Optical Microscope
Type of equipment | Name of equipment | Location | Contact person | Link to more information |
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Element Analysis | GD-MS | E-208 | Chiara Modanese | GD-MS |
Surface and particle analysis | XRD Texture Analysis | A-347 | Torild KrogstadXRD Texture analysis | Optical microscope | Wild Heerbrugg | A-443 |
Trygve L. Schanche | Wild Heerbrugg | Leica MEF4MTrygve L. Schanche | Trygve L. Schanche | Reitchert-Jung Univar | Trygve L. Schanche | Makroskop Leitz M400 | Leitz MM6Trygve L. Schanche | Trygve L. Schanche Trygve L. Schanche | Leitz metalloplan | Leitz 1ATrygve L. Schanche | Trygve L. Schanche | Reitchert MEF1 | Trygve L. Schanche E514A Video camera |
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Videokamera til mikroskop | Leica R3 elecrt. | E-514A |
Trygve L. Schanche | Video camera for microscope | Trygve L. Schanche | Leitz Axioskop | Berit Vinje Kramer | Leitz Axioskop |
Optical Microscope | Nikon SM2800 | KII-323 | Eli Beate Larsen |
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Optical Microscope | Leica DM IRM | KII-323 | Johannes Ofstad |
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Optical microscope | Zeiss | KII-008 | Marthe Folstad |
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Optical microscope | Leica DMIL | KII-022 | Andrey Kosinskiy |
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Optical microscope | Olympus BH-2 | KII-032A | Stein Rørvik (SINTEF) |
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Optical microscope | Reichert MeF3A med Sony kamera | KII-032A | Stein Rørvik (SINTEF) |
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Optical microscope | Olympus BX60 | KII-032A | Stein Rørvik (SINTEF) |
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Optical microscope | Leica EZ4 | KII-034B | Sergey Khromov |
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Optical microscope | Wild Heerbrugg | KII-011 |
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Optical microscope 3D | Alicona Infinite Focus | KII-032A | Andrey Kosinskiy |
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| Electron microscope |
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| Electron microscope |
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Electron microscope
Type of equipment | Name of equipment | Location | Contact person | Link to more information |
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Scanning Electron Microscopy | FE-SEM with Bruker EDS/NORDIF EBSD system Hitachi SU6600 | F-362 | Yingda Yu | Link in New Window |
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linkText | Hitachi SU6600 FEG SEM |
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href | http://www.material.ntnu.no/lab/material/equipment/HitachiFEG.jpg |
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Scanning Electron Microscopy | FE-SEM with Bruker EDS/NORDIF EBSD system Zeiss Ultra 55 | F-362 | Yingda Yu | Link in New Window |
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linkText | Fe-sem (Zeiss Ultra 55 LE) |
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href | http://www.material.ntnu.no/lab/material/equipment/ULTRA_Technical.pdf |
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Scanning Electron Microscopy | SEM with Nordif EBSD system JEOL JSM 840A | F-362 | Yingda Yu | Link in New Window |
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linkText | SEM A (JSM 840) |
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href | http://www.material.ntnu.no/lab/material/equipment/ProdInfoSEM_A |
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.pdfTransmission Electron Microscopy | TEM with Gatan GIF system JEOL TEM 2010 | F-368 | Yingda Yu | Link in New Window |
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linkText | TEM (JEOL, JEM-2010) |
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href | https://www.ntnu.no/wiki/download/attachments/67474571/TEMinfo?version=1&modificationDate=1409311611000&api=v2 |
Scanning Electron Microscopy | SEM with Gatan CL system JEOL JSM 840 | F-369 | Yingda Yu |
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Scanning Electron Microscopy | SEM with JEOL EDS system JEOL JSM 6010LA | F-369 | Yingda Yu | Link in New Window |
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linkText | EDS, EDAX Gernesis |
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href | http://edax.com/ |
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Scanning Electron Microscopy | FE-SEM wirh EDAX EDS system Zeiss Supra 55VP | F-369 | Yingda Yu | Link in New Window |
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linkText | LV-Fe-SEM (ZeissSupra 55 VP) |
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href | http://www.material.ntnu.no/lab/material/equipment/ProdInfoFE-SEM.pdf |
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Scanning electron microscopy | Hitachi S-3400N | KII-036 | Sergey Khromov |
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| Scanning probe microscope |
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| Scanning probe microscope |
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Scanning probe microscope
Type of equipment | Name of equipment | Location | Contact person | Link to more information |
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Electron Micro Probe Analyzer | FE-EPMA wirh JEOL WDS system JEOL JXA 8500 | F-373 | Morten Raanes | Link in New Window |
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linkText | JEOL JXA-8500F Electron Probe Micro analyzer (EPMA) |
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href | http://www.material.ntnu.no/lab/material/equipment/ProdInfoEPMA.pdf |
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Scanning probe microscope | Agilent 5500 AFM/ |
STMAgilent 5500003AMagnus Følstad | SPM Agilent 5500 | UV-vis/NIR spektrofotometer + potensiostat | Photoelectrochemical station | KII-014 | Magnus Følstad | Photoelectrochemical station |
Thermal analysis | Perkin Elmer Diffential scanning calorimeter | KII-103 | Sverre Magnus Selback | Perkin Elmer Diffential scanning calorimeter |
Thermal analysis | High temperature oxygen flux furnace | KII-103 | Belma Talic | High temperature oxygen flux furnaceTransmission electron microscopy
Type of equipment | Name of equipment | Location | Contact person | Link to more information |
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TEM with Gatan GIF system | JEOL TEM 2010 | F-368 | Yingda Yu |
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| Thermal analysis |
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| Thermal analysis |
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Thermal analysis
Forms to filled out: Request for use of TA instruments at IMA (office.com
TA-form: TA-analysis_form.pdf
General information:
Using steam as sample gas: Water vapor pressure Generator.pdf
Type of equipment | Name of equipment | Location | Contact person | Link to more information |
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Thermal analysis | DTA/TGA Setaram Sensis | A-K032 | Sarina Bao (SINTEF) |
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Thermal analysis | Electrical conductivity furnace |
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Thermal analysis | NETZSCH dilatometer |
402E402C, themal analysis | KII-103 |
Ove Darell | NETZSCH Dilatometer 402E | dilatometer 402CSTA F3 449 Jupiter (Hugin) | KII-103 |
Eli Beate Larsen | NETZSCH Dilatometer 402C STA449 jupiterNETZSCH STA449 JupiterSTA C 449 Jupiter, (Munin) | KII-103 |
Eli Beate Larsen | Electrical conductivity furnaceLINSEIS STA PT 1600, (Linseis) | KII-103 |
Belma Talic | Electrical conductivity furnace | Surface and particle analysis | PSA Malvern 2000 | KII-107 | Jannicke Kvello | PSA Malvern 2000 |
Surface and particle analysis | TRISTAR 3000 surface area and porosity analyzer | KII-107 | Elin Albertsen | BET |
LECO | Oxygen and nitrogen analysis | KII-107 | Anne Støre | LECO |
Pycnometer | Accupyc 1330 | KII-107 | Julian Tolchard | Accupyc 1330 |
XRD | D8 advance Bruker | KII-113 | Julian Tolchard | D8 Advance Bruker |
XRD | Da Vinci 1 Bruker | KII-113 | Julian Tolchard | Da Vinci 1 Bruker |
XRD | Da Vinci 2 Bruker | KII-113 | Julian Tolchard | Da Vinci 2 Bruker |
XRD | A-unit X-ray diffractometer | KII-113 | Julian Tolchard | A-unit X-ray diffractometer |
XRD | D8 focus Siemens | KII-113 | Julian Tolchard | D8 focus Siemens |
Thermal analysis | Optisk dilatometer-Expert system | KII-119 | Anne Støre | Optisk dilatometer-Expert system |
Thermal analysis | LFA Microflash, termisk diffusivitet | KII-119 | Anne Støre | |
Surface and particle analysis | Zetapotensial- og partikkelstørrelse-måler Beckman Coulter DelsaNano C | KII-223 | Magnus Følstad | |
Glow Discharge Optical Emission Spectroscopy | GD-OES GD-profiler | KII-307 | Maria Stepanova | |
Optical Microscope | Nikon SM2800 | KII-323 | | |
Optical Microscope | Leica DM IRM | KII-323 | | |
Optical microscope | Zeiss | | | |
Optical microscope | Wild Heerbrugg | | | |
IR Spectroscropy | Bruker IFS66V | KII-014 | | |
UV-vis/NIR spektrofotometer + potensiostat | Photoelectrochemical station | | Magnus Følstad | |
Massespektrometer | Pfeiffer Vacum Prisma Plus HiCube | | Morten Tjelta | |
Viskositetsmåling | Haake Mars Modular Advanced Rheometer System | | | |
Viskositetsmåling | Haake Viskotester 550 Thermo Scientific | | | |
Optical microscope | Leica DMIL | | Trygve L Schanche | Leica DMIL |
Optical microscope | Olympus BH-2 | KII-032A | Stein Rørvik | |
Optical microscope | Reichert MeF3A med Sony kamera | | Stein Rørvik | |
Optical microscope | Olympus BX60 | | Stein Rørvik | |
Peizoelektriske målinger | Aix PES Piezoelectric evaluation | | | |
Optical microscope | Leica EZ4 | | | |
Scanning electron microscope | Hitachi S-3400N | KII-036 | | Lv-sem Sem Sælandsvei (Hitachi S-3400N) |
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Martin Oppegård | Instrument info |
Thermal analysis | NETZSCH dilatometer 402E | KII-103 | Paul Inge Dahl (SINTEF) |
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Thermal analysis | NETZSCH DSC 214 Polyma | KII-103 | Pei Na Kui |
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Thermal analysis | Optisk dilatometer-Expert system | KII-103 | Anne Støre (SINTEF) |
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Thermal analysis | LFA Microflash, termisk diffusivitet | KII-103 | Anne Støre (SINTEF) |
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Thermal analysis | Dilatometer | KII-303 | Anne Støre (SINTEF) |
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Spectroscopy
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| Surface and particle analysis |
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| Surface and particle analysis |
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Surface and particle analysis
Type of equipment | Name of equipment | Location | Contact person | Link to more information |
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Surface and particle analysis | 3Flex 3500 | KII-107 | Elin Albertsen | BET |
Surface and particle analysis | TRISTAR 3000 surface area and porosity analyzer | KII-107 | Elin Albertsen | BET |
Surface and particle analysis | Permeabilitet | KII-303 | Anne Støre (SINTEF) |
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Surface analyzer | Drop Shape Analyzer - DSA100 | KII-321 | Johannes Ofstad | Description |
Laser scattering particle size analyzer | Horiba LA-960 Partica | KII-107 | Anita Britt Olsen | Description |
Micro Scratch Tester | ST Instruments B A | KII-321 | Johannes Ofstad |
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Density and volume analysis | Pycnometer | KII-107 | Elin Albertsen | AccuPyc II 1340 |
XRD
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| Solar cell silicon characterisation |
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| Solar cell silicon characterisation |
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Solar cell silicon characterisation
Type of equipment | Name of equipment | Location | Contact person | Link to more information |
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Si - Characterisation | Nicolet 6700 FT-IR | M-104 | Chiara Modanese |
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Si - Characterisation | µLPCD resistivty life time measurment | M-104 | Gaute Stokkan (SINTEF) |
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Si - Characterisation | SiWaScan | M-104 | Gaute Stokkan (SINTEF) |
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Si - Characterisation | micro cracks characterisation | M-104 | Kai Erik Ekstrøm |
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Si - Characterisation Crystal deffect mesurment | PVSCAN 6000 | M-104 | Gaute Stokkan (SINTEF) |
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Si - Characterisation Density Imaging | CDI-Carrier | M-104 | Gaute Stokkan (SINTEF) |
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| Inductively couple plasma mass spectrometry (ICP-MS) |
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| Inductively couple plasma mass spectrometry (ICP-MS) |
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Inductively coupled plasma mass spectrometry (ICP-MS)
Type of equipment | Name of equipment | Location | Contact person | Link to more information |
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ICP-MS | Perkin Elmer NexION 5000 | KII-321 | Shannen Thora Lea Sait Henrik Ness |
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Electrical resistivity measurement
Type of equipment | Name of equipment | Location | Contact person | Link to more information |
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Resistivity measurement (metals) | Sigmascope | E-508 | Berit Vinje Kramer |
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