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Optical
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Optical Microscope
| Type of equipment | Name of equipment | Location | Contact person | Link to more information |
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| Optical microscope | Wild Heerbrugg | A-443 |
| Berit Vinje Kramer | ||
| Optical microscope | Leica MEF4M | E-514 |
| Berit Vinje Kramer | ||
| Optical microscope | Reichert-Jung Univar | E-514 |
| Berit Vinje Kramer |
| Optical microscope | Makroskop Leitz M400 | E-508 |
| Berit Vinje Kramer | ||
| Optical microscope | Leitz MM6 | E-508 |
| Berit Vinje Kramer |
| Optical microscope | Zeiss Axiovert 25 | E-508 |
| Berit Vinje Kramer | Zeiss Axiovert 25 | |
| Optical microscope | Leitz metalloplan | E-508 |
| Berit Vinje Kramer |
| Optical microscope | Leitz 1A | E-508 |
| Berit Vinje Kramer |
| Optical microscope | Reichert MEF1 | E-508 |
| Berit Vinje Kramer |
| Optical microscope | Leitz Metallux 3 | E-514A |
| Berit Vinje Kramer | Leitz Metallux 3 |
| Videokamera (2 stk) | JVC TK-S310 EG |
| KII- |
| 014 | Trygve L. Schanche |
| Videokamera til mikroskop | Leica R3 elecrt. | E-514A |
| Berit Vinje Kramer | ||
| Optical microscope | Leitz Axioskop | E-514A |
| Berit Vinje Kramer | Leitz Axioskop |
FE-SEM with Bruker EDS/NORDIF EBSD system
Hitachi SU6600
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FE-SEM with Bruker EDS/NORDIF EBSD system
Zeiss Ultra 55
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SEM with Nordif EBSD system
JEOL JSM 840A
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TEM with Gatan GIF system
JEOL TEM 2010
| Link in New Window | ||||
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SEM with Gatan CL system
JEOL JSM 840
| Optical Microscope | Nikon SM2800 | KII-323 | Eli Beate Larsen | |
| Optical Microscope | Leica DM IRM | KII-323 | Johannes Ofstad | |
| Optical microscope | Zeiss | KII-008 | Marthe Folstad | |
| Optical microscope | Leica DMIL | KII-022 | Andrey Kosinskiy | |
| Optical microscope | Olympus BH-2 | KII-032A | Stein Rørvik (SINTEF) | |
| Optical microscope | Reichert MeF3A med Sony kamera | KII-032A | Stein Rørvik (SINTEF) | |
| Optical microscope | Olympus BX60 | KII-032A | Stein Rørvik (SINTEF) | |
| Optical microscope | Leica EZ4 | KII-034B | Sergey Khromov | |
| Optical microscope | Wild Heerbrugg | KII-011 | ||
| Optical microscope 3D | Alicona Infinite Focus | KII-032A | Andrey Kosinskiy |
| Anchor | ||||
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Electron microscope
| Info |
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| Type of equipment | Name of equipment | Location | Contact person | Link to more information |
|---|---|---|---|---|
| Scanning Electron Microscopy | FE-SEM with Bruker EDS/NORDIF EBSD system Hitachi SU6600 | F-362 |
SEM with JEOL EDS system
JEOL JSM 6010LA
| Yingda Yu |
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| Scanning Electron Microscopy | FE-SEM |
with Bruker EDS/NORDIF EBSD system Zeiss |
Ultra 55 | F- |
| 362 | Yingda Yu |
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| Scanning Electron |
| Microscopy | SEM with Nordif EBSD |
system JEOL |
JSM 840A | F- |
| 362 |
| Yingda Yu |
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| Scanning |
AFM/STM
Agilent 5500
XRD
Zetapotensial- og partikkelstørrelse-måler
Beckman Coulter DelsaNano C
Glow Discharge Optical Emission Spectroscopy
Bruker IFS66V
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Electron microscope
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FE-SEM with Bruker EDS/NORDIF EBSD system
Hitachi SU6600
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| Link in New Window | ||||
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FE-SEM with Bruker EDS/NORDIF EBSD system
Zeiss Ultra 55
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| Link in New Window | ||||
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SEM with Nordif EBSD system
JEOL JSM 840A
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| Link in New Window | ||||
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TEM with Gatan GIF system
JEOL TEM 2010
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| Link in New Window | ||||
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SEM with Gatan CL system
JEOL JSM 840
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SEM with JEOL EDS system
JEOL JSM 6010LA
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| Link in New Window | ||||
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FE-SEM wirh EDAX EDS system
Zeiss Supra 55VP
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| Link in New Window | ||||
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FE-EPMA wirh JEOL WDS system
JEOL JXA 8500
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| Link in New Window | ||||
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AFM/STM
Agilent 5500
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XRD
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Zetapotensial- og partikkelstørrelse-måler
Beckman Coulter DelsaNano C
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Glow Discharge Optical Emission Spectroscopy
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Bruker IFS66V
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Lv-sem Sem Sælandsvei (Hitachi S-3400N)
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Scanning probe microscope
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FE-SEM with Bruker EDS/NORDIF EBSD system
Hitachi SU6600
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FE-SEM with Bruker EDS/NORDIF EBSD system
Zeiss Ultra 55
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| Link in New Window | ||||
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SEM with Nordif EBSD system
JEOL JSM 840A
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| Link in New Window | ||||
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TEM with Gatan GIF system
JEOL TEM 2010
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| Link in New Window | ||||
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SEM with Gatan CL system
JEOL JSM 840
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SEM with JEOL EDS system
JEOL JSM 6010LA
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| Link in New Window | ||||
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FE-SEM wirh EDAX EDS system
Zeiss Supra 55VP
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| Link in New Window | ||||
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FE-EPMA wirh JEOL WDS system
JEOL JXA 8500
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| Link in New Window | ||||
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AFM/STM
Agilent 5500
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XRD
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Zetapotensial- og partikkelstørrelse-måler
Beckman Coulter DelsaNano C
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Glow Discharge Optical Emission Spectroscopy
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Bruker IFS66V
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Lv-sem Sem Sælandsvei (Hitachi S-3400N)
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| Electron Microscopy | SEM with Gatan CL system JEOL JSM 840 | F-369 | Yingda Yu | |||||||
| Scanning Electron Microscopy | SEM with JEOL EDS system JEOL JSM 6010LA | F-369 | Yingda Yu |
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| Scanning Electron Microscopy | FE-SEM wirh EDAX EDS system Zeiss Supra 55VP | F-369 | Yingda Yu |
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| Scanning electron microscopy | Hitachi S-3400N | KII-036 | Sergey Khromov |
| Anchor | ||||
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Scanning probe microscope
| Type of equipment | Name of equipment | Location | Contact person | Link to more information | ||||||
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| Electron Micro Probe Analyzer | FE-EPMA wirh JEOL WDS system JEOL JXA 8500 | F-373 | Morten Raanes |
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| Scanning probe microscope | Agilent 5500 AFM/SPM microscope | KII-008 | Marthe Folstad | About the instrument |
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Transmission electron microscopy
| Info |
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| Type of equipment | Name of equipment | Location | Contact person | Link to more information |
|---|---|---|---|---|
| TEM with Gatan GIF system | JEOL TEM 2010 | F-368 | Yingda Yu |
| Anchor | ||||
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Thermal analysis
Forms to filled out: Request for use of TA instruments at IMA (office.com
TA-form: TA-analysis_form.pdf
General information:
Using steam as sample gas: Water vapor pressure Generator.pdf
| Type of equipment | Name of equipment | Location | Contact person | Link to more information |
|---|---|---|---|---|
| Thermal analysis | DTA/TGA Setaram Sensis | A-K032 | Sarina Bao (SINTEF) | |
| Thermal analysis | Electrical conductivity furnace | Pei Na Kui | ||
| Thermal analysis | NETZSCH dilatometer 402C, themal analysis | KII-103 | Pei Na Kui | |
| Thermal analysis | NETZSCH STA F3 449 Jupiter (Hugin) | KII-103 | Martin Oppegård | Instrument information |
| Thermal analysis | NETZSCH STA C 449 Jupiter, (Munin) | KII-103 | Martin Oppegård | |
| Thermal analysis | LINSEIS STA PT 1600, (Linseis) | KII-103 | Martin Oppegård | Instrument info |
| Thermal analysis | NETZSCH dilatometer 402E | KII-103 | Paul Inge Dahl (SINTEF) | |
| Thermal analysis | NETZSCH DSC 214 Polyma | KII-103 | Pei Na Kui | |
| Thermal analysis | Optisk dilatometer-Expert system | KII-103 | Anne Støre (SINTEF) | |
| Thermal analysis | LFA Microflash, termisk diffusivitet | KII-103 | Anne Støre (SINTEF) | |
| Thermal analysis | Dilatometer | KII-303 | Anne Støre (SINTEF) |
| Anchor | ||||
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Spectroscopy
| Type of equipment | Name of equipment | Location | Contact person | Link to more information |
|---|---|---|---|---|
| Glow discharge optical emission spectroscopy (GD-OES) | Horiba GD profiler 2 | KII-307 | Sergey Khromov | Glow discharge optical emission spectroscopy (GD-OES) Horiba GD Profiler 2 |
| Glow discharge mass spectrometry (GDMS) | Astrum GDMS (Nu Instruments, Ametek) | KII-307 | Sergey Khromov | Glow discharge mass spectrometry Astrum GDMS (Nu instruments, Ametek) |
| Mass spectrometer + potensiostat | Differential Electrochemical Mass Spectrometry (DEMS) station | KII-323 | Svein Sunde | |
| UV-vis/NIR spectrophotometer + potensiostat | Photoelectrochemical station | KII-008 | Svein Sunde | |
| FTIR spectrometer | Bruker Vertex 80v | KII-323 | ||
| Raman microscope | WITec alpha300 R | KII-323 | WITec alpha300r |
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Surface and particle analysis
| Type of equipment | Name of equipment | Location | Contact person | Link to more information |
|---|---|---|---|---|
| Surface and particle analysis | 3Flex 3500 | KII-107 | Elin Albertsen | BET |
| Surface and particle analysis | TRISTAR 3000 surface area and porosity analyzer | KII-107 | Elin Albertsen | BET |
| Surface and particle analysis | Permeabilitet | KII-303 | Anne Støre (SINTEF) | |
| Surface analyzer | Drop Shape Analyzer - DSA100 | KII-321 | Johannes Ofstad | Description |
| Laser scattering particle size analyzer | Horiba LA-960 Partica | KII-107 | Anita Britt Olsen | Description |
| Micro Scratch Tester | ST Instruments B A | KII-321 | Johannes Ofstad | |
| Density and volume analysis | Pycnometer | KII-107 | Elin Albertsen | AccuPyc II 1340 |
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XRD
| Info |
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| Type of equipment | Name of equipment | Location | Contact person | Link to more information |
|---|---|---|---|---|
| XRD | Routine Powder Diffractometer (DaVinci1) | KII-113 | Contact person | Routine powder XRD |
| XRD | Powder diffractometer (D8 Focus) | KII-113 | Contact person | 9-pos Powder XRD |
| XRD | Thin-film Diffractometer (D8 Discover) | KII-113 | Contact person | D8 Discover |
| XRD | Multipurpose Powder X-ray diffractometer (DaVinci2) | KII-113 | Contact person | Multipurpose XRD |
| XRD | Non-ambient X-ray diffractometer (D8 Advance) | KII-113 | Contact person | Non-ambient XRD |
| Anchor | ||||
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Solar cell silicon characterisation
| Type of equipment | Name of equipment | Location | Contact person | Link to more information |
|---|---|---|---|---|
| Si - Characterisation | Nicolet 6700 FT-IR | M-104 | Chiara Modanese | |
| Si - Characterisation | µLPCD resistivty life time measurment | M-104 | Gaute Stokkan (SINTEF) | |
| Si - Characterisation | SiWaScan | M-104 | Gaute Stokkan (SINTEF) | |
| Si - Characterisation | micro cracks characterisation | M-104 | Kai Erik Ekstrøm | |
| Si - Characterisation Crystal deffect mesurment | PVSCAN 6000 | M-104 | Gaute Stokkan (SINTEF) | |
| Si - Characterisation Density Imaging | CDI-Carrier | M-104 | Gaute Stokkan (SINTEF) |
| Anchor | ||||
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Inductively coupled plasma mass spectrometry (ICP-MS)
| Type of equipment | Name of equipment | Location | Contact person | Link to more information |
|---|---|---|---|---|
| ICP-MS | Perkin Elmer NexION 5000 | KII-321 | Henrik Ness |
Electrical resistivity measurement
| Type of equipment | Name of equipment | Location | Contact person | Link to more information |
|---|---|---|---|---|
| Resistivity measurement (metals) | Sigmascope | E-508 | Berit Vinje Kramer |
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Thermal analysis
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FE-SEM with Bruker EDS/NORDIF EBSD system
Hitachi SU6600
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| Link in New Window | ||||
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FE-SEM with Bruker EDS/NORDIF EBSD system
Zeiss Ultra 55
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| Link in New Window | ||||
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SEM with Nordif EBSD system
JEOL JSM 840A
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| Link in New Window | ||||
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TEM with Gatan GIF system
JEOL TEM 2010
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| Link in New Window | ||||
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SEM with Gatan CL system
JEOL JSM 840
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SEM with JEOL EDS system
JEOL JSM 6010LA
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| Link in New Window | ||||
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FE-SEM wirh EDAX EDS system
Zeiss Supra 55VP
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| Link in New Window | ||||
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FE-EPMA wirh JEOL WDS system
JEOL JXA 8500
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| Link in New Window | ||||
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AFM/STM
Agilent 5500
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XRD
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Zetapotensial- og partikkelstørrelse-måler
Beckman Coulter DelsaNano C
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Glow Discharge Optical Emission Spectroscopy
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Bruker IFS66V
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Lv-sem Sem Sælandsvei (Hitachi S-3400N)
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Spectroscopy
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FE-SEM with Bruker EDS/NORDIF EBSD system
Hitachi SU6600
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| Link in New Window | ||||
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FE-SEM with Bruker EDS/NORDIF EBSD system
Zeiss Ultra 55
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| Link in New Window | ||||
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SEM with Nordif EBSD system
JEOL JSM 840A
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| Link in New Window | ||||
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TEM with Gatan GIF system
JEOL TEM 2010
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| Link in New Window | ||||
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SEM with Gatan CL system
JEOL JSM 840
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SEM with JEOL EDS system
JEOL JSM 6010LA
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| Link in New Window | ||||
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FE-SEM wirh EDAX EDS system
Zeiss Supra 55VP
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| Link in New Window | ||||
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FE-EPMA wirh JEOL WDS system
JEOL JXA 8500
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| Link in New Window | ||||
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AFM/STM
Agilent 5500
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XRD
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Zetapotensial- og partikkelstørrelse-måler
Beckman Coulter DelsaNano C
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Glow Discharge Optical Emission Spectroscopy
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Bruker IFS66V
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Lv-sem Sem Sælandsvei (Hitachi S-3400N)
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Surface and particle analysis
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FE-SEM with Bruker EDS/NORDIF EBSD system
Hitachi SU6600
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| Link in New Window | ||||
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FE-SEM with Bruker EDS/NORDIF EBSD system
Zeiss Ultra 55
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| Link in New Window | ||||
|---|---|---|---|---|
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SEM with Nordif EBSD system
JEOL JSM 840A
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| Link in New Window | ||||
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TEM with Gatan GIF system
JEOL TEM 2010
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| Link in New Window | ||||
|---|---|---|---|---|
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SEM with Gatan CL system
JEOL JSM 840
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SEM with JEOL EDS system
JEOL JSM 6010LA
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| Link in New Window | ||||
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FE-SEM wirh EDAX EDS system
Zeiss Supra 55VP
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| Link in New Window | ||||
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FE-EPMA wirh JEOL WDS system
JEOL JXA 8500
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| Link in New Window | ||||
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AFM/STM
Agilent 5500
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XRD
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Zetapotensial- og partikkelstørrelse-måler
Beckman Coulter DelsaNano C
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Glow Discharge Optical Emission Spectroscopy
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Bruker IFS66V
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Lv-sem Sem Sælandsvei (Hitachi S-3400N)
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XRD
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FE-SEM with Bruker EDS/NORDIF EBSD system
Hitachi SU6600
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| Link in New Window | ||||
|---|---|---|---|---|
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FE-SEM with Bruker EDS/NORDIF EBSD system
Zeiss Ultra 55
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| Link in New Window | ||||
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SEM with Nordif EBSD system
JEOL JSM 840A
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| Link in New Window | ||||
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TEM with Gatan GIF system
JEOL TEM 2010
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| Link in New Window | ||||
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SEM with Gatan CL system
JEOL JSM 840
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SEM with JEOL EDS system
JEOL JSM 6010LA
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| Link in New Window | ||||
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FE-SEM wirh EDAX EDS system
Zeiss Supra 55VP
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| Link in New Window | ||||
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FE-EPMA wirh JEOL WDS system
JEOL JXA 8500
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| Link in New Window | ||||
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AFM/STM
Agilent 5500
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XRD
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Zetapotensial- og partikkelstørrelse-måler
Beckman Coulter DelsaNano C
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Glow Discharge Optical Emission Spectroscopy
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Bruker IFS66V
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Lv-sem Sem Sælandsvei (Hitachi S-3400N)
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Solar cell silicon characterisation
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