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| Type of equipment | Name of equipment | Location | Contact person | Link to more information | ||||||
|---|---|---|---|---|---|---|---|---|---|---|
| Electron Micro Probe Analyzer | FE-EPMA wirh JEOL WDS system JEOL JXA 8500 | F-373 | Morten Raanes |
| ||||||
| Scanning probe microscope | AFM/STM Agilent 5500 | KII-003A | Magnus Følstad |
| Anchor | ||||
|---|---|---|---|---|
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Transmission electron microscopy
| Type of equipment | Name of equipment | Location | Contact person | Link to more information |
|---|---|---|---|---|
| TEM with Gatan GIF system | JEOL TEM 2010 | F-368 | Yingda Yu |
| Anchor | ||||
|---|---|---|---|---|
|
...
| Type of equipment | Name of equipment | Location | Contact person | Link to more information |
|---|---|---|---|---|
XRD | D8 advance Bruker | KII-113 | Kristin Høydalsvik | |
| XRD | Da Vinci 1 Bruker | KII-113 | Kristin Høydalsvik | |
| XRD | Da Vinci 2 Bruker | KII-113 | Kristin Høydalsvik | |
| XRD | A-unit X-ray diffractometer | KII-113 | Kristin Høydalsvik | |
| XRD | D8 focus Siemens | KII-113 | Kristin Høydalsvik | |
| Texture Analysis | X-ray diffractometer | A-347 | Torild Krogstad |
| Anchor | ||||
|---|---|---|---|---|
|
...
| Type of equipment | Name of equipment | Location | Contact person | Link to more information |
|---|---|---|---|---|
| Si - Characterisation | Nicolet 6700 FT-IR | M-104 | Chiara Modanese | |
| Si - Characterisation | µLPCD resistivty life time measurment | M-104 | Gaute Stokkan (SINTEF) | |
| Si - Characterisation | SiWaScan | M-104 | Gaute Stokkan (SINTEF) | |
| Si - Characterisation | micro cracks characterisation | M-104 | Kei Kai Erik Ekstrøm | |
| Si - Characterisation Crystal deffect mesurment | PVSCAN 6000 | M-104 | Gaute Stokkan (SINTEF) | |
| Si - Characterisation Density Imaging | CDI-Carrier | M-104 | Gaute Stokkan (SINTEF) |
...