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| Type of equipment | Name of equipment | Location | Contact person | Link to more information |
|---|---|---|---|---|
| TEM with Gatan GIF system | JEOL TEM 2010 | F-368 | Yingda Yu |
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| Type of equipment | Name of equipment | Location | Contact person | Link to more information |
|---|---|---|---|---|
| Thermal analysis | DTA/TGA Setaram Sensis | A-K032 | Sarina Bao (SINTEF) | |
| Thermal analysis | Electrical conductivity furnace | KII-103 | Belma Talic | |
| Thermal analysis | NETZSCH dilatometer 402C, themal analysis | KII-103 | Eli Beate Larsen | |
| Thermal analysis | NETZSCH STA449 jupiter, thermal analysis 1 | KII-103 | Eli Beate Larsen | |
| Thermal analysis | NETZSCH STA449 jupiter, thermal analysis 2 | KII-103 | Eli Beate Larsen | |
| Thermal analysis | NETZSCH dilatometer 402E | KII-103 | Ove Darell (SINTEF) | |
| Thermal analysis | Perkin Elmer Diffential scanning calorimeter | KII-103 | Sverre Magnus Selbach | |
| Thermal analysis | Optisk dilatometer-Expert system | KII-119 | Anne Støre (SINTEF) | |
| Thermal analysis | LFA Microflash, termisk diffusivitet | KII-119 | Anne Støre (SINTEF) | |
| Thermal analysis | Dilatometer | KII-303 | Anne Støre (SINTEF) |
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| Type of equipment | Name of equipment | Location | Contact person | Link to more information |
|---|---|---|---|---|
| Spectroscopy | GD-OES | KII-307 | Mariia Stepanova | |
| Spectroscopy Element Analysis | GD-MS | E-208 | Chiara Modanese |
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| Type of equipment | Name of equipment | Location | Contact person | Link to more information |
|---|---|---|---|---|
| Surface and particle analysis | PSA Malvern 2000 | KII-107 | Elin Albertsen | |
| Surface and particle analysis | TRISTAR 3000 surface area and porosity analyzer | KII-107 | Elin Albertsen | BET |
| Surface and particle analysis | Permeabilitet | KII-303 | Anne Støre (SINTEF) |
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XRD
| Type of equipment | Name of equipment | Location | Contact person | Link to more information |
|---|---|---|---|---|
XRD | D8 advance Bruker | KII-113 | Kristin Høydalsvik | |
| XRD | Da Vinci 1 Bruker | KII-113 | Kristin Høydalsvik | |
| XRD | Da Vinci 2 Bruker | KII-113 | Kristin Høydalsvik | |
| XRD | A-unit X-ray diffractometer | KII-113 | Kristin Høydalsvik | |
| XRD | D8 focus Siemens | KII-113 | Kristin Høydalsvik | |
| Texture Analysis | X-ray diffractometer | A-347 | Torild Krogstad |
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| Type of equipment | Name of equipment | Location | Contact person | Link to more information |
|---|---|---|---|---|
| Si - Characterisation | Nicolet 6700 FT-IR | M-104 | Chiara Modanese | |
| Si - Characterisation | µLPCD resistivty life time measurment | M-104 | Gaute Stokkan (SINTEF) | |
| Si - Characterisation | SiWaScan | M-104 | Gaute Stokkan (SINTEF) | |
| Si - Characterisation | micro cracks characterisation | M-104 | Kai Erik Ekstrøm | |
| Si - Characterisation Crystal deffect mesurment | PVSCAN 6000 | M-104 | Gaute Stokkan (SINTEF) | |
| Si - Characterisation Density Imaging | CDI-Carrier | M-104 | Gaute Stokkan (SINTEF) |
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