Optical Microscope
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| Electron microscope |
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| Electron microscope |
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Type of equipment | Name of equipment | Location | Contact person | Link to more information |
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Scanning Electron Microscopy | FE-SEM with Bruker EDS/NORDIF EBSD system Hitachi SU6600 | F-362 | Yingda Yu | Link in New Window |
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linkText | Hitachi SU6600 FEG SEM |
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href | http://www.material.ntnu.no/lab/material/equipment/HitachiFEG.jpg |
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Scanning Electron Microscopy | FE-SEM with Bruker EDS/NORDIF EBSD system Zeiss Ultra 55 | F-362 | Yingda Yu | Link in New Window |
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linkText | Fe-sem (Zeiss Ultra 55 LE) |
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href | http://www.material.ntnu.no/lab/material/equipment/ULTRA_Technical.pdf |
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Scanning Electron Microscopy | SEM with Nordif EBSD system JEOL JSM 840A | F-362 | Yingda Yu | Link in New Window |
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linkText | SEM A (JSM 840) |
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href | http://www.material.ntnu.no/lab/material/equipment/ProdInfoSEM_A.pdf |
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Scanning Electron Microscopy | SEM with Gatan CL system JEOL JSM 840 | F-369 | Yingda Yu |
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Scanning Electron Microscopy | SEM with JEOL EDS system JEOL JSM 6010LA | F-369 | Yingda Yu | Link in New Window |
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linkText | EDS, EDAX Gernesis |
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href | http://edax.com/ |
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Scanning Electron Microscopy | FE-SEM wirh EDAX EDS system Zeiss Supra 55VP | F-369 | Yingda Yu | Link in New Window |
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linkText | LV-Fe-SEM (ZeissSupra 55 VP) |
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href | http://www.material.ntnu.no/lab/material/equipment/ProdInfoFE-SEM.pdf |
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Scanning electron microscopy | Hitachi S-3400N | KII-036 | Sergey Khromov | |
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| Scanning probe microscope |
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| Scanning probe microscope |
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Type of equipment | Name of equipment | Location | Contact person | Link to more information |
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Electron Micro Probe Analyzer | FE-EPMA wirh JEOL WDS system JEOL JXA 8500 | F-373 | Morten Raanes | Link in New Window |
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linkText | JEOL JXA-8500F Electron Probe Micro analyzer (EPMA) |
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href | http://www.material.ntnu.no/lab/material/equipment/ProdInfoEPMA.pdf |
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Scanning probe microscope | Agilent 5500 AFM/SPM microscope | KII-003A008 | Marthe FolstadMagnus B. Følstad | About the instrument |
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Type of equipment | Name of equipment | Location | Contact person | Link to more information |
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TEM with Gatan GIF system | JEOL TEM 2010 | F-368 | Yingda Yu | |
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| Thermal analysis |
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| Thermal analysis |
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Thermal analysis
Forms to filled out: Request for use of TA instruments at IMA (office.com
TA-form: TA-analysis_form.pdf
General information:
Using steam as sample gas: Water vapor pressure Generator.pdf
Type of equipment | Name of equipment | Location | Contact person | Link to more information |
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Thermal analysis | DTA/TGA Setaram Sensis | A-K032 | Sarina Bao (SINTEF) |
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Thermal analysis | Electrical conductivity furnace |
KII-103 | |
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Thermal analysis | NETZSCH dilatometer 402C, themal analysis | KII-103 | Pei Na Kui |
Dilatometer |
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Thermal analysis | NETZSCH STA F3 449 Jupiter (Hugin) | KII-103 |
Pei Na Kui | Simultaneous Thermal AnalysisPei Na Kui | Simultaneous Thermal Analysis combined with mass spectrometryPei Na Kui | Simultaneous Thermal Analysis |
Thermal analysis | NETZSCH dilatometer 402E | KII-103 |
Ove Darell |
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Thermal analysis | NETZSCH DSC 214 Polyma | KII-103 | Pei Na Kui |
DSC 214 Polyma |
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Thermal analysis | Optisk dilatometer-Expert system | KII-103 | Anne Støre (SINTEF) |
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Thermal analysis | LFA Microflash, termisk diffusivitet | KII-103 | Anne Støre (SINTEF) |
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Thermal analysis | Dilatometer | KII-303 | Anne Støre (SINTEF) |
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| Solar cell silicon characterisation |
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| Solar cell silicon characterisation |
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Solar cell silicon characterisation
Type of equipment | Name of equipment | Location | Contact person | Link to more information |
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Si - Characterisation | Nicolet 6700 FT-IR | M-104 | Chiara Modanese | |
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Si - Characterisation | µLPCD resistivty life time measurment | M-104 | Gaute Stokkan (SINTEF) |
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Si - Characterisation | SiWaScan | M-104 | Gaute Stokkan (SINTEF) | |
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Si - Characterisation | micro cracks characterisation | M-104 | Kai Erik Ekstrøm |
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Si - Characterisation Crystal deffect mesurment | PVSCAN 6000 | M-104 | Gaute Stokkan (SINTEF) |
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Si - Characterisation Density Imaging | CDI-Carrier | M-104 | Gaute Stokkan (SINTEF) | |
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| Inductively couple plasma mass spectrometry (ICP-MS) |
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| Inductively couple plasma mass spectrometry (ICP-MS) |
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Inductively coupled plasma mass spectrometry (ICP-MS)
Type of equipment | Name of equipment | Location | Contact person | Link to more information |
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ICP-MS | Perkin Elmer NexION 5000 | KII-321 | Shannen Thora Lea Sait Henrik Ness |
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Electrical resistivity measurement
Type of equipment | Name of equipment | Location | Contact person | Link to more information |
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Resistivity measurement (metals) | Sigmascope | E-508 | Trygve L. Schanche | |
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