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Type of equipmentName of equipmentLocationContact personLink to more information
Element AnalysisGD-MSE-208Chiara Modanese GD-MS
Surface and particle analysisXRD Texture AnalysisA-347Torild Krogstad XRD Texture analysis
Optical microscopeWild HeerbruggA-443Trygve L. Schanche Wild Heerbrugg
Optical microscopeLeica MEF4ME-514Trygve L. Schanche   Leica MEF4M
Optical microscopeReichert-Jung UnivarE-514Trygve L. Schanche   Reitchert-Jung Univar
Optical microscopeMakroskop Leitz M400E-508Trygve L. Schanche   Makroskop Leitz M400
Optical microscopeLeitz MM6E-508Trygve L. Schanche   Leitz MM6
Optical microscopeZeiss Axiovert 25E-508Trygve L. Schanche  Zeiss Axiovert 25
Optical microscopeLeitz metalloplanE-508Trygve L. Schanche   Leitz metalloplan
Optical microscopeLeitz 1AE-508Trygve L. Schanche   Leitz 1A
Optical microscopeReichert MEF1E-508Trygve L. Schanche   Reitchert MEF1
Optical microscopeLeitz Metallux 3E-514ATrygve L. Schanche  Leitz Metallux 3
Videokamera (2 stk)JVC TK-S310 EGE-514ATrygve L. Schanche   Video camera
Videokamera til mikroskopLeica R3 elecrt.E-514ATrygve L. Schanche   Video camera for microscope
Optical microscopeLeitz AxioskopE-514ATrygve L. Schanche  Leitz Axioskop
Scanning Electron Microscopy

FE-SEM with Bruker EDS/NORDIF EBSD system

Hitachi SU6600

F-362Yingda Yu
Link in New Window
linkTextHitachi SU6600 FEG SEM
hrefhttp://www.material.ntnu.no/lab/material/equipment/HitachiFEG.jpg
Scanning Electron Microscopy

FE-SEM with Bruker EDS/NORDIF EBSD system

Zeiss Ultra 55

F-362Yingda Yu
Link in New Window
linkTextFe-sem (Zeiss Ultra 55 LE)
hrefhttp://www.material.ntnu.no/lab/material/equipment/ULTRA_Technical.pdf
Scanning Electron Microscopy

SEM with Nordif EBSD system

JEOL JSM 840A

F-362Yingda Yu
Link in New Window
linkTextSEM A (JSM 840)
hrefhttp://www.material.ntnu.no/lab/material/equipment/ProdInfoSEM_A.pdf
Transmission Electron Microscopy

TEM with Gatan GIF system

JEOL TEM 2010

F-368Yingda Yu
Link in New Window
linkTextTEM (JEOL, JEM-2010)
hrefhttps://www.ntnu.no/wiki/download/attachments/67474571/TEMinfo.pdf?version=1&modificationDate=1409311611000&api=v2
Scanning Electron Microscopy

SEM with Gatan CL system

JEOL JSM 840

F-369Yingda Yu 
Scanning Electron Microscopy

SEM with JEOL EDS system

JEOL JSM 6010LA

F-369Yingda Yu
Link in New Window
linkTextEDS, EDAX Gernesis
hrefhttp://edax.com/
Scanning Electron Microscopy

FE-SEM wirh EDAX EDS system

Zeiss Supra 55VP

F-369Yingda Yu
Link in New Window
linkTextLV-Fe-SEM (ZeissSupra 55 VP)
hrefhttp://www.material.ntnu.no/lab/material/equipment/ProdInfoFE-SEM.pdf
Electron Micro Probe Analyzer

FE-EPMA wirh JEOL WDS system

JEOL JXA 8500

F-373Morten Raanes
Link in New Window
linkTextJEOL JXA-8500F Electron Probe Micro analyzer (EPMA)
hrefhttp://www.material.ntnu.no/lab/material/equipment/ProdInfoEPMA.pdf
Scanning probe microscope

AFM/STM

Agilent 5500

KII-003AMagnus Følstad

 SPM Agilent 5500

 

UV-vis/NIR spektrofotometer + potensiostatPhotoelectrochemical stationKII-014Magnus Følstad

 

 Photoelectrochemical station

Thermal analysisPerkin Elmer Diffential scanning calorimeterKII-103Sverre Magnus Selback Perkin Elmer Diffential scanning calorimeter
Thermal analysisHigh temperature oxygen flux furnaceKII-103Belma Talic High temperature oxygen flux furnace
Thermal analysisNETZSCH dilatometer 402EKII-103Ove Darell NETZSCH Dilatometer 402E
Thermal analysisNETZSCH dilatometer 402CKII-103Eli Beate Larsen NETZSCH Dilatometer 402C
Thermal analysisNETZSCH STA449 jupiterKII-103Eli Beate Larsen Thermal analysisNETZSCH STA449 jupiterKII-103Eli Beate Larsen Jupiter
Thermal analysisElectrical conductivity furnaceKII-103Belma Talic Electrical conductivity furnace
Surface and particle analysisPSA Malvern 2000KII-107Jannicke Kvello PSA Malvern 2000
Surface and particle analysisTRISTAR 3000 surface area and porosity analyzer KII-107Elin AlbertsenBET
LECOOxygen and nitrogen analysisKII-107Anne Støre LECO
PycnometerAccupyc 1330KII-107Julian Tolchard Accupyc 1330

XRD

D8 advance BrukerKII-113Julian Tolchard D8 Advance Bruker
XRDDa Vinci 1 BrukerKII-113Julian Tolchard Da Vinci 1 Bruker
XRDDa Vinci 2 BrukerKII-113Julian Tolchard Da Vinci 2 Bruker
XRDA-unit X-ray diffractometerKII-113Julian Tolchard A-unit X-ray diffractometer
XRDD8 focus SiemensKII-113Julian Tolchard D8 focus Siemens
Thermal analysisOptisk dilatometer-Expert systemKII-119Anne Støre Optisk dilatometer-Expert system
Thermal analysisLFA Microflash, termisk diffusivitetKII-119Anne Støre 
Surface and particle analysis

Zetapotensial- og partikkelstørrelse-måler

Beckman Coulter DelsaNano C

KII-223Magnus Følstad 

Glow Discharge Optical Emission Spectroscopy

GD-OES GD-profilerKII-307Maria Stepanova 
Optical MicroscopeNikon SM2800KII-323  
Optical MicroscopeLeica DM IRMKII-323  
Optical microscopeZeiss   
Optical microscopeWild Heerbrugg  

 

 

IR Spectroscropy

Bruker IFS66V

KII-014  
UV-vis/NIR spektrofotometer + potensiostatPhotoelectrochemical station Magnus Følstad 
MassespektrometerPfeiffer Vacum Prisma Plus HiCube Morten Tjelta 
ViskositetsmålingHaake Mars Modular Advanced Rheometer System   
ViskositetsmålingHaake Viskotester 550 Thermo Scientific   
Optical microscopeLeica DMIL Trygve L Schanche Leica DMIL
Optical microscopeOlympus BH-2KII-032AStein Rørvik 
Optical microscopeReichert MeF3A med Sony kamera Stein Rørvik 
Optical microscopeOlympus BX60 Stein Rørvik 
Peizoelektriske målingerAix PES Piezoelectric evaluation   
Optical microscopeLeica EZ4   
Scanning electron microscopeHitachi S-3400NKII-036 

Lv-sem Sem Sælandsvei (Hitachi S-3400N)

...