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| Type of equipment | Name of equipment | Location | Contact person | Link to more information |
|---|---|---|---|---|
| Surface and particle analysis | PSA Malvern 2000 | KII-107 | Elin Albertsen | |
| Surface and particle analysis | TRISTAR 3000 surface area and porosity analyzer | KII-107 | Elin Albertsen | BET |
| Surface and particle analysis | Permeabilitet | KII-303 | Anne Støre (SINTEF) |
|
| Zetapotential and particle size analyzer | Beckman Coulter DelsaNano C | KII-223 | Magnus B. Følstad |
| Anchor | ||||
|---|---|---|---|---|
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XRD
| Type of equipment | Name of equipment | Location | Contact person | Link to more information |
|---|---|---|---|---|
XRD | D8 Advance Bruker | KII-113 | Kristin Høydalsvik | The "D8 Advance" |
| XRD | Da Vinci 1 Bruker | KII-113 | Kristin Høydalsvik | The "DaVinci 1" |
| XRD | Da Vinci 2 Bruker | KII-113 | Kristin Høydalsvik | The "DaVinci 2" |
| XRD | A-unit X-ray diffractometer Siemens | KII-113 | Kristin Høydalsvik | The "A-unit" |
| XRD | D8 Focus Bruker | KII-113 | Kristin Høydalsvik | The "D8 Focus" |
| Texture Analysis | X-ray diffractometer | A-347 | Torild Krogstad | XRD |
...