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Type of equipmentName of equipmentLocationContact personLink to more information
Electron Micro Probe Analyzer

FE-EPMA wirh JEOL WDS system

JEOL JXA 8500

F-373Morten Raanes
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linkTextJEOL JXA-8500F Electron Probe Micro analyzer (EPMA)
hrefhttp://www.material.ntnu.no/lab/material/equipment/ProdInfoEPMA.pdf
Scanning probe microscope

AFM/STM

Agilent 5500

KII-003AMagnus Følstad 

 


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Thermal analysis
Thermal analysis

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Type of equipmentName of equipmentLocationContact personLink to more information

XRD

D8 advance BrukerKII-113Julian TolchardKristin Høydalsvik 
XRDDa Vinci 1 BrukerKII-113Julian TolchardKristin Høydalsvik 
XRDDa Vinci 2 BrukerKII-113Julian TolchardKristin Høydalsvik 
XRDA-unit X-ray diffractometerKII-113Julian TolchardKristin Høydalsvik 
XRDD8 focus SiemensKII-113Julian TolchardKristin Høydalsvik 

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Solar cell silicon characterisation
Solar cell silicon characterisation

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