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Thermal analysis

Forms to filled out: Request for use of TA instruments at IMA (office.com)

TA-form:  TA-analysis_form.pdf

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Using steam as sample gas: Water vapor pressure Generator.pdf

Type of equipmentName of equipmentLocationContact personLink to more information
Thermal analysisDTA/TGA Setaram SensisA-K032Sarina Bao (SINTEF)
Thermal analysisElectrical conductivity furnace
Pei Na Kui
Thermal analysisNETZSCH dilatometer 402C, themal analysisKII-103Pei Na Kui
Thermal analysisNETZSCH STA F3 449 Jupiter (Hugin)KII-103Martin OppegårdInstrument information
Thermal analysisNETZSCH STA C 449 Jupiter, (Munin)KII-103Martin Oppegård
Thermal analysisLINSEIS STA PT 1600, (Linseis)KII-103Martin OppegårdInstrument info
Thermal analysisNETZSCH dilatometer 402EKII-103Paul Inge Dahl (SINTEF)
Thermal analysisNETZSCH DSC 214 Polyma KII-103Pei Na Kui
Thermal analysisOptisk dilatometer-Expert systemKII-103Anne Støre (SINTEF)
Thermal analysisLFA Microflash, termisk diffusivitetKII-103Anne Støre (SINTEF)
Thermal analysisDilatometerKII-303Anne Støre (SINTEF)

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Spectroscopy
Spectroscopy

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Type of equipmentName of equipmentLocationContact personLink to more information
Glow discharge optical emission spectroscopy (GD-OES)Horiba GD profiler 2KII-307Sergey Khromov Glow discharge optical emission spectroscopy (GD-OES) Horiba GD Profiler 2
Glow discharge mass spectrometry (GDMS)Astrum GDMS (Nu Instruments, Ametek)KII-307Sergey Khromov Glow discharge mass spectrometry Astrum GDMS (Nu instruments, Ametek)
Mass spectrometer + potensiostatDifferential Electrochemical Mass Spectrometry (DEMS) stationKII-323Svein Sunde
UV-vis/NIR spectrophotometer + potensiostatPhotoelectrochemical stationKII-001008Svein Sunde
FTIR spectrometerBruker Vertex 80vKII-323

Johannes Ofstad

Bruker Vertex 80v

Raman microscopeWITec alpha300 RKII-323

Johannes Ofstad

 WITec alpha300r

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Type of equipmentName of equipmentLocationContact personLink to more information
Surface and particle analysis

3Flex 3500

KII-107Elin AlbertsenBET
Surface and particle analysisTRISTAR 3000 surface area and porosity analyzer KII-107Elin AlbertsenBET
Surface and particle analysisPermeabilitetKII-303Anne Støre (SINTEF)


Surface analyzerDrop Shape Analyzer - DSA100KII-321Johannes OfstadDescription
Laser scattering particle size analyzerHoriba LA-960 ParticaKII-107Anita Britt OlsenDescription
Micro Scratch TesterST Instruments B AKII-321Johannes Ofstad
Density and volume analysisPycnometerKII-107Elin AlbertsenAccuPyc II 1340

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XRD
XRD

XRD

Info

More information about the XRD lab


Type of equipmentName of equipmentLocationContact personLink to more information
XRDRoutine Powder Diffractometer (DaVinci1)KII-113Contact personRoutine powder XRD
XRDPowder diffractometer (D8 Focus)KII-113Contact person9-pos Powder XRD
XRDThin-film Diffractometer (D8 Discover)KII-113Contact personD8 Discover
XRDMultipurpose Powder X-ray diffractometer (DaVinci2)KII-113Contact personMultipurpose XRD
XRDNon-ambient X-ray diffractometer (D8 Advance)KII-113Contact personNon-ambient XRD


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Solar cell silicon characterisation
Solar cell silicon characterisation

Solar cell silicon characterisation

Type of equipmentName of equipmentLocationContact personLink to more information
Si - CharacterisationNicolet 6700 FT-IRM-104Chiara Modanese
Si - CharacterisationµLPCD resistivty life time measurmentM-104Gaute Stokkan (SINTEF)
Si - CharacterisationSiWaScanM-104Gaute Stokkan (SINTEF)
Si - Characterisationmicro cracks characterisationM-104Kai Erik Ekstrøm
Si - Characterisation Crystal deffect mesurmentPVSCAN 6000M-104Gaute Stokkan (SINTEF)
Si - Characterisation Density ImagingCDI-CarrierM-104Gaute Stokkan (SINTEF)

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Inductively couple plasma mass spectrometry (ICP-MS)
Inductively couple plasma mass spectrometry (ICP-MS)

Inductively coupled plasma mass spectrometry (ICP-MS)

Type of equipmentName of equipmentLocationContact personLink to more information
ICP-MSPerkin Elmer NexION 5000KII-321

Shannen Thora Lea Sait

Henrik Ness


Electrical resistivity measurement

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