometer 402E | KII-103 | Ove Darell (SINTEF) | ||
Thermal analysis | Perkin Elmer Diffential scanning calorimeterNETZSCH DSC 214 Polyma | KII-103 | Sverre Magnus Selbach | Babak Khalaghi | DSC 214 Polyma |
Thermal analysis | Optisk dilatometer-Expert system | KII-119103 | Anne Støre (SINTEF) | ||
Thermal analysis | LFA Microflash, termisk diffusivitet | KII-119103 | Anne Støre (SINTEF) | ||
Thermal analysis | Dilatometer | KII-303 | Anne Støre (SINTEF) |
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Type of equipment | Name of equipment | Location | Contact person | Link to more information | ||
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Spectroscopy | GD-OES | KII-307 | Mariia Stepanova | |||
Spectroscopy Element Analysis | GD-MS | E-208 | Chiara Modanese | |||
Mass spectrometer + potensiostat | Differential Electrochemical Mass Spectrometry (DEMS) station | Massespectrometer | Pfeiffer Vacum Prisma Plus HiCube | KII-014323 | Magnus B. Følstad | |
UV-vis/NIR spektrofotometer spectrophotometer + potensiostat | Photoelectrochemical station | KII-001 | Magnus B. Følstad | |||
FTIR spectrometer | Bruker Vertex 80v | KII-323 | Magnus B. Følstad |
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Raman microscope | WITec alpha300 R | KII- | 014323 | Magnus B. Følstad |
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Type of equipment | Name of equipment | Location | Contact person | Link to more information |
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Surface and particle analysis | PSA Malvern 2000 | KII-107 | Elin Albertsen | |
Surface and particle analysis | TRISTAR 3000 surface area and porosity analyzer | KII-107 | Elin Albertsen | BET |
Surface and particle analysis | Permeabilitet | KII-303 | Anne Støre (SINTEF) |
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Zetapotential and particle size analyzer | Beckman Coulter DelsaNano C | KII-223 | Magnus B. Følstad | Description, terms of use & user manual |
Surface analyzer | Drop Shape Analyzer - DSA100 | KII-321 | Anita Storsve | Description |
Laser scattering particle size analyzer | Horiba LA-960 Partica | KII-107 | Johannes Ofstad | Description |
Micro Scratch Tester | ST Instruments B A | KII-321 | Anita Storsve |
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XRD
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Type of equipment | Name of equipment | Location | Contact person | Link to more information | |||
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XRD | D8 Advance BrukerRoutine Powder Diffractometer (DaVinci1) | KII-113 | Kristin Høydalsvik | Contact person | Routine powder XRD | ||
XRD | Da Vinci 1 BrukerPowder diffractometer (D8 Focus) | KII-113 | Kristin Høydalsvik | XRD | Da Vinci 2 BrukerContact person | 9-pos Powder XRD | |
XRD | Siemens D5005 with monochromator (A-unit) | KII-113 | Kristin Høydalsvik | Contact person | Siemens D5005 | ||
XRD | A-unitMultipurpose Powder X-ray diffractometer | Siemens(DaVinci2) | KII-113 | Kristin Høydalsvik | The "A-unit"Contact person | Multipurpose XRD | |
XRD | D8 Focus BrukerNon-ambient X-ray diffractometer (D8 Advance) | KII-113 | Kristin Høydalsvik | Contact person | Non-ambient XRD | ||
Texture Analysis | X-ray diffractometer | A-347 | Torild KrogstadHåkon Wiik Ånes | XRD |
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