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Optical Microscope

Type of equipmentName of equipmentLocationContact personLink to more information
Element AnalysisGD-MSE-208Chiara Modanese Surface and particle analysisXRD Texture Analysis
A-347Torild Krogstad 
Optical microscopeWild HeerbruggA-443
Trygve L. Schanche 
Berit Vinje Kramer
Optical microscopeLeica MEF4ME-514
Trygve L. Schanche   
Berit Vinje Kramer  
Optical microscopeReichert-Jung UnivarE-514
Trygve L. Schanche    
Berit Vinje Kramer  
Optical microscopeMakroskop Leitz M400E-508
Trygve L. Schanche   
Berit Vinje Kramer  
Optical microscopeLeitz MM6E-508
Trygve L. Schanche  
Berit Vinje Kramer  
Optical microscopeZeiss Axiovert 25E-508
Trygve L. Schanche   
Berit Vinje Kramer  Zeiss Axiovert 25
Optical microscopeLeitz metalloplanE-508
Trygve L. Schanche   
Berit Vinje Kramer  
Optical microscopeLeitz 1AE-508
Trygve L. Schanche   
Berit Vinje Kramer  
Optical microscopeReichert MEF1E-508
Trygve L. Schanche  
Berit Vinje Kramer  
Optical microscopeLeitz Metallux 3E-514A
Trygve L. Schanche  
Berit Vinje Kramer  Leitz Metallux 3
Videokamera (2 stk)JVC TK-S310 EG
E
KII-
514A
014Trygve L. Schanche
    
  
Videokamera til mikroskopLeica R3 elecrt.E-514A
Trygve L. Schanche  
Berit Vinje Kramer  
Optical microscopeLeitz AxioskopE-514A
Trygve L. Schanche  Leitz Axioskop
Berit Vinje Kramer  Leitz Axioskop
Optical MicroscopeNikon SM2800KII-323Eli Beate Larsen
Optical MicroscopeLeica DM IRMKII-323Johannes Ofstad
Optical microscopeZeissKII-008Marthe Folstad
Optical microscopeLeica DMILKII-022Andrey Kosinskiy
Optical microscopeOlympus BH-2KII-032AStein Rørvik (SINTEF)
Optical microscopeReichert MeF3A med Sony kameraKII-032AStein Rørvik (SINTEF)
Optical microscopeOlympus BX60KII-032AStein Rørvik (SINTEF)
Optical microscopeLeica EZ4KII-034BSergey Khromov
Optical microscopeWild HeerbruggKII-011

Optical microscope 3DAlicona Infinite FocusKII-032AAndrey Kosinskiy

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Electron microscope
Electron microscope

Electron microscope

Info

More information on SEM - TEM

EMlab


Type of equipmentName of equipmentLocationContact personLink to more information
Scanning Electron Microscopy

FE-SEM with Bruker EDS/NORDIF EBSD system

Hitachi SU6600

F-362Yingda Yu

Link in New Window
linkTextHitachi SU6600 FEG SEM
hrefhttp://www.material.ntnu.no/lab/material/equipment/HitachiFEG.jpg


Scanning Electron Microscopy

FE-SEM with Bruker EDS/NORDIF EBSD system

Zeiss Ultra 55

F-362Yingda Yu
Link in New Window
linkTextFe-sem (Zeiss Ultra 55 LE)
hrefhttp://www.material.ntnu.no/lab/material/equipment/ULTRA_Technical.pdf
Scanning Electron Microscopy

SEM with Nordif EBSD system

JEOL JSM 840A

F-362Yingda Yu
Link in New Window
linkTextSEM A (JSM 840)
hrefhttp://www.material.ntnu.no/lab/material/equipment/ProdInfoSEM_A.pdf
Transmission Electron Microscopy

TEM with Gatan GIF system

JEOL TEM 2010
F-368Yingda Yu
Link in New Window
linkTextTEM (JEOL, JEM-2010)
hrefhttps://www.ntnu.no/wiki/download/attachments/67474571/TEMinfo.pdf?version=1&modificationDate=1409311611000&api=v2
Scanning Electron Microscopy

SEM with Gatan CL system

JEOL JSM 840

F-369Yingda Yu
 

Scanning Electron Microscopy

SEM with JEOL EDS system

JEOL JSM 6010LA

F-369Yingda Yu
Link in New Window
linkTextEDS, EDAX Gernesis
hrefhttp://edax.com/
Scanning Electron Microscopy

FE-SEM wirh EDAX EDS system

Zeiss Supra 55VP

F-369Yingda Yu
Link in New Window
linkTextLV-Fe-SEM (ZeissSupra 55 VP)
hrefhttp://www.material.ntnu.no/lab/material/equipment/ProdInfoFE-SEM.pdf
Scanning electron microscopyHitachi S-3400NKII-036Sergey Khromov

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Scanning probe microscope
Scanning probe microscope

Scanning probe microscope

Type of equipmentName of equipmentLocationContact personLink to more information
Electron Micro Probe Analyzer

FE-EPMA wirh JEOL WDS system

JEOL JXA 8500

F-373Morten Raanes
Link in New Window
linkTextJEOL JXA-8500F Electron Probe Micro analyzer (EPMA)
hrefhttp://www.material.ntnu.no/lab/material/equipment/ProdInfoEPMA.pdf
Scanning probe microscopeAgilent 5500 AFM/
STMAgilent 5500
SPM microscopeKII-
003AMagnus Følstad

 

 

008Marthe FolstadAbout the instrument

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TEM
TEM

Transmission electron microscopy

Info

More information on SEM - TEM

EMlab


Type of equipmentName of equipmentLocationContact personLink to more information
TEM with Gatan GIF systemJEOL TEM 2010F-368Yingda Yu

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Thermal analysis
Thermal analysis

Thermal analysis

Forms to filled out: Request for use of TA instruments at IMA (office.com

TA-form:  TA-analysis_form.pdf

General information:

Using steam as sample gas: Water vapor pressure Generator.pdf

Type of equipmentName of equipmentLocationContact personLink to more information
Thermal analysisDTA/TGA Setaram SensisA-K032Sarina Bao (SINTEF)
Thermal analysisElectrical conductivity furnace
Pei Na Kui
UV-vis/NIR spektrofotometer + potensiostatPhotoelectrochemical stationKII-014Magnus Følstad

 

 

Thermal analysisPerkin Elmer Diffential scanning calorimeterKII-103Sverre Magnus Selback Thermal analysisHigh temperature oxygen flux furnaceKII-103Belma Talic 

Thermal analysisNETZSCH dilatometer
402E
402C, themal analysisKII-103
Ove Darell 
Pei Na Kui
Thermal analysisNETZSCH
dilatometer 402C
STA F3 449 Jupiter (Hugin)KII-103
Eli Beate Larsen
Martin OppegårdInstrument information
 
Thermal analysisNETZSCH
STA449 jupiter 
STA C 449 Jupiter, (Munin)KII-103
Eli Beate Larsen
Martin Oppegård
Thermal analysis
NETZSCH STA449 jupiter
LINSEIS STA PT 1600, (Linseis)KII-103
Eli Beate Larsen
Martin OppegårdInstrument info
 
Thermal analysis
Electrical conductivity furnace
NETZSCH dilatometer 402EKII-103
Belma Talic Surface and particle analysisPSA Malvern 2000
Paul Inge Dahl (SINTEF)
Thermal analysisNETZSCH DSC 214 Polyma KII-
107Jannicke Kvello Surface and particle analysisTRISTAR 3000 surface area and porosity analyzer KII-107Elin AlbertsenBETLECOOxygen and nitrogen analysisKII-107Anne Støre PycnometerAccupyc 1330KII-107Julian Tolchard 

XRD

D8 advance BrukerKII-113Julian Tolchard XRDDa Vinci 1 BrukerKII-113Julian Tolchard XRDDa Vinci 2 BrukerKII-113Julian Tolchard XRDA-unit X-ray diffractometerKII-113Julian Tolchard XRDD8 focus SiemensKII-113Julian Tolchard Thermal analysisOptisk dilatometer-Expert systemKII-119Anne Støre Thermal analysisLFA Microflash, termisk diffusivitetKII-119Anne Støre Surface and particle analysis

Zetapotensial- og partikkelstørrelse-måler

Beckman Coulter DelsaNano C

KII-223Magnus Følstad 

Glow Discharge Optical Emission Spectroscopy

GD-OES GD-profilerKII-307Maria Stepanova Optical MicroscopeNikon SM2800KII-323  Optical MicroscopeLeica DM IRMKII-323  Optical microscopeZeiss   Optical microscopeWild Heerbrugg  

 

 

IR Spectroscropy

Bruker IFS66V

KII-014  UV-vis/NIR spektrofotometer + potensiostatPhotoelectrochemical station Magnus Følstad MassespektrometerPfeiffer Vacum Prisma Plus HiCube Morten Tjelta ViskositetsmålingHaake Mars Modular Advanced Rheometer System   ViskositetsmålingHaake Viskotester 550 Thermo Scientific   Optical microscopeLeica DMIL Trygve L Schanche Optical microscopeOlympus BH-2KII-032AStein Rørvik Optical microscopeReichert MeF3A med Sony kamera Stein Rørvik Optical microscopeOlympus BX60 Stein Rørvik Peizoelektriske målingerAix PES Piezoelectric evaluation   Optical microscopeLeica EZ4   Scanning electron microscopeHitachi S-3400NKII-036 

Lv-sem Sem Sælandsvei (Hitachi S-3400N)

...

103Pei Na Kui
Thermal analysisOptisk dilatometer-Expert systemKII-103Anne Støre (SINTEF)
Thermal analysisLFA Microflash, termisk diffusivitetKII-103Anne Støre (SINTEF)
Thermal analysisDilatometerKII-303Anne Støre (SINTEF)

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Spectroscopy
Spectroscopy

Spectroscopy

Type of equipmentName of equipmentLocationContact personLink to more information
Glow discharge optical emission spectroscopy (GD-OES)Horiba GD profiler 2KII-307Sergey Khromov Glow discharge optical emission spectroscopy (GD-OES) Horiba GD Profiler 2
Glow discharge mass spectrometry (GDMS)Astrum GDMS (Nu Instruments, Ametek)KII-307Sergey Khromov Glow discharge mass spectrometry Astrum GDMS (Nu instruments, Ametek)
Mass spectrometer + potensiostatDifferential Electrochemical Mass Spectrometry (DEMS) stationKII-323Svein Sunde
UV-vis/NIR spectrophotometer + potensiostatPhotoelectrochemical stationKII-008Svein Sunde
FTIR spectrometerBruker Vertex 80vKII-323

Johannes Ofstad

Bruker Vertex 80v

Raman microscopeWITec alpha300 RKII-323

Johannes Ofstad

 WITec alpha300r

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Surface and particle analysis
Surface and particle analysis

Surface and particle analysis

Type of equipmentName of equipmentLocationContact personLink to more information
Surface and particle analysis

3Flex 3500

KII-107Elin AlbertsenBET
Surface and particle analysisTRISTAR 3000 surface area and porosity analyzer KII-107Elin AlbertsenBET
Surface and particle analysisPermeabilitetKII-303Anne Støre (SINTEF)


Surface analyzerDrop Shape Analyzer - DSA100KII-321Johannes OfstadDescription
Laser scattering particle size analyzerHoriba LA-960 ParticaKII-107Anita Britt OlsenDescription
Micro Scratch TesterST Instruments B AKII-321Johannes Ofstad
Density and volume analysisPycnometerKII-107Elin AlbertsenAccuPyc II 1340

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XRD
XRD

XRD

Info

More information about the XRD lab


Type of equipmentName of equipmentLocationContact personLink to more information
XRDRoutine Powder Diffractometer (DaVinci1)KII-113Contact personRoutine powder XRD
XRDPowder diffractometer (D8 Focus)KII-113Contact person9-pos Powder XRD
XRDThin-film Diffractometer (D8 Discover)KII-113Contact personD8 Discover
XRDMultipurpose Powder X-ray diffractometer (DaVinci2)KII-113Contact personMultipurpose XRD
XRDNon-ambient X-ray diffractometer (D8 Advance)KII-113Contact personNon-ambient XRD


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Solar cell silicon characterisation
Solar cell silicon characterisation

Solar cell silicon characterisation

Type of equipmentName of equipmentLocationContact personLink to more information
Si - CharacterisationNicolet 6700 FT-IRM-104Chiara Modanese
Si - CharacterisationµLPCD resistivty life time measurmentM-104Gaute Stokkan (SINTEF)
Si - CharacterisationSiWaScanM-104Gaute Stokkan (SINTEF)
Si - Characterisationmicro cracks characterisationM-104Kai Erik Ekstrøm
Si - Characterisation Crystal deffect mesurmentPVSCAN 6000M-104Gaute Stokkan (SINTEF)
Si - Characterisation Density ImagingCDI-CarrierM-104Gaute Stokkan (SINTEF)

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Inductively couple plasma mass spectrometry (ICP-MS)
Inductively couple plasma mass spectrometry (ICP-MS)

Inductively coupled plasma mass spectrometry (ICP-MS)

Type of equipmentName of equipmentLocationContact personLink to more information
ICP-MSPerkin Elmer NexION 5000KII-321

Shannen Thora Lea Sait

Henrik Ness


Electrical resistivity measurement

Type of equipmentName of equipmentLocationContact personLink to more information
Resistivity measurement (metals)SigmascopeE-508Berit Vinje Kramer