Description:
Diffractometer with Ge-002 monochromator and CuKα1 radiation for thin film studies.
- XRR studies: thickness, surface roughness and electron density measurement of thin layers.
- HR-XRD, RSM studies: crystalline quality of the sample, strain analysis,
- GIXRD studies: grazing inside diffraction on thin films.
- Texture measurement.
D8 Discover instrument at IMA-NTNU
Instrument specifications:
- Cu source
- Gobel mirror and 2 bounce Ge(220) monochromator.
- θ–2θ operating mode.
- Sample stage: 5-axis Eulerian cradle.
- Data collection from 0° to 120° 2θ.
- Detectors: LynxEye detector for 0D and 1D scan. Scintillation counter detector connected to analyzer for better resolution.
Before you begin:
Equipment can not be used without training. See XRD-lab info.
Booking the instrument
Use the booking system.
Relevant links:
The “A-Unit” is a D5005 base goniometer set up in θ-2θ mode and optimised for high quality powder data collection. It is fitted with a focusing primary monochromator and 2.5º Soller slits, giving well collimated monchromatic radiation. It is thus especially suitable for the collection of data for structure solution and/or Rietveld refinement, and for long d-spacing materials. Due to the tight and symmetrical line-shape characteristics of the instrument, it is also well suited for the investigation of strain and crystallite size effects.
Specifications:
- Bragg-Brentano geometry
- θ–2θ operating mode
- Data collection from 0.5 to 140° 2θ
- Quartz primary monochromator
- Cu Ka1 radiation
- 2.5º primary and secondary Soller slits
- Scintillation detector
- Rotating single sample holder with user selectable rotation speeds
Photo: Julian Tolchard
Before you begin:
Contact equipment/room responsible : Kristin Høydalsvik, kristin.hoydalsvik@ntnu.no