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Department of materials science and engineering - Laboratory equipment
Material characterisation
Thin film Diffractometer (D8 Discover)
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Versions Compared
Old Version
12
changes.mady.by.user
Elvia Anabela Chavez Panduro
Saved on
22.05.2023
compared with
New Version
13
changes.mady.by.user
Elvia Anabela Chavez Panduro
Saved on
29.08.2023
Previous Change: Difference between versions 11 and 12
Next Change: Difference between versions 13 and 14
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XRR studies: thickness, surface roughness and electron density measurement of thin layers.
HR-XRD
, RSM
studies: crystalline quality of the sample, strain analysis,
GIXRD studies: grazing inside diffraction on thin films.
...
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