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| Type of equipment | Name of equipment | Location | Contact person | Link to more information | ||||||
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| Scanning Electron Microscopy | FE-SEM with Bruker EDS/NORDIF EBSD system Hitachi SU6600 | F-362 | Yingda Yu |
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| Scanning Electron Microscopy | FE-SEM with Bruker EDS/NORDIF EBSD system Zeiss Ultra 55 | F-362 | Yingda Yu |
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| Scanning Electron Microscopy | SEM with Nordif EBSD system JEOL JSM 840A | F-362 | Yingda Yu |
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| Scanning Electron Microscopy | SEM with Gatan CL system JEOL JSM 840 | F-369 | Yingda Yu | |||||||
| Scanning Electron Microscopy | SEM with JEOL EDS system JEOL JSM 6010LA | F-369 | Yingda Yu |
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| Scanning Electron Microscopy | FE-SEM wirh EDAX EDS system Zeiss Supra 55VP | F-369 | Yingda Yu |
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| Scanning electron microscopy | Hitachi S-3400N | KII-036 | Kristin Høydalsvik |
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Spectroscopy
| Type of equipment | Name of equipment | Location | Contact person | Link to more information |
|---|---|---|---|---|
| Spectroscopy | GD-OES | KII-307 | Mariia Stepanova | |
| Spectroscopy Element Analysis | GD-MS | E-208 | Chiara Modanese |
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Solar cell silicon characterisation
| Type of equipment | Name of equipment | Location | Contact person | Link to more information |
|---|---|---|---|---|
| Si - Characterisation | Nicolet 6700 FT-IR | M-104 | Chiara Modanese | |
| Si - Characterisation | µLPCD resistivty life time measurment | M-104 | Gaute Stokkan (SINTEF) | |
| Si - Characterisation | SiWaScan | M-104 | Gaute Stokkan (SINTEF) | |
| Si - Characterisation | micro cracks characterisation | M-104 | Kei Erik Ekstrøm | |
| Si - Characterisation Crystal deffect mesurment | PVSCAN 6000 | M-104 | Gaute Stokkan (SINTEF) | |
| Si - Characterisation Density Imaging | CDI-Carrier | M-104 | Gaute Stokkan (SINTEF) |