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Thermal analysis
Forms to filled out: Request for use of TA instruments at IMA (office.com)
TA-form: TA-analysis_form.pdf
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Type of equipment | Name of equipment | Location | Contact person | Link to more information |
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Surface and particle analysis | 3Flex 3500 | KII-107 | Elin Albertsen | BET |
Surface and particle analysis | TRISTAR 3000 surface area and porosity analyzer | KII-107 | Elin Albertsen | BET |
Surface and particle analysis | Permeabilitet | KII-303 | Anne Støre (SINTEF) |
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Surface analyzer | Drop Shape Analyzer - DSA100 | KII-321 | Johannes Ofstad | Description |
Laser scattering particle size analyzer | Horiba LA-960 Partica | KII-107 | Anita Britt Olsen | Description |
Micro Scratch Tester | ST Instruments B A | KII-321 | Johannes Ofstad |
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Density and volume analysis | Pycnometer | KII-107 | Elin Albertsen | AccuPyc II 1340 |
XRD
Anchor |
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| Solar cell silicon characterisation |
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| Solar cell silicon characterisation |
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Solar cell silicon characterisation
Type of equipment | Name of equipment | Location | Contact person | Link to more information |
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Si - Characterisation | Nicolet 6700 FT-IR | M-104 | Chiara Modanese |
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Si - Characterisation | µLPCD resistivty life time measurment | M-104 | Gaute Stokkan (SINTEF) |
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Si - Characterisation | SiWaScan | M-104 | Gaute Stokkan (SINTEF) |
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Si - Characterisation | micro cracks characterisation | M-104 | Kai Erik Ekstrøm |
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Si - Characterisation Crystal deffect mesurment | PVSCAN 6000 | M-104 | Gaute Stokkan (SINTEF) |
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Si - Characterisation Density Imaging | CDI-Carrier | M-104 | Gaute Stokkan (SINTEF) |
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Anchor |
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| Inductively couple plasma mass spectrometry (ICP-MS) |
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| Inductively couple plasma mass spectrometry (ICP-MS) |
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Inductively coupled plasma mass spectrometry (ICP-MS)
Type of equipment | Name of equipment | Location | Contact person | Link to more information |
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ICP-MS | Perkin Elmer NexION 5000 | KII-321 | Shannen Thora Lea Sait Henrik Ness |
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Electrical resistivity measurement
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