Versions Compared

Key

  • This line was added.
  • This line was removed.
  • Formatting was changed.

...

Type of equipmentName of equipmentLocationContact personLink to more information
Optical microscopeWild HeerbruggA-443Berit Vinje KramerJohannes Ljosdal Havmo
Optical microscopeLeica MEF4ME-514Berit Vinje Kramer  Johannes Ljosdal Havmo
Optical microscopeReichert-Jung UnivarE-514Berit Vinje Kramer  Johannes Ljosdal Havmo
Optical microscopeMakroskop Leitz M400E-508Berit Vinje Kramer  Johannes Ljosdal Havmo
Optical microscopeLeitz MM6E-508Berit Vinje Kramer  Johannes Ljosdal Havmo
Optical microscopeZeiss Axiovert 25E-508Berit Vinje Kramer  Johannes Ljosdal HavmoZeiss Axiovert 25
Optical microscopeLeitz metalloplanE-508Berit Vinje Kramer  Johannes Ljosdal Havmo
Optical microscopeLeitz 1AE-508Berit Vinje Kramer  Johannes Ljosdal Havmo
Optical microscopeReichert MEF1E-508Berit Vinje Kramer  Johannes Ljosdal Havmo
Optical microscopeLeitz Metallux 3E-514ABerit Vinje Kramer  Johannes Ljosdal HavmoLeitz Metallux 3
Videokamera (2 stk)JVC TK-S310 EGKII-014Trygve L. Schanche  
Videokamera til mikroskopLeica R3 elecrt.E-514ABerit Vinje Kramer  Johannes Ljosdal Havmo
Optical microscopeLeitz AxioskopE-514ABerit Vinje Kramer  Johannes Ljosdal HavmoLeitz Axioskop
Optical MicroscopeNikon SM2800KII-323Eli Beate Larsen
Optical MicroscopeLeica DM IRMKII-323Johannes Ofstad
Optical microscopeZeissKII-008Marthe Folstad
Optical microscopeLeica DMILKII-022Andrey Kosinskiy
Optical microscopeOlympus BH-2KII-032AStein Rørvik (SINTEF)
Optical microscopeReichert MeF3A med Sony kameraKII-032AStein Rørvik (SINTEF)
Optical microscopeOlympus BX60KII-032AStein Rørvik (SINTEF)
Optical microscopeLeica EZ4KII-034BSergey Khromov
Optical microscopeWild HeerbruggKII-011

Optical microscope 3DAlicona Infinite FocusKII-032AAndrey Kosinskiy

...

Type of equipmentName of equipmentLocationContact personLink to more information
Surface and particle analysis

3Flex 3500

KII-107Elin AlbertsenBET
Surface and particle analysisTRISTAR 3000 surface area and porosity analyzer KII-107Elin AlbertsenBET
Surface and particle analysisPermeabilitetKII-303Anne Støre (SINTEF)


Surface analyzerDrop Shape Analyzer - DSA100KII-321Johannes OfstadDescription
Laser scattering particle size analyzerHoriba LA-960 ParticaKII-107Anita Britt OlsenDescription
Micro Scratch TesterST Instruments B AKII-321Johannes Ofstad
Density and volume analysisPycnometerKII-107Elin AlbertsenAccuPyc II 1340

Anchor
XRD
XRD

XRD

Info

More information about the XRD lab


Type of equipmentName of equipmentLocationContact personLink to more information
XRDRoutine Powder Diffractometer (DaVinci1)KII-113Contact personRoutine powder XRD
XRDPowder diffractometer (D8 Focus)KII-113Contact person9-pos Powder XRD
XRDThin-film Diffractometer (D8 Discover)KII-113Contact personD8 Discover
XRDMultipurpose Powder X-ray diffractometer (DaVinci2)KII-113Contact personMultipurpose XRD
XRDNon-ambient X-ray diffractometer (D8 Advance)KII-113Contact personNon-ambient XRD

...

Inductively coupled plasma mass spectrometry (ICP-MS)

Type of equipmentName of equipmentLocationContact personLink to more information
ICP-MSPerkin Elmer NexION 5000KII-321

Shannen Thora Lea Sait

Henrik Ness


Electrical resistivity measurement

Type of equipmentName of equipmentLocationContact personLink to more information
Resistivity measurement (metals)SigmascopeE-508Berit Vinje KramerJohannes Ljosdal Havmo