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Type of equipment | Name of equipment | Location | Contact person | Link to more information |
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Optical microscope | Wild Heerbrugg | A-443 | Berit Vinje KramerJohannes Ljosdal Havmo | |
Optical microscope | Leica MEF4M | E-514 | Berit Vinje Kramer Johannes Ljosdal Havmo | |
Optical microscope | Reichert-Jung Univar | E-514 | Berit Vinje Kramer Johannes Ljosdal Havmo | |
Optical microscope | Makroskop Leitz M400 | E-508 | Berit Vinje Kramer Johannes Ljosdal Havmo | |
Optical microscope | Leitz MM6 | E-508 | Berit Vinje Kramer Johannes Ljosdal Havmo | |
Optical microscope | Zeiss Axiovert 25 | E-508 | Berit Vinje Kramer Johannes Ljosdal Havmo | Zeiss Axiovert 25 |
Optical microscope | Leitz metalloplan | E-508 | Berit Vinje Kramer Johannes Ljosdal Havmo | |
Optical microscope | Leitz 1A | E-508 | Berit Vinje Kramer Johannes Ljosdal Havmo | |
Optical microscope | Reichert MEF1 | E-508 | Berit Vinje Kramer Johannes Ljosdal Havmo | |
Optical microscope | Leitz Metallux 3 | E-514A | Berit Vinje Kramer Johannes Ljosdal Havmo | Leitz Metallux 3 |
Videokamera (2 stk) | JVC TK-S310 EG | KII-014 | Trygve L. Schanche | |
Videokamera til mikroskop | Leica R3 elecrt. | E-514A | Berit Vinje Kramer Johannes Ljosdal Havmo | |
Optical microscope | Leitz Axioskop | E-514A | Berit Vinje Kramer Johannes Ljosdal Havmo | Leitz Axioskop |
Optical Microscope | Nikon SM2800 | KII-323 | Eli Beate Larsen | |
Optical Microscope | Leica DM IRM | KII-323 | Johannes Ofstad | |
Optical microscope | Zeiss | KII-008 | Marthe Folstad | |
Optical microscope | Leica DMIL | KII-022 | Andrey Kosinskiy | |
Optical microscope | Olympus BH-2 | KII-032A | Stein Rørvik (SINTEF) | |
Optical microscope | Reichert MeF3A med Sony kamera | KII-032A | Stein Rørvik (SINTEF) | |
Optical microscope | Olympus BX60 | KII-032A | Stein Rørvik (SINTEF) | |
Optical microscope | Leica EZ4 | KII-034B | Sergey Khromov | |
Optical microscope | Wild Heerbrugg | KII-011 | ||
Optical microscope 3D | Alicona Infinite Focus | KII-032A | Andrey Kosinskiy |
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Type of equipment | Name of equipment | Location | Contact person | Link to more information |
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Surface and particle analysis | 3Flex 3500 | KII-107 | Elin Albertsen | BET |
Surface and particle analysis | TRISTAR 3000 surface area and porosity analyzer | KII-107 | Elin Albertsen | BET |
Surface and particle analysis | Permeabilitet | KII-303 | Anne Støre (SINTEF) | |
Surface analyzer | Drop Shape Analyzer - DSA100 | KII-321 | Johannes Ofstad | Description |
Laser scattering particle size analyzer | Horiba LA-960 Partica | KII-107 | Anita Britt Olsen | Description |
Micro Scratch Tester | ST Instruments B A | KII-321 | Johannes Ofstad | |
Density and volume analysis | Pycnometer | KII-107 | Elin Albertsen | AccuPyc II 1340 |
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XRD
Info |
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Type of equipment | Name of equipment | Location | Contact person | Link to more information |
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XRD | Routine Powder Diffractometer (DaVinci1) | KII-113 | Contact person | Routine powder XRD |
XRD | Powder diffractometer (D8 Focus) | KII-113 | Contact person | 9-pos Powder XRD |
XRD | Thin-film Diffractometer (D8 Discover) | KII-113 | Contact person | D8 Discover |
XRD | Multipurpose Powder X-ray diffractometer (DaVinci2) | KII-113 | Contact person | Multipurpose XRD |
XRD | Non-ambient X-ray diffractometer (D8 Advance) | KII-113 | Contact person | Non-ambient XRD |
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Inductively coupled plasma mass spectrometry (ICP-MS)
Type of equipment | Name of equipment | Location | Contact person | Link to more information |
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ICP-MS | Perkin Elmer NexION 5000 | KII-321 | Henrik Ness |
Electrical resistivity measurement
Type of equipment | Name of equipment | Location | Contact person | Link to more information |
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Resistivity measurement (metals) | Sigmascope | E-508 | Berit Vinje KramerJohannes Ljosdal Havmo |