Versions Compared

Old Version 40

changes.mady.by.user Unknown User (leroy)

Saved on

compared with

New Version Current

changes.mady.by.user Shannen Thora Lea Sait

Saved on

Key

  • This line was added.
  • This line was removed.
  • Formatting was changed.


...

Optical

...

Optical Microscope

Type of equipmentName of equipmentLocationContact personLink to more information
Optical microscopeWild HeerbruggA-443
Trygve L. SchancheWild Heerbrugg
Berit Vinje Kramer
Optical microscopeLeica MEF4ME-514
Trygve L. Schanche
Berit Vinje Kramer  
Leica MEF4M

Optical microscopeReichert-Jung UnivarE-514
Trygve L. Schanche  Reitchert-Jung UnivarMakroskop Leitz M400
Berit Vinje Kramer  
Optical microscopeMakroskop Leitz M400E-508
Trygve L. Schanche  
Berit Vinje Kramer  
Optical microscopeLeitz MM6E-508
Trygve L. Schanche
Berit Vinje Kramer  
Leitz MM6

Optical microscopeZeiss Axiovert 25E-508
Trygve L. SchancheLeitz metalloplan
Berit Vinje Kramer  Zeiss Axiovert 25
Optical microscopeLeitz metalloplanE-508
Trygve L. Schanche  Leitz 1A
Berit Vinje Kramer  
Optical microscopeLeitz 1AE-508
Trygve L. Schanche  
Berit Vinje Kramer  
Optical microscopeReichert MEF1E-508
Trygve L. Schanche
Berit Vinje Kramer  
Reitchert MEF1

Optical microscopeLeitz Metallux 3E-514A
Trygve L. Schanche
Berit Vinje Kramer  Leitz Metallux 3
Videokamera (2 stk)JVC TK-S310 EG
E
KII-
514A
014Trygve L. Schanche  
Video cameraVideo camera for microscope

Videokamera til mikroskopLeica R3 elecrt.E-514A
Trygve L. Schanche  
Berit Vinje Kramer  
Optical microscopeLeitz AxioskopE-514A
Trygve L. SchancheNikon SM2800
Berit Vinje Kramer  Leitz Axioskop
Optical MicroscopeNikon SM2800KII-323
  
Eli Beate Larsen
Optical MicroscopeLeica DM IRMKII-323
 
Johannes Ofstad
Optical microscopeZeiss
   Optical microscopeWild Heerbrugg  

 

 
KII-008Marthe Folstad
Optical microscopeLeica DMIL
 Trygve L SchancheLeica DMIL
KII-022Andrey Kosinskiy
Optical microscopeOlympus BH-2KII-032AStein Rørvik (SINTEF)
 

Optical microscopeReichert MeF3A med Sony kamera
 
KII-032AStein Rørvik (SINTEF)
 

Optical microscopeOlympus BX60
 
KII-032AStein Rørvik
 
(SINTEF)
Optical microscopeLeica EZ4
  
KII-034BSergey Khromov
Optical microscopeWild HeerbruggKII-011

Optical microscope 3DAlicona Infinite FocusKII-032AAndrey Kosinskiy
 

Anchor
Electron microscope
Electron microscope

Electron microscope

Info

More information on SEM - TEM

EMlab


Type of equipmentName of equipmentLocationContact personLink to more information
Scanning Electron Microscopy

FE-SEM with Bruker EDS/NORDIF EBSD system

Hitachi SU6600

F-362Yingda Yu

Link in New Window
linkTextHitachi SU6600 FEG SEM
hrefhttp://www.material.ntnu.no/lab/material/equipment/HitachiFEG.jpg


Scanning Electron Microscopy

FE-SEM with Bruker EDS/NORDIF EBSD system

Zeiss Ultra 55

F-362Yingda Yu
Link in New Window
linkTextFe-sem (Zeiss Ultra 55 LE)
hrefhttp://www.material.ntnu.no/lab/material/equipment/ULTRA_Technical.pdf
Scanning Electron Microscopy

SEM with Nordif EBSD system

JEOL JSM 840A

F-362Yingda Yu
Link in New Window
linkTextSEM A (JSM 840)
hrefhttp://www.material.ntnu.no/lab/material/equipment/ProdInfoSEM_A.pdf
Scanning Electron Microscopy

SEM with Gatan CL system

JEOL JSM 840

F-369Yingda Yu
 

Scanning Electron Microscopy

SEM with JEOL EDS system

JEOL JSM 6010LA

F-369Yingda Yu
Link in New Window
linkTextEDS, EDAX Gernesis
hrefhttp://edax.com/
Scanning Electron Microscopy

FE-SEM wirh EDAX EDS system

Zeiss Supra 55VP

F-369Yingda Yu
Link in New Window
linkTextLV-Fe-SEM (ZeissSupra 55 VP)
hrefhttp://www.material.ntnu.no/lab/material/equipment/ProdInfoFE-SEM.pdf
Scanning electron microscopyHitachi S-3400NKII-036Sergey Khromov

Anchor
Scanning probe microscope
Scanning probe microscope

Scanning probe microscope

Type of equipmentName of equipmentLocationContact personLink to more information
Electron Micro Probe Analyzer

FE-EPMA wirh JEOL WDS system

JEOL JXA 8500

F-373Morten Raanes
Link in New Window
linkTextJEOL JXA-8500F Electron Probe Micro analyzer (EPMA)
hrefhttp://www.material.ntnu.no/lab/material/equipment/ProdInfoEPMA.pdf
Scanning probe microscopeAgilent 5500 AFM/
STM
SPM microscope

Agilent 5500

KII-
003AMagnus Følstad

SPM Agilent 5500

 

...

008Marthe FolstadAbout the instrument

Anchor
TEM
TEM

Transmission electron microscopy

Info

More information on SEM - TEM

EMlab

...


Type of equipmentName of equipmentLocationContact personLink to more information
Thermal analysisPerkin Elmer Diffential scanning calorimeterKII-103Sverre Magnus SelbackPerkin Elmer Diffential scanning calorimeterThermal analysisHigh temperature oxygen flux furnaceKII-103Belma TalicHigh temperature oxygen flux furnaceThermal analysisNETZSCH dilatometer 402EKII-103Ove DarellNETZSCH Dilatometer 402EThermal analysisNETZSCH dilatometer 402CKII-103Eli Beate LarsenNETZSCH Dilatometer 402CThermal analysisNETZSCH STA449 jupiterKII-103Eli Beate LarsenNETZSCH STA449 JupiterThermal analysisElectrical conductivity furnaceKII-103Belma TalicElectrical conductivity furnaceThermal analysisOptisk dilatometer-Expert systemKII-119Anne StøreOptisk dilatometer-Expert systemThermal analysisLFA Microflash, termisk diffusivitetKII-119Anne StøreLFA Microflash, thermal diffusivity

 

...

Spectroscopy

 

...

TEM with Gatan GIF systemJEOL TEM 2010F-368Yingda Yu

Anchor
Thermal analysis
Thermal analysis

Thermal analysis

Forms to filled out: Request for use of TA instruments at IMA (office.com

TA-form:  TA-analysis_form.pdf

General information:

Using steam as sample gas: Water vapor pressure Generator.pdf

...

Surface and particle analysis

Type of equipmentName of equipmentLocationContact personLink to more information
Surface and particle
Thermal analysis
XRD Texture Analysis
DTA/TGA Setaram SensisA-
347Torild KrogstadXRD Texture analysisSurface and particle analysisPSA Malvern 2000KII-107Jannicke KvelloPSA Malvern 2000Surface and particle analysisTRISTAR 3000 surface area and porosity analyzer KII-107Elin AlbertsenBETSurface and particle analysis

Zetapotensial- og partikkelstørrelse-måler

Beckman Coulter DelsaNano C

KII-223Magnus FølstadBeckman Coulter DelsaNano C

...

XRD

Type of equipmentName of equipmentLocationContact personLink to more information

XRD

D8 advance BrukerKII-113Julian TolchardD8 Advance Bruker
XRDDa Vinci 1 BrukerKII-113Julian TolchardDa Vinci 1 Bruker
XRDDa Vinci 2 BrukerKII-113Julian TolchardDa Vinci 2 Bruker
XRDA-unit X-ray diffractometerKII-113Julian TolchardA-unit X-ray diffractometer
XRDD8 focus SiemensKII-113Julian TolchardD8 focus Siemens

...

K032Sarina Bao (SINTEF)
Thermal analysisElectrical conductivity furnace
Pei Na Kui
Thermal analysisNETZSCH dilatometer 402C, themal analysisKII-103Pei Na Kui
Thermal analysisNETZSCH STA F3 449 Jupiter (Hugin)KII-103Martin OppegårdInstrument information
Thermal analysisNETZSCH STA C 449 Jupiter, (Munin)KII-103Martin Oppegård
Thermal analysisLINSEIS STA PT 1600, (Linseis)KII-103Martin OppegårdInstrument info
Thermal analysisNETZSCH dilatometer 402EKII-103Paul Inge Dahl (SINTEF)
Thermal analysisNETZSCH DSC 214 Polyma KII-103Pei Na Kui
Thermal analysisOptisk dilatometer-Expert systemKII-103Anne Støre (SINTEF)
Thermal analysisLFA Microflash, termisk diffusivitetKII-103Anne Støre (SINTEF)
Thermal analysisDilatometerKII-303Anne Støre (SINTEF)

Anchor
Spectroscopy
Spectroscopy

Spectroscopy

...

Solar cell silicon characterisation

 

 

Type of equipmentName of equipmentLocationContact personLink to more information
Element Analysis
Glow discharge optical emission spectroscopy (GD-
MSE-208Chiara ModaneseGD-MSSurface and particle analysisXRD Texture AnalysisA-347Torild KrogstadXRD Texture analysisOptical microscopeWild HeerbruggA-443Trygve L. SchancheWild HeerbruggOptical microscopeLeica MEF4ME-514Trygve L. Schanche  Leica MEF4MOptical microscopeReichert-Jung UnivarE-514Trygve L. Schanche  Reitchert-Jung UnivarOptical microscopeMakroskop Leitz M400E-508Trygve L. Schanche  Makroskop Leitz M400Optical microscopeLeitz MM6E-508Trygve L. Schanche  Leitz MM6Optical microscopeZeiss Axiovert 25E-508Trygve L. Schanche  Zeiss Axiovert 25Optical microscopeLeitz metalloplanE-508Trygve L. Schanche  Leitz metalloplanOptical microscopeLeitz 1AE-508Trygve L. Schanche  Leitz 1AOptical microscopeReichert MEF1E-508Trygve L. Schanche  Reitchert MEF1Optical microscopeLeitz Metallux 3E-514ATrygve L. Schanche  Leitz Metallux 3Videokamera (2 stk)JVC TK-S310 EGE-514ATrygve L. Schanche  Video cameraVideokamera til mikroskopLeica R3 elecrt.E-514ATrygve L. Schanche  Video camera for microscopeOptical microscopeLeitz AxioskopE-514ATrygve L. Schanche  Leitz AxioskopScanning Electron Microscopy

FE-SEM with Bruker EDS/NORDIF EBSD system

Hitachi SU6600

F-362Yingda Yu
Link in New Window
linkTextHitachi SU6600 FEG SEM
hrefhttp://www.material.ntnu.no/lab/material/equipment/HitachiFEG.jpg
Scanning Electron Microscopy

FE-SEM with Bruker EDS/NORDIF EBSD system

Zeiss Ultra 55

F-362Yingda Yu
Link in New Window
linkTextFe-sem (Zeiss Ultra 55 LE)
hrefhttp://www.material.ntnu.no/lab/material/equipment/ULTRA_Technical.pdf
Scanning Electron Microscopy

SEM with Nordif EBSD system

JEOL JSM 840A

F-362Yingda Yu
Link in New Window
linkTextSEM A (JSM 840)
hrefhttp://www.material.ntnu.no/lab/material/equipment/ProdInfoSEM_A.pdf
Transmission Electron Microscopy

TEM with Gatan GIF system

JEOL TEM 2010

F-368Yingda Yu
Link in New Window
linkTextTEM (JEOL, JEM-2010)
hrefhttps://www.ntnu.no/wiki/download/attachments/67474571/TEMinfo.pdf?version=1&modificationDate=1409311611000&api=v2
Scanning Electron Microscopy

SEM with Gatan CL system

JEOL JSM 840

F-369Yingda Yu Scanning Electron Microscopy

SEM with JEOL EDS system

JEOL JSM 6010LA

F-369Yingda Yu
Link in New Window
linkTextEDS, EDAX Gernesis
hrefhttp://edax.com/
Scanning Electron Microscopy

FE-SEM wirh EDAX EDS system

Zeiss Supra 55VP

F-369Yingda Yu
Link in New Window
linkTextLV-Fe-SEM (ZeissSupra 55 VP)
hrefhttp://www.material.ntnu.no/lab/material/equipment/ProdInfoFE-SEM.pdf
Electron Micro Probe Analyzer

FE-EPMA wirh JEOL WDS system

JEOL JXA 8500

F-373Morten Raanes
Link in New Window
linkTextJEOL JXA-8500F Electron Probe Micro analyzer (EPMA)
hrefhttp://www.material.ntnu.no/lab/material/equipment/ProdInfoEPMA.pdf
Scanning probe microscope

AFM/STM

Agilent 5500

KII-003AMagnus Følstad

SPM Agilent 5500

 

OES)Horiba GD profiler 2KII-307Sergey Khromov Glow discharge optical emission spectroscopy (GD-OES) Horiba GD Profiler 2
Glow discharge mass spectrometry (GDMS)Astrum GDMS (Nu Instruments, Ametek)KII-307Sergey Khromov Glow discharge mass spectrometry Astrum GDMS (Nu instruments, Ametek)
Mass spectrometer + potensiostatDifferential Electrochemical Mass Spectrometry (DEMS) stationKII-323Svein Sunde
UV-vis/NIR spectrophotometer
UV-vis/NIR spektrofotometer
+ potensiostatPhotoelectrochemical stationKII-
014
008
Magnus Følstad

Photoelectrochemical station

Thermal analysisPerkin Elmer Diffential scanning calorimeterKII-103Sverre Magnus SelbackPerkin Elmer Diffential scanning calorimeterThermal analysisHigh temperature oxygen flux furnaceKII-103Belma TalicHigh temperature oxygen flux furnaceThermal analysisNETZSCH dilatometer 402EKII-103Ove DarellNETZSCH Dilatometer 402EThermal analysisNETZSCH dilatometer 402CKII-103Eli Beate LarsenNETZSCH Dilatometer 402CThermal analysisNETZSCH STA449 jupiterKII-103Eli Beate LarsenNETZSCH STA449 JupiterThermal analysisElectrical conductivity furnaceKII-103Belma TalicElectrical conductivity furnace
Svein Sunde
FTIR spectrometerBruker Vertex 80vKII-323

Johannes Ofstad

Bruker Vertex 80v

Raman microscopeWITec alpha300 RKII-323

Johannes Ofstad

 WITec alpha300r

Anchor
Surface and particle analysis
Surface and particle analysis

Surface and particle analysis

Type of equipmentName of equipmentLocationContact personLink to more information
Surface and particle analysis
PSA Malvern 2000

3Flex 3500

KII-107
Jannicke Kvello
Elin AlbertsenBET
PSA Malvern 2000
Surface and particle analysisTRISTAR 3000 surface area and porosity analyzer KII-107Elin AlbertsenBET
LECOOxygen
Surface and
nitrogen
particle analysisPermeabilitetKII-
107
303Anne Støre (SINTEF)
LECOPycnometerAccupyc 1330KII-107Julian TolchardAccupyc 1330

XRD

D8 advance BrukerKII-113Julian TolchardD8 Advance BrukerXRDDa Vinci 1 BrukerKII-113Julian TolchardDa Vinci 1 BrukerXRDDa Vinci 2 BrukerKII-113Julian TolchardDa Vinci 2 BrukerXRDA-unit X-ray diffractometerKII-113Julian TolchardA-unit X-ray diffractometerXRDD8 focus SiemensKII-113Julian TolchardD8 focus SiemensThermal analysisOptisk dilatometer-Expert systemKII-119Anne StøreOptisk dilatometer-Expert systemThermal analysisLFA Microflash, termisk diffusivitetKII-119Anne StøreLFA Microflash, thermal diffusivitySurface and particle analysis

Zetapotensial- og partikkelstørrelse-måler

Beckman Coulter DelsaNano C

KII-223Magnus FølstadBeckman Coulter DelsaNano C

Glow Discharge Optical Emission Spectroscopy

GD-OES GD-profilerKII-307Maria StepanovaGD-OESOptical MicroscopeNikon SM2800KII-323 Nikon SM2800Optical MicroscopeLeica DM IRMKII-323  Optical microscopeZeiss   Optical microscopeWild Heerbrugg  

 

 

IR Spectroscropy

Bruker IFS66V

KII-014  UV-vis/NIR spektrofotometer + potensiostatPhotoelectrochemical station Magnus Følstad MassespektrometerPfeiffer Vacum Prisma Plus HiCube Morten Tjelta ViskositetsmålingHaake Mars Modular Advanced Rheometer System   ViskositetsmålingHaake Viskotester 550 Thermo Scientific   Optical microscopeLeica DMIL Trygve L SchancheLeica DMILOptical microscopeOlympus BH-2KII-032AStein Rørvik Optical microscopeReichert MeF3A med Sony kamera Stein Rørvik Optical microscopeOlympus BX60 Stein Rørvik Peizoelektriske målingerAix PES Piezoelectric evaluation   Optical microscopeLeica EZ4   Scanning electron microscopeHitachi S-3400NKII-036 Lv-sem Sem Sælandsvei (Hitachi S-3400N)


Surface analyzerDrop Shape Analyzer - DSA100KII-321Johannes OfstadDescription
Laser scattering particle size analyzerHoriba LA-960 ParticaKII-107Anita Britt OlsenDescription
Micro Scratch TesterST Instruments B AKII-321Johannes Ofstad
Density and volume analysisPycnometerKII-107Elin AlbertsenAccuPyc II 1340

Anchor
XRD
XRD

XRD

Info

More information about the XRD lab


Type of equipmentName of equipmentLocationContact personLink to more information
XRDRoutine Powder Diffractometer (DaVinci1)KII-113Contact personRoutine powder XRD
XRDPowder diffractometer (D8 Focus)KII-113Contact person9-pos Powder XRD
XRDThin-film Diffractometer (D8 Discover)KII-113Contact personD8 Discover
XRDMultipurpose Powder X-ray diffractometer (DaVinci2)KII-113Contact personMultipurpose XRD
XRDNon-ambient X-ray diffractometer (D8 Advance)KII-113Contact personNon-ambient XRD


Anchor
Solar cell silicon characterisation
Solar cell silicon characterisation

Solar cell silicon characterisation

Type of equipmentName of equipmentLocationContact personLink to more information
Si - CharacterisationNicolet 6700 FT-IRM-104Chiara Modanese
Si - CharacterisationµLPCD resistivty life time measurmentM-104Gaute Stokkan (SINTEF)
Si - CharacterisationSiWaScanM-104Gaute Stokkan (SINTEF)
Si - Characterisationmicro cracks characterisationM-104Kai Erik Ekstrøm
Si - Characterisation Crystal deffect mesurmentPVSCAN 6000M-104Gaute Stokkan (SINTEF)
Si - Characterisation Density ImagingCDI-CarrierM-104Gaute Stokkan (SINTEF)

Anchor
Inductively couple plasma mass spectrometry (ICP-MS)
Inductively couple plasma mass spectrometry (ICP-MS)

Inductively coupled plasma mass spectrometry (ICP-MS)

Type of equipmentName of equipmentLocationContact personLink to more information
ICP-MSPerkin Elmer NexION 5000KII-321

Shannen Thora Lea Sait

Henrik Ness


Electrical resistivity measurement

Type of equipmentName of equipmentLocationContact personLink to more information
Resistivity measurement (metals)SigmascopeE-508Berit Vinje Kramer